An aiming device and aiming method for an X-ray streak camera diagnostic system

Abstract

This invention belongs to the field of optical components and relates to an aiming device and aiming method for an X-ray streak camera diagnostic system. The device includes a long-focusing microscope, a simulated target, a simulated cathode device, a support platform, a first adjustment stage, and a second adjustment stage. The aiming method includes: mounting a pinhole camera on the mounting flange of the simulated cathode device; adjusting the pinhole head of the pinhole camera to align the center of the long-focusing microscope's field of view, the pinhole head of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device; determining the target position coordinates in the image acquired by the CCD camera; detaching and installing the pinhole camera into the X-ray streak camera diagnostic system, and adjusting the target's position coordinates in the CCD field of view to the target position coordinates; achieving rapid aiming of the X-ray streak camera on a large laser device under vacuum offline conditions.

Description

Technical Field

[0001] This invention relates to the field of optical components, and specifically discloses an aiming device and aiming method for an X-ray streak camera diagnostic system. Background Technology

[0002] The X-ray streak camera diagnostic system, formed by combining a pinhole camera with an X-ray streak camera, boasts ultra-high spatiotemporal resolution and is an indispensable core diagnostic device for inertial confinement fusion physics experiments. It images X-rays generated by laser target ablation onto the cathode of a scanning image converter tube (SMT) through a pinhole or slit. High spatiotemporal resolution is then achieved through photoelectric conversion at the SMT cathode and focusing and deflection processes by the electron optics system. To achieve accurate measurement of the signal under test, precise aiming of the target, pinhole / slit, and the SMT cathode of the streak camera is required. Conventional aiming methods employ online aiming methods such as laser pointing. However, the establishment of a 100,000-joule-scale large-scale laser inertial confinement fusion device requires the streak camera to operate entirely within the vacuum environment of the diagnostic platform. Therefore, traditional aiming methods based on laser collimation or variable-focus optical observation are no longer applicable for the X-ray streak camera diagnostic system on such a device. The aiming section of the DIM camera can only achieve positioning and observation of the target, but cannot achieve alignment of the target, pinhole / slit, and cathode in a straight line. Therefore, there is an urgent need to develop a new type of X-ray streak camera aiming device and aiming method.

[0003] In view of this, the present invention provides an aiming device and aiming method for an X-ray streak camera diagnostic system, enabling rapid aiming of an X-ray streak camera on a large laser device under vacuum offline conditions. Summary of the Invention

[0004] The purpose of this invention is to provide an aiming device for an X-ray streak camera diagnostic system, comprising a long focusing microscope, a simulated target, a simulated cathode device, a support platform, a first adjustment stage, and a second adjustment stage.

[0005] Furthermore, the long focusing microscope is disposed at the target end of the simulated cathode device; the simulated target is disposed between the long focusing microscope and the simulated cathode device; the support platform is used to support the simulated cathode device and the simulated target; the first adjustment stage is used to adjust the pose of the long focusing microscope; and the second adjustment stage is used to adjust the position of the simulated target.

[0006] Furthermore, the simulated cathode device includes a simulated cathode slit, a connecting cylinder, a mounting base, and a mounting flange.

[0007] Furthermore, the mounting flange is disposed at the target end of the simulated cathode device for mounting a pinhole camera, and the mounting flange has the same structure as the flange for mounting a pinhole camera on the end face of an X-ray streak camera; the simulated cathode slit is used to simulate the cathode slit of an X-ray streak camera and is disposed at the non-target end opposite to the target end of the simulated cathode device; the connecting cylinder is disposed between the simulated cathode slit and the mounting flange; the simulated cathode slit is embedded in the opening of the connecting cylinder; the mounting base is used to mount the simulated cathode device on the support platform.

[0008] Furthermore, the pinhole camera is disposed between the simulated target and the simulated cathode device, and the pinhole camera includes a pinhole head, a pinhole, and an aiming section.

[0009] Furthermore, the pinhole head is disposed on the end face of the pinhole camera near the simulated target; the aiming joint is disposed on the light transmission path of the pinhole camera; and the pinhole is disposed between the pinhole head and the aiming joint.

