Polymer-filled single-ridge waveguide structure for medium micro-discharge verification

Abstract

The invention discloses a polymer-filled single-ridge waveguide structure for medium micro-discharge verification, and belongs to the technical field of microwave devices. The structure comprises a single-ridge waveguide shell, a cavity is formed in the single-ridge waveguide shell, and a protruding ridge structure is arranged in the cavity; the polymer dielectric sheet is arranged in the cavity, and a sensitive gap is formed between the polymer dielectric sheet and the ridge structure; a micro trap structure is arranged on the surface of the polymer dielectric sheet and comprises a plurality of discrete micropores. The sensitive gap between the ridge structure of the single-ridge waveguide shell and the polymer dielectric sheet forms an electric field concentration area for inducing micro discharge; a micro trap structure is formed by discrete micropores in the surface of the polymer dielectric sheet and is used for inhibiting secondary electron emission. The structure provides a verification platform for micro-discharge effect research of organic media in waveguide devices.

Description

Technical Field

[0001] This invention belongs to the field of microwave device technology and relates to a polymer-filled single-ridge waveguide structure for dielectric microdischarge verification. Background Technology

[0002] Micro-discharge refers to the phenomenon where electrons, accelerated by a high-frequency electromagnetic field in a vacuum environment, collide with the surface of a device and generate secondary electrons, leading to an avalanche-like multiplication. This phenomenon is one of the key factors limiting the power capacity and reliability of high-power microwave components in aerospace. The secondary electron emission factor (SEY) of a material is a core parameter for measuring the risk of micro-discharge; the higher the SEY, the more prone the device is to micro-discharge. Organic polymers such as polytetrafluoroethylene (PTFE) and polyimide (PI) are widely used in dielectric support and insulation filling applications in aerospace microwave devices due to their excellent properties such as light weight, low dielectric loss, and radiation resistance. However, these organic polymers generally have high SEY values ​​(PTFE's peak SEY can reach 2.05, and PI's is approximately 1.35), making the devices prone to micro-discharge and becoming a bottleneck restricting system power improvement.

[0003] To study the micro-discharge characteristics of organic media and verify their suppression effects, a specialized verification platform needs to be constructed. This platform should possess two basic functions: first, the ability to form a controllable strong electric field region to induce micro-discharge; and second, the ability to hold the organic media sample to be verified. In the prior art, Chinese patent application CN121416789A discloses a circular coaxial filter for verifying ring-shaped micro-discharges, which sets a polymer ring in the annular gap of the coaxial structure and mechanically processes grooves on the polymer surface to reduce SEY. However, this approach has the following shortcomings: First, this scheme uses a coaxial structure, whose electric field distribution and sensitive gap morphology differ significantly from waveguide devices. It cannot directly simulate the micro-discharge scenarios of planar or quasi-planar gaps commonly found in waveguide structures, limiting its applicability as a general-purpose verification platform. Second, the sensitive gap width of this scheme is 1mm, which makes it difficult to accurately simulate the strong electric field environment of sub-millimeter gaps in actual high-power microwave devices for higher frequency waveguide devices (such as the Ku band).

[0004] Therefore, there is an urgent need for a micro-discharge verification device structure specifically designed for waveguide structures, capable of carrying organic dielectric samples, and capable of effectively reducing SEY through high-precision surface treatment. Summary of the Invention

[0005] The purpose of this invention is to provide a polymer-filled single-ridge waveguide structure for dielectric microdischarge verification, in order to overcome the problems in the prior art of lacking an organic dielectric microdischarge verification platform suitable for waveguide structures, and the difficulty of existing surface treatment methods in effectively reducing the secondary electron emission coefficient on organic dielectrics.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: This invention provides a polymer-filled single-ridge waveguide structure for dielectric microdischarge verification, comprising: a single-ridge waveguide housing with a cavity formed inside, wherein a raised ridge structure is disposed within the cavity; a polymer dielectric sheet disposed within the cavity, wherein a sensitive gap is formed between the polymer dielectric sheet and the ridge structure; and a microtrap structure is disposed on the surface of the polymer dielectric sheet, wherein the microtrap structure comprises a plurality of discrete micropores.

