Signal delay calibration device and test system

Abstract

The invention relates to a signal delay calibration device and a test system, and the device comprises a calibration delay unit which is used for determining a delay parameter corresponding to initial delay; the signal delay unit is used for performing signal delay; the calibration delay unit and the signal delay unit comprise delay units of the same type; and the parameter calculation unit is connected with the calibration delay unit and the signal delay unit, and is used for calculating a delay reference quantity according to the initial delay and the delay parameter, and carrying out delay setting on the signal delay unit according to the delay reference quantity and the current required delay. When the signal time delay unit comprises a plurality of time delay units, the time delay reference quantity can be obtained through analysis according to the corresponding relation between the initial time delay and the time delay parameter determined by the calibration time delay unit, time delay setting is carried out on each time delay unit in the signal time delay unit, and accurate calibration does not need to be carried out on all time delay units in the signal time delay unit. The signal delay efficiency is improved, and high delay precision can be obtained.

Description

Technical Field

[0001] The present application relates to the technical field of signal delay, and in particular to a signal delay calibration device and a test system. Background Art

[0002] The Timing Generator (TG) is an important component of the tester. It is responsible for synthesizing the output waveform according to the user's requirements, outputting the waveform at the target time, and sampling the input signal according to the sampling time configured by the user. To achieve the above purpose, the signal or clock needs to be delayed. If the signal needs to be delayed, the IDELAY / ODELAY resources of the FPGA (Field Programmable Gate Array) can be used to implement it. However, the specific delay time of each IDELAY / ODELAY in each FPGA may be different and easily affected by the use environment. In actual use, the delay time of all IDELAY / ODELAY needs to be accurately calibrated, which has the disadvantage of low signal delay efficiency. Summary of the invention

[0003] Based on this, it is necessary to provide a signal delay calibration device and a test system that can improve the signal delay efficiency in order to address the above problems.

[0004] A signal delay calibration device, comprising:

[0005] Calibrate the delay unit to determine the delay parameters corresponding to the initial delay;

[0006] A signal delay unit, used for signal delay; the calibration delay unit and the signal delay unit include delay units of the same type;

[0007] A parameter calculation unit is connected to the calibration delay unit and the signal delay unit, and is used to calculate a delay reference according to the initial delay and the delay parameter, and to set the delay of the signal delay unit according to the delay reference and the current required delay.

[0008] In one embodiment, the calibration delay unit includes a first type of calibration delay unit and a second type of calibration delay unit connected to the parameter calculation unit; the signal delay unit includes a first type of signal delay unit and a second type of signal delay unit connected to the parameter calculation unit; wherein the first type of calibration delay unit and the first type of signal delay unit include the same type of delay units, and the second type of calibration delay unit and the second type of signal delay unit include the same type of delay units.

[0009] In one embodiment, the first type of calibration delay unit and the first type of signal delay unit include IDELAY, and the first type of calibration delay unit is used to determine the initial delay T initI The corresponding delay value tap1; the parameter calculation unit is based on the initial delay T initI and the delay value tap1, and calculate the delay reference amount of the first type of signal delay unit.

[0010] In one embodiment, the parameter calculation unit calculates the initial delay T initI Divide by the delay value tap1 to calculate the delay corresponding to each tap as the delay reference of the first type of signal delay unit; or

[0011] The parameter calculation unit divides the delay value tap1 by the initial delay T initI , calculate the tap value corresponding to each unit time as the delay reference of the first type of signal delay unit.

[0012] In one embodiment, the second type calibration delay unit and the second type signal delay unit include ODELAY, and the second type calibration delay unit is used to determine the initial delay T initO The corresponding delay value tap2; the parameter calculation unit is based on the initial delay T initO and the delay value tap2, and calculate the delay reference amount of the second type signal delay unit.