[0010] The present invention also provides an X-ray streak camera diagnostic system aiming method according to any one of the preceding claims, comprising: mounting a pinhole camera on the mounting flange of a simulated cathode device; adjusting the pinhole head of the pinhole camera so that the center of the field of view of the long focusing microscope, the pinhole head of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device are aligned; determining the target position coordinates in the image acquired by the CCD camera; disassembling and mounting the pinhole camera to the X-ray streak camera diagnostic system, and adjusting the position coordinates of the target in the field of view of the CCD (Charge-Coupled Device) to the target position coordinates.

[0011] Further, adjusting the pinhole head of the pinhole camera includes: removing the pinhole head of the pinhole camera, coarsely adjusting the orientation of the long focusing microscope using the first adjustment stage, so that the center of the field of view of the long focusing microscope, the center of the mounting flange, and the center of the simulated cathode slit of the simulated cathode device are aligned; installing the pinhole head of the pinhole camera, and finely adjusting the orientation of the long focusing microscope using the first adjustment stage, so that the center of the field of view of the long focusing microscope, the pinhole of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device are aligned.

[0012] Further, determining the target position coordinates of the simulated target in the image acquired by the CCD camera includes: placing the simulated target between the pinhole camera and the target end of the simulated cathode device; adjusting the position of the simulated target using a second adjustment platform to make the simulated target image clearest on the CCD camera; storing the image of the simulated target in the CCD camera and recording the target position coordinates of the simulated target in the image.

[0013] Furthermore, the process of detaching and mounting the pinhole camera onto the X-ray streak camera diagnostic system, and adjusting the position coordinates of the target in the CCD field of view to match the target position coordinates, includes: removing the pinhole camera and mounting it on the mounting flange at the optical entrance of the X-ray streak camera to form the X-ray streak camera diagnostic system; mounting the X-ray streak camera diagnostic system on the diagnostic mounting platform of the laser device, and sending the X-ray streak camera diagnostic system to the diagnostic measurement position via the diagnostic mounting platform; adjusting the attitude of the X-ray streak camera diagnostic system via the diagnostic mounting platform so that the target appears in the field of view of the aiming section CCD, and the position coordinates of the target in the CCD field of view are consistent with the target position coordinates.

[0014] The present invention has the following advantages and beneficial effects:

[0015] The problem of aiming in a vacuum environment with X-ray streak cameras has been solved, ensuring the accuracy of high spatiotemporal resolution diagnosis.

[0016] When the equipment performs diagnostic tasks, the target chamber and the core working components (front-end optical system) of the X-ray streak camera diagnostic system are in a vacuum environment. The vacuum isolation design of DIM ensures operational compatibility and vacuum stability.

[0017] This invention employs a pinhole camera paired with an X-ray streak camera to form an X-ray streak camera diagnostic system with ultra-high spatiotemporal resolution. It images X-rays generated by laser target ablation onto the cathode of a scanning image converter tube (SMT) through a pinhole or slit. High spatiotemporal resolution is then achieved through photoelectric conversion at the SMT cathode and focusing and deflection processes by the electron optics system. This enables precise collimation and aiming of the target, the pinhole / slit, and the streak camera cathode.

[0018] The X-ray streak camera in this invention can be operated via a DIM (Diagnostic Instrument Manipulator) without disrupting the vacuum state inside the target chamber. The DIM is also equipped with a aiming joint based on a binocular aiming method. After the aiming joint is installed, the diagnostic system can achieve online positioning and observation of the target via the DIM. Attached Figure Description

[0019] Figure 1 This is an exemplary schematic diagram of the aiming device of the X-ray stripe camera diagnostic system in this invention;

[0020] Figure 2 This is an exemplary schematic diagram of the simulated cathode device in this invention;

[0021] Figure 3 This is an exemplary schematic diagram of the pinhole camera structure used in the X-ray streak camera diagnostic system of the present invention;

[0022] Figure 4 This is an exemplary schematic diagram of offline aiming according to the present invention;

[0023] Figure 5 This is an exemplary schematic diagram of the X-ray streak camera diagnostic system of the present invention installed on the diagnostic mounting platform of a large device;

[0024] Figure 6 This is an exemplary schematic diagram of the structure of the X-ray streak camera diagnostic system in this invention;

