High and low temperature impact test equipment
By setting up a variety of structures in the test chamber of high and low temperature impact testing equipment, the inconvenience of the equipment in promoting observation, rotation and sealing separation is solved, and a more flexible and efficient test process is achieved.
Patent Information
- Application Number
- CN202411898017.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-23
- Publication Date
- 2025-03-28
AI Technical Summary
The existing high and low temperature impact testing equipment is inconvenient in carrying out the experimental chamber to promote observation work, rotation of the experimental product and sealing separation.
By setting up a rotatable clamping fixture structure, a movable plug-in high and low temperature test chamber structure, a supportable driving auxiliary frame structure and a pluggable sealing separation auxiliary box structure in the test chamber, the push, rotation and sealing separation of the test chamber are achieved.
During the test, the observation and maintenance work is convenient, the test items are fixed and rotated, and the high and low temperature areas are separated in a timely manner, which improves the flexibility and efficiency of the test.