[0013] In one embodiment, the parameter calculation unit calculates the initial delay T initO Divide by the delay value tap2 to calculate the delay corresponding to each tap as the delay reference of the second type of signal delay unit; or

[0014] The parameter calculation unit divides the delay value tap2 by the initial delay T initO , calculate the tap value corresponding to each unit time as the delay reference of the second type of signal delay unit.

[0015] In one of the embodiments, the first type of signal delay unit includes at least one IDELAY, the second type of signal delay unit includes at least one ODELAY, and the parameter calculation unit connects the IDELAY and the ODELAY.

[0016] In one of the embodiments, the first type of signal delay unit and the second type of signal delay unit are arranged in parallel or in cascade.

[0017] In one of the embodiments, if the currently required delay is less than or equal to the delay span of IDELAY / ODELAY, the first type of signal delay unit and the second type of signal delay unit are arranged in parallel, the first type of signal delay unit includes one IDELAY, and the second type of signal delay unit includes one ODELAY;

[0018] If the currently required delay is greater than the delay span of IDELAY / ODELAY, the first type of signal delay unit and the second type of signal delay unit are arranged in parallel, then the first type of signal delay unit includes at least two IDELAYs connected in sequence, and the second type of signal delay unit includes at least two ODELAYs connected in sequence;

[0019] If the currently required delay is greater than the delay span of IDELAY / ODELAY, the first type of signal delay unit and the second type of signal delay unit are cascaded, and the first type of signal delay unit includes at least one IDELAY, and the second type of signal delay unit includes at least one ODELAY.

[0020] In one of the embodiments, the signal delay calibration device also includes a delay calculation unit connected to the parameter calculation unit, and the delay calculation unit is used to output a currently required delay to the parameter calculation unit; the parameter calculation unit allocates the currently required delay to the delay unit in the signal delay unit, and determines the delay parameters of the delay unit in the signal delay unit in combination with the delay reference.

[0021] A testing system comprises the above-mentioned signal delay calibration device.

[0022] In the above-mentioned signal delay calibration device and test system, the calibration delay unit and the signal delay unit include delay units of the same type, the delay parameter corresponding to the initial delay is determined by the calibration delay unit, and the parameter calculation unit calculates the delay reference according to the initial delay and the delay parameter, and sets the delay of the signal delay unit according to the delay reference and the currently required delay. When the signal delay unit includes multiple delay units, the delay reference can be analyzed based on the corresponding relationship between the initial delay and the delay parameter determined by the calibration delay unit, and the delay setting can be performed on each delay unit in the signal delay unit, without the need to accurately calibrate all the delay units in the signal delay unit, thereby improving the signal delay efficiency and obtaining a higher delay accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a structural block diagram of a signal delay calibration device in one embodiment;

[0024] Figure 2 is a structural principle diagram of a signal delay calibration device in one embodiment;

[0025] Figure 3 2 is a schematic diagram of the structure of a signal delay calibration device in another embodiment. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0028] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if the connected circuits, modules, units, etc. have electrical signals or data transmission between each other.

[0029] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the presence of stated features, wholes, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, operations, components, parts or combinations thereof.

[0030] When using FPGA to implement the function of delaying a signal less than one clock cycle, IDELAY / ODELAY resources are generally used for implementation. However, the specific delay time of each tap of each IDELAY / ODELAY of each FPGA may be different, and is greatly affected by the use environment (such as temperature, etc.). In actual use, the delay time of each tap of each IDELAY / ODELAY of each FPGA needs to be measured and calibrated, which is time-consuming and labor-intensive. Based on this, in order to solve the problem that the tap delay of IDELAY / ODELAY needs to be calibrated under different use environments when the accuracy index requirements are high, the present application provides a signal delay calibration device, the calibration delay unit and the signal delay unit include delay units of the same type, the delay parameter corresponding to the initial delay is determined by the calibration delay unit, and the parameter calculation unit then calculates the delay reference according to the initial delay and the delay parameter, and the signal delay unit is delayed according to the delay reference and the current required delay. Set the delay. When the signal delay unit includes multiple delay units, the delay reference can be analyzed based on the correspondence between the initial delay and the delay parameters determined by the calibration delay unit, and the delay setting can be performed on each delay unit in the signal delay unit. There is no need to accurately calibrate all the delay units in the signal delay unit, which improves the signal delay efficiency and can obtain higher delay accuracy.