[0025] Reference numerals: 1-Long focusing microscope, 2-Simulated target, 3-Simulated cathode device, 4-Support platform, 5-First adjustment stage, 6-Second adjustment stage, 7-Simulated cathode slit, 8-Connecting cylinder, 9-Mounting base, 10-Mounting flange, 11-Pinhole head, 12-Pinhole / slit, 13-Aiming joint, 14-Diagnostic mounting platform, 15-Diagnostic mounting platform carriage, 16-Cathode, 17-X-ray streak camera. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0027] Figure 1 This is an exemplary schematic diagram of the aiming device of the X-ray streak camera diagnostic system in this invention. Figure 1As shown, the system includes a long-focusing microscope 1, a simulated target 2, a simulated cathode device 3, a support platform 4, a first adjustment stage 5, and a second adjustment stage 6. The long-focusing microscope is an optical observation device with long working distance and high-resolution imaging capabilities. Through multi-dimensional attitude adjustment (e.g., up / down, left / right, rotation, and pitch), it achieves micrometer-level collimation between the field of view center and the target (e.g., simulated cathode slit, pinhole flange, etc.). The simulated target is a calibration device that reproduces the physical characteristics of a real target and is fixedly mounted on the second adjustment stage. Its surface is engraved with characteristic markings (e.g., crosshairs, micro-holes), which are used to verify the coaxiality of the optical link by imaging on the aiming section CCD camera. In fusion diagnostics, the simulated target can replace the real target for optical path calibration, improving the spatiotemporal resolution accuracy of the diagnostic system. The simulated cathode device is a core component for optical path calibration in a high-vacuum environment, used to simulate the real cathode slit of an X-ray streak camera. The long-focusing microscope is positioned at the target end of the simulated cathode device. The target end of the simulated cathode device refers to the frontal region of the simulated cathode device closest to the target material (e.g., the simulated target), which directly interfaces with the target chamber or target system and serves as the optical and mechanical interface of the device. The simulated target is positioned between the long-focusing microscope and the simulated cathode device; the support platform supports both the simulated cathode device and the simulated target; the first adjustment stage adjusts the posture of the long-focusing microscope, providing vertical, horizontal, rotational, and pitch adjustments; the second adjustment stage, mounted on the support platform, adjusts the position of the simulated target, providing vertical, forward, backward, and horizontal adjustments.

[0028] Figure 2 This is an exemplary schematic diagram of the simulated cathode device in this invention. Figure 2As shown, the simulated cathode device includes a simulated cathode slit 7, a connecting cylinder 8, a mounting base 9, and a mounting flange 10. The simulated cathode slit is a micrometer-sized slit in the simulated cathode device used to constrain and calibrate the spatial distribution of light. Its center is the core reference point for optical path alignment and serves as the optical benchmark for X-ray spatiotemporal resolution measurements. The size of the simulated cathode slit is the same as that of the cathode slit of the X-ray streak camera. The height of the simulated cathode slit from the support platform is the same as the height of the X-ray streak camera's cathode slit from the support platform when the X-ray streak camera is placed on it. The distance of the simulated cathode slit from the mounting flange is the same as the distance of the X-ray streak camera's cathode slit from the front face of the camera. The mounting flange has the same structure as the flange used to mount a pinhole camera on the front face of the X-ray streak camera. The connecting cylinder is a hollow cylindrical vacuum component that connects the cathode slit and the mounting flange, providing a vacuum transmission channel and achieving mechanical support and vacuum sealing. The mounting base is used to achieve multi-dimensional precision calibration of the simulated cathode device. The mounting flange is disposed at the target end of the simulated cathode device for mounting a pinhole camera, ensuring that the center of the field of view of the long focusing microscope, the pinhole head of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device are aligned. The simulated cathode slit is disposed at the non-target end opposite to the target end of the simulated cathode device, where the non-target end refers to the end face opposite to the target end of the simulated cathode device. The connecting cylinder is disposed between the simulated cathode slit and the mounting flange. The simulated cathode slit is embedded in the opening of the connecting cylinder to simulate a real cathode slit. The mounting base is used to fix the simulated cathode device on the support platform.

