A 3D point cloud object recognition method, system, storage medium and product
By adopting a metric learning framework and a dual-network embedded model in 3D point cloud recognition, the problem of model overfitting in point cloud small sample recognition is solved, and more efficient point cloud object recognition is achieved.
Patent Information
- Application Number
- CN202411484121.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-23
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2044-10-23
AI Technical Summary
The existing 3D point cloud small sample recognition method is difficult to adapt to the disordered and irregular distribution of point cloud data, resulting in overfitting the model and unable to effectively recognize point cloud small sample object.
Using the metric learning framework, point cloud data is divided into meta-training data sets and meta-test data sets, and a dual-network embedding model is built on the embedded network, including dynamic graph convolutional networks and global feature extraction networks to extract local and global features. At the same time, a representation enhancement algorithm is designed on the classifier to feature enhancement of prototype vectors and query vectors.
Through the improved metric learning framework and dual-network embedded model, the features of point cloud data can be effectively extracted, avoid model overfitting, and improve the accuracy of point cloud small sample object recognition.