[0031] In one embodiment, Figure 1 As shown, a signal delay calibration device is provided, including a calibration delay unit 110, a signal delay unit 120 and a parameter calculation unit 130, wherein the parameter calculation unit 130 is connected to the calibration delay unit 110 and the signal delay unit 120. The calibration delay unit 110 is used to determine the delay parameter corresponding to the initial delay, the signal delay unit 120 is used to perform signal delay, and the calibration delay unit 110 and the signal delay unit 120 include the same type of delay units. The parameter calculation unit 130 is used to calculate a delay reference according to the initial delay and the delay parameter, and to set the delay of the signal delay unit according to the delay reference and the current required delay.

[0032] Among them, the signal delay unit 120 can be used for the output end of the test system, and outputs the signal to the device to be tested after signal delay; the signal delay unit 120 can also be used for the input end of the test system to delay the input signal fed back by the device to be tested. The delay unit included in the calibration delay unit 110 and the signal delay unit 120 can be an IDELAY or an ODELAY. The calibration delay unit 110 includes an IDELAY / ODELAY, and the delay parameter corresponding to the initial delay is specifically the tap value. The signal delay unit 120 can include one IDELAY / ODELAY or multiple IDELAY / ODELAYs.

[0033] It can be understood that the method for the calibration delay unit 110 to determine the delay parameter corresponding to the initial delay is not unique, and it is only necessary to determine the corresponding relationship between the initial delay and the delay parameter under the current use environment. Specifically, the calibration delay unit 110 and the signal delay unit 120 can be parameterized so that the calibration delay unit 110 works in the TIME mode, and the signal delay unit 120 works in the COUNT mode. The initial delay is set for the calibration delay unit 110 in the TIME mode, and the delay parameter corresponding to the initial delay output of the calibration delay unit 110 is obtained. The IDELAY / ODELAY working in the TIME mode is calibrated by using the IDELAY / ODELAY working in the COUNT mode, thereby reducing the influence of the use environment on the delay time of the IDELAY / ODELAY.

[0034] In addition, if Figure 2 and Figure 3 As shown, the signal delay calibration device also includes a delay calculation unit 140 connected to the parameter calculation unit 130, and the delay calculation unit 140 is used to output the currently required delay T to the parameter calculation unit 130, and the parameter calculation unit 130 allocates the currently required delay T to the delay unit in the signal delay unit 120, and determines the delay parameter of the delay unit in the signal delay unit 120 in combination with the delay reference. Among them, the delay calculation unit 140 can be obtained by acquiring data related to the test device to be tested, and according to the acquired data analysis, the required delay time is determined, and the delay time is removed from the part of the integer multiple of the clock cycle, and the remaining part (that is, the remaining decimal part after the delay time is divided by the clock cycle) is used as the currently required delay T; the delay calculation unit 140 can also receive the currently required delay T sent by the external controller and forward it to the parameter calculation unit 130.

[0035] In the above-mentioned signal delay calibration device, the calibration delay unit 110 and the signal delay unit 120 include the same type of delay units, the delay parameter corresponding to the initial delay is determined by the calibration delay unit 110, and the parameter calculation unit 130 calculates the delay reference according to the initial delay and the delay parameter, and sets the delay of the signal delay unit 120 according to the delay reference and the currently required delay. When the signal delay unit 120 includes multiple delay units, the delay reference can be analyzed and obtained according to the corresponding relationship between the initial delay and the delay parameter determined by the calibration delay unit 110, and the delay setting is performed for each delay unit in the signal delay unit 120, without the need to accurately calibrate all the delay units in the signal delay unit 120, thereby improving the signal delay efficiency and obtaining a higher delay accuracy.