[0029] Figure 3 This is an exemplary schematic diagram of the pinhole camera structure used in the X-ray streak camera diagnostic system of the present invention. Figure 4 This is an exemplary schematic diagram of the offline aiming method of the present invention. Figure 3 and Figure 4 As shown, the pinhole camera is positioned between the simulated target and the simulated cathode device. The pinhole camera includes a pinhole head 11, a pinhole / slit 12, and an aiming joint 13. The pinhole head is located on the end face of the pinhole camera near the simulated target, integrating pinhole elements to support rapid assembly, disassembly, and calibration in a vacuum environment. The aiming joint is positioned on the light transmission path of the pinhole camera, acquiring images of the simulated target via a CCD and providing feedback on the position of the pinhole head to ensure alignment of the field of view center of the long-focusing microscope, the pinhole head of the pinhole camera, and the simulated cathode slit center of the simulated cathode device. The pinhole is positioned between the pinhole head and the aiming joint.

[0030] The present invention also provides an aiming method for an X-ray streak camera diagnostic system, comprising the following:

[0031] The pinhole camera is mounted on the mounting flange at the target end of the simulated cathode device.

[0032] Adjust the pinhole head of the pinhole camera so that the center of the field of view of the long focusing microscope, the pinhole head of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device are aligned. In some embodiments, adjusting the pinhole head of the pinhole camera includes:

[0033] Remove the pinhole head from the front end of the pinhole camera, and coarsely adjust the position and orientation of the long focusing microscope using the first adjustment platform. This ensures that the center of the long focusing microscope's field of view, the center of the mounting flange, and the center of the simulated cathode slit of the simulated cathode device are aligned; that is, the center of the long focusing microscope's field of view, the center of the flange mounting the pinhole camera, and the center of the simulated cathode slit are on a straight line. Coarse adjustment refers to adjusting the long focusing microscope vertically, horizontally, rotating, and tilting.

[0034] The pinhole head of the pinhole camera is installed, and the pose of the long focusing microscope is finely adjusted using the first adjustment stage. This ensures that the center of the field of view of the long focusing microscope, the pinhole of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device are aligned, i.e., the center of the field of view of the long focusing microscope, the center of the pinhole / slit, and the center of the simulated cathode slit are on a straight line. Fine adjustment refers to making minor adjustments to the pose of the long focusing microscope; the adjustment range of fine adjustment is smaller than that of coarse adjustment.

[0035] Determine the target position coordinates in the image acquired by the CCD camera. Target position coordinates refer to the position coordinates of the simulated target in the CCD image when the simulated target is most clearly imaged on the aiming section of the CCD camera. In some embodiments, determining the target position coordinates in the image acquired by the CCD camera includes:

[0036] The simulated target is placed between the pinhole camera and the target end of the simulated cathode device, that is, the simulated target is placed in front of the pinhole camera. The left-right and up-down positions of the simulated target are adjusted using the second adjustment platform so that the center of the simulated target coincides with the field of view center of the long focusing microscope.

[0037] Turn on the CCD camera of the pinhole camera aiming section, and adjust the front and rear positions of the simulated target through the second adjustment platform so that the simulated target is imaged most clearly on the CCD camera of the aiming section.

[0038] The image of the simulated target in the CCD camera is stored and the target position coordinates in the image are recorded.

[0039] The process of disassembling and assembling the pinhole camera into the X-ray streak camera diagnostic system, and adjusting the position coordinates of the target in the CCD field of view to the target position coordinates, includes:

[0040] The pinhole camera is removed and installed on the mounting flange at the optical entrance of the X-ray streak camera, forming a shape as shown below. Figure 6 The X-ray stripe camera diagnostic system shown.

[0041] like Figure 5 The X-ray streak camera diagnostic system is installed on the diagnostic platform of a large laser device, and is then positioned at the diagnostic measurement location via the platform. The diagnostic platform refers to a high-energy laser system with an output energy of 100,000 joules or higher (e.g., the Shenguang device), possessing high-precision focusing capabilities for multiple laser beams, generating an extreme high-temperature, high-pressure environment to drive the target implosion, thus providing an experimental platform for X-ray diagnostics. The diagnostic platform is a precision mechanical system installed around the target chamber, supporting and controlling the diagnostic equipment (such as the streak camera), achieving six-degree-of-freedom adjustment in a vacuum environment, ensuring micron-level coaxiality between the equipment and the target center through visual feedback closed-loop alignment, supporting offline pre-calibration and online dynamic adjustment without disrupting the target chamber vacuum. The diagnostic measurement location refers to the optimal observation position of the diagnostic equipment directly facing the target within the target chamber.