[0007] According to one embodiment of the present invention, the ridge structure is disposed in the middle of the cavity along the extension direction of the cavity.

[0008] According to one embodiment of the present invention, the ridge structure is a stepped structure with multiple stepped surfaces of different heights along the extension direction of the cavity.

[0009] According to one embodiment of the present invention, the plurality of stepped surfaces of different heights gradually increase from both ends to the middle along the extension direction of the cavity; the polymer medium sheet is disposed on the bottom wall of the cavity and is opposite to the stepped surface at the highest position.

[0010] According to one embodiment of the present invention, the polymer medium sheet has a sheet-like structure, the length of the polymer medium sheet along the extension direction of the cavity matches the length of the step surface at the highest position, and the width matches the width of the bottom wall of the cavity.

[0011] According to one embodiment of the present invention, the microtrap structure is located on the surface of the polymer dielectric sheet facing the sensitive gap.

[0012] According to one embodiment of the present invention, a plurality of the discrete micropores are arranged in an array on the surface of the polymer medium sheet.

[0013] According to one embodiment of the present invention, the width of the sensitive gap is less than 1 mm.

[0014] According to one embodiment of the present invention, the thickness of the polymer dielectric sheet is determined by simulation based on the width of the sensitive gap.

[0015] According to one embodiment of the present invention, the polymer dielectric sheet is made of polytetrafluoroethylene or polyimide; the single-ridge waveguide housing is made of metal.

[0016] Compared with the prior art, the present invention has the following beneficial technical effects: This invention provides a polymer-filled single-ridge waveguide structure for verifying dielectric microdischarge. By constructing a single-ridge waveguide shell with an internal cavity containing raised ridges, a verification platform based on the waveguide structure is built, capable of simulating typical electromagnetic environments in waveguide devices. By placing a polymer dielectric sheet within the cavity and forming a sensitive gap between it and the ridge structure, controllable induction conditions are provided for studying the microdischarge characteristics of the polymer dielectric. Furthermore, by incorporating a micro-trap structure containing multiple discrete micropores on the surface of the polymer dielectric sheet, effective suppression of secondary electron emission from the dielectric surface is achieved. Overall, this structure provides an effective verification method for studying microdischarge suppression in organic dielectrics within waveguide devices. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the polymer-filled single-ridge waveguide structure used for dielectric microdischarge verification according to the present invention; Figure 2 This is a cross-sectional dimension annotation of the polymer-filled single-ridge waveguide structure used for dielectric microdischarge verification according to the present invention; Figure 3 This is a cross-sectional dimension diagram along the extension direction of the polymer-filled single-ridge waveguide structure used for dielectric microdischarge verification according to the present invention. Figure 4 The figure shows the simulation results of the ridge waveguide S-parameters under typical operating mode of the present invention; Figure 5 This is a simulated electric field distribution diagram inside the ridge waveguide under typical operating mode of the present invention; Figure 6 This is a schematic diagram of the microtrap structure and micropore of the present invention. In the figure, (a) is the microtrap structure and (b) is the micropore. Figure 7 The image shows a comparison of SEY curves for organic media PTFE and PI with untreated surfaces and with microporous structures.

[0018] Figure 8 The diagram shows the evolution of the number of secondary electrons on the untreated surfaces of organic media PTFE and PI. In the diagram, (a) represents PTFE filling and (b) represents PI filling.

[0019] Figure 9 The diagram shows the evolution of the number of secondary electrons when microporous treatment is performed on the surfaces of organic media PTFE and PI. In the diagram, (a) represents PTFE filling and (b) represents PI filling.