[0036] In one embodiment, Figure 2As shown, the calibration delay unit 110 includes a first type of calibration delay unit 112 and a second type of calibration delay unit 114 of the connection parameter calculation unit 130; the signal delay unit 120 includes a first type of signal delay unit 122 and a second type of signal delay unit 124 of the connection parameter calculation unit 130; wherein, the first type of calibration delay unit 112 and the first type of signal delay unit 122 include the same type of delay unit, and the second type of calibration delay unit 114 and the second type of signal delay unit 124 include the same type of delay unit. It can be understood that the delay unit included in the first type of calibration delay unit 112 and the first type of signal delay unit 122 can be IDELAY or ODELAY. The delay unit included in the second type of calibration delay unit 114 and the second type of signal delay unit 124 can be ODELAY or IDELAY.

[0037] The positional relationship between the first type signal delay unit 122 and the second type signal delay unit 124 is not unique. Figure 2 As shown, the first type signal delay unit 122 and the second type signal delay unit 124 can be arranged in parallel, and are used to delay the accessed signal respectively. Figure 3 As shown, the first type signal delay unit 122 and the second type signal delay unit 124 can also be cascaded to expand the delay time range. In this embodiment, the first type signal delay unit 122 includes IDELAY, and the signal is delayed through IDELAY, and the second type signal delay unit 124 includes ODELAY, and the signal is delayed through ODELAY. Figure 3 The figure shows a two-level cascade. In actual use, the number of cascades can be increased as needed. For example, the number of IDELAYs and ODELAYs is more than two, and each IDELAY and ODELAY is alternately connected in sequence.

[0038] In one embodiment, the first type calibration delay unit 112 and the first type signal delay unit 122 include IDELAY, and the first type calibration delay unit 112 is used to determine the initial delay T initI The corresponding delay value tap1; the parameter calculation unit 130 calculates the initial delay T initI and the delay value tap1, and calculate the delay reference of the first type signal delay unit 122. Specifically, the parameter calculation unit 130 can be a parameter calculation unit 130 that converts the initial delay T initI Divide by the delay value tap1 to calculate the delay T corresponding to each tap avgI , as the delay reference of the first type signal delay unit 122. Alternatively, the parameter calculation unit can also divide the delay value tap1 by the initial delay T initI , calculate the tap value TAP corresponding to each unit time avgI, as the delay reference of the first type signal delay unit 122.

[0039] In one embodiment, the second type calibration delay unit 114 and the second type signal delay unit 124 include ODELAY, and the second type calibration delay unit 114 is used to determine the initial delay T initO The corresponding delay value tap2; the parameter calculation unit 130 calculates the initial delay T initO and the delay value tap2, and calculate the delay reference of the second type signal delay unit 124. Specifically, the parameter calculation unit 130 can be a parameter calculation unit 130 that converts the initial delay T initO Divide by the delay value tap2 to calculate the delay T corresponding to each tap avgO , as the delay reference of the second type signal delay unit 124. Alternatively, the parameter calculation unit 130 can also divide the delay value tap2 by the initial delay T initO , calculate the tap value TAP corresponding to each unit time avgO , as the delay reference of the second type signal delay unit 124.

[0040] In one embodiment, the first type of signal delay unit 122 includes at least one IDELAY, the second type of signal delay unit 124 includes at least one ODELAY, and the parameter calculation unit 130 connects the IDELAY and the ODELAY. The connection relationship between the first type of signal delay unit 122 and the second type of signal delay unit 124 and the number of delay units included can be set according to the size relationship between the current required delay T and the delay span of the delay unit. Specifically, if the current required delay T is less than or equal to the delay span of IDELAY / ODELAY, the first type of signal delay unit 122 and the second type of signal delay unit 124 are set in parallel, the first type of signal delay unit 122 includes one IDELAY, and the second type of signal delay unit 124 includes one ODELAY. If the currently required delay T is greater than the delay span of IDELAY / ODELAY, the first type of signal delay unit 122 and the second type of signal delay unit 124 are set in parallel, then the first type of signal delay unit 122 includes at least two IDELAYs connected in sequence, and the second type of signal delay unit 124 includes at least two ODELAYs connected in sequence. In addition, if the currently required delay T is greater than the delay span of IDELAY / ODELAY, the first type of signal delay unit 122 and the second type of signal delay unit 124 are set in cascade, then the first type of signal delay unit 122 includes at least one IDELAY, and the second type of signal delay unit 124 includes at least one ODELAY.

