Method for evaluating performance degradation prediction accuracy of electronic equipment under small sample size
By designing the test temperature and sample number under a small sample size, combining the thermal simulation model and performance degradation prediction results, thermal stress accelerated degradation test was carried out, and the problem of evaluating the accuracy of performance degradation prediction of electronic equipment under a small sample size was solved, and the effect of reducing test costs and improving evaluation rigor was achieved.
Patent Information
- Application Number
- CN202411829483.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-12
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2044-12-12
AI Technical Summary
Under small sample sizes, it is difficult to effectively evaluate the expected accuracy of electronic equipment performance degradation, resulting in significant deviations from the actual value of the calculation results, increasing the cost and risk of testing.
By considering the maximum operating temperature of components in electronic equipment and the thermal simulation model design test temperature, combining the expected results of performance degradation and the number of degradation dispersion design test samples, thermal stress accelerated degradation test is carried out to calculate the expected error range of performance degradation.
Under the condition of limited sample size, the accuracy of performance degradation prediction can be effectively evaluated, the cost of testing is reduced, and the evaluation rigor can be improved, breaking through the limitations of traditional methods that require large samples to obtain accurate results.