Machine readable calibration measurement capability data embedding DCC system and method
By designing machine-readable calibration measurement capability data to be embedded in the DCC system, using API calls to obtain and dynamically update KCDB data, and embed it into the digital calibration certificate, it solves the problem that calibration agencies in the prior art find it difficult to efficiently integrate CMC data, and achieves more efficient and accurate data processing and certificate generation.
Patent Information
- Application Number
- CN202411851799.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2044-12-16
AI Technical Summary
In the prior art, it is difficult for calibration mechanisms to efficiently integrate or embed machine-readable CMC data into the digital calibration certificate (DCC) system, resulting in users requiring complex format conversion and data docking, which seriously limits the wide application of DCC in the field of metrology.
A machine-readable calibration measurement capability data is designed to embed into the DCC system, including the WEB service subsystem, the acquisition subsystem, the message queue subsystem and the storage subsystem. The calibration measurement capability data in KCDB is obtained and dynamically updated through API calls, and embedded it into the digital calibration certificate, while generating a trusted time stamp.
Through the automated data acquisition and embedding process, manual intervention is significantly reduced, data accuracy, effectiveness and authority are improved, user experience is improved, and the generation efficiency and application value of digital calibration certificates are greatly improved.