[0041] That is to say, if the currently required delay T is greater than the delay span of IDELAY / ODELAY, multiple IDELAYs are used in the signal delay unit 120 for signal delay; or, multiple ODELAYs are used in the signal delay unit 120 for signal delay; or, the signal delay unit 120 uses a cascade setting of IDELAY and ODELAY for signal delay.

[0042] Taking the signal delay performed by cascading the first type signal delay unit 122 and the second type signal delay unit 124 as an example, after determining the delay reference amount of the first type signal delay unit 122 and the second type signal delay unit 124, the parameter calculation unit 130 decomposes the current required delay T into the first type signal delay unit 122 and the second type signal delay unit 124, which can be to evenly distribute the current required delay T to all delay units of the first type signal delay unit 122 and the second type signal delay unit 124, or other uneven distribution methods can be adopted. Among them, if the delay span of all delay units is required to meet the current required delay T, the current required delay T can be evenly distributed to all delay units; if the delay span of some delay units can meet the current required delay T, the current required delay T can be only distributed to some delay units at the front end, or a part of the current required delay T can be evenly distributed to all delay units, and then the remaining part of the current required delay T can be distributed to some delay units, which can be set according to actual needs.

[0043] Taking the first type of signal delay unit 122 including N IDELAYs and the second type of signal delay unit 124 including N ODELAYs as an example, the parameter calculation unit 130 decomposes the currently required delay T into the first type of signal delay unit 122 and the second type of signal delay unit 124, and the required delays of each IDELAY and ODELAY are T I1 ,…,T IN , T O1 ,…,T ON .

[0044] The parameter calculation unit 130 calculates the delay reference of the first type signal delay unit 122 and the delay T required for each IDELAY in the first type signal delay unit 122. I1 ,…,T IN The parameter calculation unit 130 calculates the tap value required for each IDELAY according to the delay reference of the second type signal delay unit 124 and the delay T required for each ODELAY in the second type signal delay unit 124. O1 ,…,T ONFinally, the parameter calculation unit 130 configures parameters for each IDELAY in the first type signal delay unit 122 and each ODELAY in the second type signal delay unit 124 according to the obtained tap value, so that the first type signal delay unit 122 and the second type signal delay unit 124 can delay the accessed signal.

[0045] Specifically, Figure 2 and Figure 3 As shown, the signal delay calibration device includes a first-type calibration delay unit 112, a second-type calibration delay unit 114, a first-type signal delay unit 122, a second-type signal delay unit 124, a parameter calculation unit 130, and a delay calculation unit 140, wherein the delay calculation unit 140 is used to calculate the time T that is currently required to delay. The first-type calibration delay unit 112 is used to calibrate the tap value corresponding to the initial delay of IDELAY, and the second-type calibration delay unit 114 is used to calibrate the tap value corresponding to the initial delay of ODELAY. The parameter calculation unit 130 is used to calculate the average delay time T corresponding to each tap of IDELAY in the first-type signal delay unit 122 and ODELAY in the second-type signal delay unit 124. avgI , T avgO , or calculate the tap value TAP corresponding to each unit time (such as ps) of IDELAY in the first type signal delay unit 122 and ODELAY in the second type signal delay unit 124 avgI 、TAP avgO The parameter calculation unit 130 also calculates the tap values ​​required for IDELAY and ODELAY when the delay time T is required. The first type signal delay unit 122 is used to delay the signal through IDELAY, and the second type signal delay unit 124 is used to delay the signal through ODELAY. The first type signal delay unit 122 and the second type signal delay unit 124 can be arranged in parallel or in cascade to expand the delay time range.