[0020] In the figure, 1 is the single-ridge waveguide shell; 2 is the polymer dielectric sheet; 201 is the micro-trap structure; and 3 is the sensitive gap. Detailed Implementation

[0021] Micro-discharge effect is a key factor limiting the performance of high-power microwave devices in aerospace. Organic polymers such as polytetrafluoroethylene and polyimide, due to their high secondary electron emission coefficients, are prone to inducing micro-discharge when filled into waveguide devices. Existing technologies lack dedicated verification platforms for waveguide structures; therefore, this invention proposes a polymer-filled single-ridge waveguide structure for verifying dielectric micro-discharge.

[0022] This invention constructs a waveguide-like verification platform using a single-ridge waveguide shell. It utilizes the sensitive gap formed between the ridge structure within the cavity and the polymer dielectric sheet to concentrate the electric field and induce micro-discharges. Simultaneously, a micro-trap structure containing discrete micropores is set on the surface of the dielectric sheet. This structure as a whole achieves effective simulation and suppression verification of the micro-discharge effect of organic dielectrics in waveguide-like devices, providing a dedicated experimental platform for related research.

[0023] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0024] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0025] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installed," "equipped with," "sleeved / connected," "connected," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0026] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a number" means two or more, unless otherwise explicitly specified.

[0027] Example 1 like Figure 1 As shown, this embodiment provides a polymer-filled single-ridge waveguide structure for dielectric microdischarge verification. The structure includes a single-ridge waveguide housing 1, with a cavity formed inside the housing 1, and a raised ridge structure disposed within the cavity. The single-ridge waveguide housing 1 is used to construct a microwave transmission channel, and the ridge structure design enhances the electric field distribution within the cavity.

[0028] A polymer dielectric sheet 2 is filled within the cavity of a single-ridge waveguide housing 1, serving as the organic dielectric sample to be verified. A sensitive gap 3 is formed between the polymer dielectric sheet 2 and the ridge structure. This sensitive gap 3 is located between the opposing surfaces of the polymer dielectric sheet 2 and the ridge structure and is the region where the microwave electric field is most concentrated, used to induce micro-discharge effects when a microwave signal is input.

[0029] The surface of the polymer dielectric sheet 2 facing the sensitive gap 3 is provided with a micro-trap structure 201, which includes multiple discrete micropores. When electrons are accelerated within the sensitive gap 3 and collide with the surface of the polymer dielectric sheet 2, the discrete micropores can trap secondary electrons, increasing the collision probability of electrons during the escape process, thereby effectively suppressing secondary electron emission.

[0030] In this embodiment, the electric field energy is concentrated in the sensitive gap 3 by the ridge structure of the single-ridge waveguide shell 1, making micro-discharge easier to occur; at the same time, the micro-trap structure 201 on the surface of the polymer dielectric sheet 2 suppresses secondary electron emission on the dielectric surface. The synergistic effect of the two enables the structure to simulate the micro-discharge process of organic dielectric in waveguide devices and verify the suppression effect of the micro-trap structure on micro-discharge.

[0031] Example 2 This embodiment, based on Embodiment 1, further defines the layout, morphology, and compatibility of the ridge structure with the polymer dielectric sheets.

[0032] like Figure 2 As shown, the ridge structure inside the cavity of the single-ridge waveguide housing 1 is located in the middle of the cavity along the extension direction of the cavity. The ridge structure being located in the middle along the extension direction enables the electromagnetic field energy to form a symmetrical distribution in the middle region of the cavity, which is beneficial for forming a uniform and concentrated strong electric field at the sensitive gap 3, providing a stable electromagnetic environment for inducing the micro-discharge effect.

[0033] like Figure 3 As shown, the ridge structure is a stepped structure with multiple stepped surfaces of different heights along the extension direction of the cavity. The stepped structure is used to achieve impedance matching of the waveguide, enabling the device to have good transmission performance within a predetermined operating frequency band. Multiple stepped surfaces of different heights are connected sequentially to form a profile that gradually rises from the end of the waveguide towards the middle.

