VSP reflection wave coverage times calculation method and device, storage medium and equipment

By creating a bin grid and mapping the reflection point positions in the VSP acquisition design, the problem of low efficiency in calculating the reflection wave coverage number in the existing technology is solved, and high-precision and efficient coverage number calculation is achieved.

CN119861408BActive Publication Date: 2025-10-17CHINA PETROLEUM & CHEMICAL CORP +1
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Patent Information

Application Number
CN202311359903.4
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-10-19
Publication Date
2025-10-17
Estimated Expiration
2043-10-19

AI Technical Summary

Technical Problem

In the existing VSP acquisition design, the calculation efficiency of the reflection wave coverage times is low and the accuracy is not high. Especially in large models or cases with multiple shot checkpoints, the ray tracing method has low calculation efficiency.

Method used

By creating a bin grid, the reflection point position of each shot check point in each layer is calculated and mapped to the bin grid, and the coverage number of the reflected wave is directly calculated using an analytical formula instead of a step-by-step approximation of the ray path.

Benefits of technology

It achieves high-precision calculation of the number of reflection wave coverages and improves computational efficiency, which is more than 10 times faster than the ray tracing method.

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Abstract

The application provides a VSP reflection wave coverage times calculation method, device, storage medium and equipment, and belongs to the field of downhole seismic exploration. The method is: creating a bin grid according to input parameters, calculating the reflection point position of each shot-receiver in each horizon and mapping to the bin grid, that is, obtaining the coverage times. Through actual tests, the method has fast calculation efficiency and calculation accuracy comparable to the ray tracing method.
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