[0046] by Figure 3 Taking the figure as an example, the calibration execution process of the signal delay calibration device is as follows:

[0047] 1. Set the CASCADE of IDELAY of the first type of calibration delay unit 112 to NONE, DELAY_FORMAT to TIME, DELAY_TYPE to FIXED, and DELAY_VALUE to the initial delay T initI , EN_VTC is set to 1, where the initial delay T initI Within the delay range of an IDELAY, the tap value output by IDELAY is tap1.

[0048] 2. Set the CASCADE of ODELAY of the second type of calibration delay unit 114 to NONE, DELAY_FORMAT to TIME, DELAY_TYPE to FIXED, and DELAY_VALUE to the initial delay T initO , EN_VTC is set to 1. Among them, T initO Within the delay range of an IDELAY, the tap value output by ODELAY is tap2.

[0049] 3. According to the cascade of IDELAY in the first type signal delay unit 122 and ODELAY in the second type signal delay unit 124, set the CASCADE of IDELAY and ODELAY, and set the DELAY_FORMAT of IDELAY of the first type signal delay unit 122 to COUNT, DELAY_TYPE to VAR_LOAD, and LOAD to 0; set the DELAY_FORMAT of ODELAY of the second type signal delay unit 124 to COUNT, DELAY_TYPE to VAR_LOAD, and LOAD to 0.

[0050] 4. The parameter calculation unit 130 calculates the following formula: avgI =T initI / tap1 calculates the average delay of each tap of IDELAY, or according to the formula TAP avgI =tap1 / T initI Calculate the tap value of IDELAY for each ps.

[0051] 5. The parameter calculation unit 130 calculates the following formula: avgO＝ T initO / tap2 calculates the average delay of each tap in ODELAY, or according to the formula TAP avgO =tap2 / T initO Calculate the tap value of ODELAY for each ps.

[0052] 6. The delay calculation unit 140 outputs the currently required delay T.

[0053] 7. The parameter calculation unit 130 decomposes the currently required delay T into N IDELAYs in the first type signal delay unit 122 and N ODELAYs in the second type signal delay unit 124. The required delay T of each IDELAY and ODELAY is I1 ,…,T IN , T O1 ,…,T ON .

[0054] 8. The parameter calculation unit 130 uses T I1 ,…,T IN Divide by T avgI , or use T I1 ,…,T IN Multiply TAP avgI , obtain the tap value required to be set for each IDELAY in the first type signal delay unit 122. Set the LOAD of each IDELAY to 1 to make the delay effective.

[0055] 9. The parameter calculation unit 130 uses T O1 ,…,T ON Divide by T avgO , or use T O1 ,…,T ON Multiply TAP avgO , obtain the tap value required to be set for each ODELAY in the second type signal delay unit 124. Set the LOAD of each ODELAY to 1 to make the delay effective.

[0056] It should be noted that there is no mandatory requirement for the order of steps 1-3, there is no mandatory requirement for the order of steps 4-6, and there is no mandatory requirement for the order of steps 8-9.

[0057] In one embodiment, a test system is also provided, including the above-mentioned signal delay calibration device. In the signal delay calibration device, IDELAY and ODELAY working in TIME mode are used to calibrate IDELAY and ODELAY working in COUNT mode, and it is not necessary to accurately calibrate the tap delay values ​​of IDELAY and ODELAY, and a higher delay accuracy can be obtained.