[0042] The orientation of the X-ray stripe camera diagnostic system is adjusted by the diagnostic platform so that the target appears in the field of view of the aiming section CCD, and the position coordinates of the target in the field of view of the CCD are consistent with the target position coordinates.

[0043] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An aiming device for an X-ray streak camera diagnostic system, characterized in that, It includes a long focusing microscope, a simulated target, a simulated cathode device, a support platform, a first adjustment stage, and a second adjustment stage; The long focusing microscope is disposed at the target end of the simulated cathode device; the simulated target is disposed between the long focusing microscope and the simulated cathode device; the support platform is used to support the simulated cathode device and the simulated target; the first adjustment stage is used to adjust the pose of the long focusing microscope; the second adjustment stage is used to adjust the position of the simulated target. The simulated cathode device includes a simulated cathode slit, a connecting cylinder, a mounting base, and a mounting flange. The mounting flange is disposed at the target end of the simulated cathode device for mounting a pinhole camera. The mounting flange has the same structure as the flange for mounting a pinhole camera on the end face of an X-ray streak camera. The simulated cathode slit is used to simulate the cathode slit of an X-ray streak camera and is disposed at the non-target end opposite to the target end of the simulated cathode device. The connecting cylinder is disposed between the simulated cathode slit and the mounting flange. The simulated cathode slit is embedded in the opening of the connecting cylinder. The mounting base is used to mount the simulated cathode device on the support platform; The pinhole camera is disposed between the simulated target and the simulated cathode device, and the pinhole camera includes a pinhole head, a pinhole, and an aiming section.

2. The aiming device of the X-ray streak camera diagnostic system according to claim 1, characterized in that, The pinhole head is disposed on the end face of the pinhole camera near the simulated target; the aiming joint is disposed on the light transmission path of the pinhole camera; the pinhole is disposed between the pinhole head and the aiming joint.

3. The aiming method for an X-ray streak camera diagnostic system according to any one of claims 1-2, characterized in that, include: The pinhole camera is mounted on the mounting flange of the simulated cathode device; Adjust the pinhole head of the pinhole camera to align the center of the field of view of the long focusing microscope, the pinhole head of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device. Determine the target position coordinates in the image acquired by the CCD camera; The pinhole camera is disassembled and installed into the X-ray stripe camera diagnostic system, and the position coordinates of the target in the CCD field of view are adjusted to the target position coordinates.

4. The aiming method for the X-ray streak camera diagnostic system according to claim 3, characterized in that, Adjusting the pinhole head of the pinhole camera includes: Remove the pinhole head of the pinhole camera and coarsely adjust the position and orientation of the long focusing microscope using the first adjustment platform so that the center of the field of view of the long focusing microscope, the center of the mounting flange, and the center of the simulated cathode slit of the simulated cathode device are aligned. Install the pinhole head of the pinhole camera and finely adjust the position and orientation of the long focusing microscope using the first adjustment stage; so that the center of the field of view of the long focusing microscope, the pinhole of the pinhole camera, and the center of the simulated cathode slit of the simulated cathode device are aligned.

5. The aiming method for the X-ray streak camera diagnostic system according to claim 3, characterized in that, Determining the target's position coordinates in the image acquired by the CCD camera includes: The simulated target is placed between the pinhole camera and the target end of the simulated cathode device; The position of the simulated target is adjusted by the second adjustment platform so that the simulated target is imaged most clearly on the CCD camera; The image of the simulated target in the CCD camera is stored and the target position coordinates in the image are recorded.

6. The aiming method for an X-ray streak camera diagnostic system according to claim 3, characterized in that, The process of disassembling and assembling the pinhole camera into the X-ray streak camera diagnostic system, and adjusting the position coordinates of the target in the CCD field of view to the target position coordinates, includes: The pinhole camera is removed and installed on the mounting flange at the optical entrance of the X-ray streak camera to form an X-ray streak camera diagnostic system. The X-ray stripe camera diagnostic system is installed in the diagnostic mounting platform of the laser device, and the X-ray stripe camera diagnostic system is sent to the diagnostic measurement position through the diagnostic mounting platform; The orientation of the X-ray stripe camera diagnostic system is adjusted by the diagnostic platform so that the target appears in the field of view of the aiming section CCD, and the position coordinates of the target in the field of view of the CCD are consistent with the target position coordinates.

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