Row coverage rate determination method and device, computer equipment and storage medium
During the test process of the program to be tested, the execution array and reference array of the target time period are obtained, the newly executed bytecode instructions and source code lines are determined, and the line coverage rate is calculated, which solves the problem of low timeline determination of row coverage in traditional technology, and more efficient test case adjustment and testing efficiency improvement are achieved.
Patent Information
- Application Number
- CN202411976719.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-26
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2044-12-26
AI Technical Summary
In traditional technology, the determination of line coverage is low in time, and the code execution cannot be reflected in time during the test process of the program to be tested, which affects the adjustment of test cases and the testing efficiency.
By obtaining the execution array and reference array of the target time period, the target index of the newly executed bytecode instruction is determined during that time period, combined with the index table, the target line identification of the newly executed source code line is determined, and the row coverage ratio of the program to be tested is finally calculated.
It realizes determining the current line coverage ratio of the program to be tested at the end of each time period, improving the timeliness determination of line coverage ratio, conveniently adjusting test cases in a timely manner, and improving testing efficiency.