[0058] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0059] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A signal delay calibration device, characterized in that: include: Calibrate the delay unit to determine the delay parameters corresponding to the initial delay; A signal delay unit, used for signal delay; the calibration delay unit and the signal delay unit include delay units of the same type; A parameter calculation unit is connected to the calibration delay unit and the signal delay unit, and is used to calculate a delay reference according to the initial delay and the delay parameter, and to set the delay of the signal delay unit according to the delay reference and the current required delay.

2. The signal delay calibration device according to claim 1, characterized in that: The calibration delay unit includes a first type of calibration delay unit and a second type of calibration delay unit connected to the parameter calculation unit; the signal delay unit includes a first type of signal delay unit and a second type of signal delay unit connected to the parameter calculation unit; wherein the first type of calibration delay unit and the first type of signal delay unit include the same type of delay units, and the second type of calibration delay unit and the second type of signal delay unit include the same type of delay units.

3. The signal delay calibration device according to claim 2, characterized in that: The first type of calibration delay unit and the first type of signal delay unit include IDELAY, and the first type of calibration delay unit is used to determine the initial delay T initI The corresponding delay value tap1; the parameter calculation unit is based on the initial delay T initI and the delay value tap1, and calculate the delay reference amount of the first type of signal delay unit.

4. The signal delay calibration device according to claim 3, characterized in that: The parameter calculation unit calculates the initial delay T initI Divide by the delay value tap1 to calculate the delay corresponding to each tap as the delay reference of the first type of signal delay unit; or The parameter calculation unit divides the delay value tap1 by the initial delay T initI , calculate the tap value corresponding to each unit time as the delay reference of the first type of signal delay unit.

5. The signal delay calibration device according to claim 2, characterized in that: The second type calibration delay unit and the second type signal delay unit include ODELAY, and the second type calibration delay unit is used to determine the initial delay T initO The corresponding delay value tap2; the parameter calculation unit is based on the initial delay T initO and the delay value tap2, and calculate the delay reference amount of the second type signal delay unit.

6. The signal delay calibration device according to claim 5, characterized in that: The parameter calculation unit calculates the initial delay T initO Divide by the delay value tap2 to calculate the delay corresponding to each tap as the delay reference of the second type of signal delay unit; or The parameter calculation unit divides the delay value tap2 by the initial delay T initO , calculate the tap value corresponding to each unit time as the delay reference of the second type of signal delay unit.

7. The signal delay calibration device according to claim 2, characterized in that: The first type of signal delay unit includes at least one IDELAY, the second type of signal delay unit includes at least one ODELAY, and the parameter calculation unit connects the IDELAY and the ODELAY.

8. The signal delay calibration device according to claim 7, characterized in that: The first type of signal delay unit and the second type of signal delay unit are arranged in parallel or in cascade.

9. The signal delay calibration device according to claim 8, characterized in that: If the currently required delay is less than or equal to the delay span of IDELAY / ODELAY, the first type of signal delay unit and the second type of signal delay unit are arranged in parallel, the first type of signal delay unit includes one IDELAY, and the second type of signal delay unit includes one ODELAY; If the currently required delay is greater than the delay span of IDELAY / ODELAY, the first type of signal delay unit and the second type of signal delay unit are arranged in parallel, then the first type of signal delay unit includes at least two IDELAYs connected in sequence, and the second type of signal delay unit includes at least two ODELAYs connected in sequence; If the currently required delay is greater than the delay span of IDELAY / ODELAY, the first type of signal delay unit and the second type of signal delay unit are cascaded, and the first type of signal delay unit includes at least one IDELAY, and the second type of signal delay unit includes at least one ODELAY.

10. The signal delay calibration device according to any one of claims 1 to 9, characterized in that: It also includes a delay calculation unit connected to the parameter calculation unit, and the delay calculation unit is used to output the currently required delay to the parameter calculation unit; the parameter calculation unit allocates the currently required delay to the delay unit in the signal delay unit, and determines the delay parameter of the delay unit in the signal delay unit in combination with the delay reference.

11. A testing system, characterized in that: It comprises the signal delay calibration device as described in any one of claims 1-10.

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