[0034] Multiple stepped surfaces of varying heights rise progressively from both ends towards the center along the extension direction of the cavity. A polymer dielectric sheet 2 is disposed on the bottom wall of the cavity, opposite the highest stepped surface. This progressively rising arrangement of the stepped surfaces from both ends towards the center causes the electromagnetic field energy to gradually concentrate in the middle, ultimately forming the strongest electric field distribution at the sensitive gap 3 between the highest stepped surface and the polymer dielectric sheet 2. The polymer dielectric sheet 2's placement on the bottom wall and its opposition to the highest stepped surface ensures that the sensitive gap 3 is located in the region of maximum electric field strength, while maintaining the uniformity and controllability of the gap width.

[0035] The polymer dielectric sheet 2 has a sheet-like structure. Its length along the cavity extension direction matches the length of the highest step surface, and its width matches the width of the cavity bottom wall. The length of the polymer dielectric sheet 2 matches the length of the highest step surface, ensuring that the dielectric sheet completely covers the bottom wall area directly opposite the highest step surface, thus ensuring a uniform electric field distribution in the extension direction of the sensitive gap 3. The width of the polymer dielectric sheet 2 matches the width of the cavity bottom wall, ensuring that the dielectric sheet is distributed transversely along the bottom wall of the cavity, thus avoiding unnecessary electric field distortion at the edges of the dielectric sheet.

[0036] In one specific embodiment of this invention, the single-ridge waveguide housing 1 has a width of 19.05 mm and a height of 9.525 mm, while the ridge structure has a width of 8.6 mm. The ridge structure is configured with seven impedance transformation sections, each with different step heights and lengths to achieve broadband impedance matching. The specific optimized dimensions of the PTFE and polyimide (PI) filled ridge waveguide impedance transformers are shown in Table 1. Sections 1 to 7 correspond to... Figure 2 There are seven steps from left to right in the middle, where L is the length of each step and h is the height of each step.

[0037] Table 1. Specific Optimized Dimensions of PTFE and PI-Filled Ridge Waveguide Impedance Converters

[0038] This embodiment achieves a precise spatial fit between the ridge structure, the polymer dielectric sheet, and the sensitive gap through a layout where the ridge structure extends along the center of the cavity, the morphology of multiple stepped surfaces, the gradual increase in the height of the stepped surfaces from both ends towards the center, the alignment of the polymer dielectric sheet with the highest stepped surface, and the matching of the polymer dielectric sheet size with the cavity bottom wall and the highest stepped surface. The stepped design of the ridge structure achieves impedance matching, optimizing the electrical performance of the device within the operating frequency band; the gradually increasing stepped surface layout concentrates the electric field energy at the sensitive gap at the highest stepped surface; and the size matching of the polymer dielectric sheet ensures the uniformity of the electric field in the sensitive gap region. The synergistic effect of these structural features enables this embodiment to provide a waveguide platform with controllable electric field distribution and excellent electrical performance for the verification of organic dielectric microdischarge.

[0039] Example 3 This embodiment, based on embodiment 1, further defines the placement of the microtrap structure and the distribution of the micropores.

[0040] like Figure 1 and Figure 6 As shown, the micro-trap structure 201 is located on the surface of the polymer dielectric sheet 2 facing the sensitive gap 3. The micro-trap structure 201 is positioned on the surface facing the sensitive gap 3, so that it directly faces the micro-discharge generation region. When electrons are accelerated and gain energy within the sensitive gap 3 by the microwave electric field, and then collide with the surface of the polymer dielectric sheet 2, the micro-trap structure 201 can immediately intervene in the generation and escape process of secondary electrons, thereby achieving a targeted suppression effect.

[0041] like Figure 6 As shown in (b), multiple discrete micropores are arrayed on the surface of the polymer dielectric sheet 2. This array distribution of micropores creates a regular and uniform micro-trap structure on the surface of the polymer dielectric sheet 2. When electrons are incident on the surface of the polymer dielectric sheet 2, the discrete micropores trap the electrons, increasing the probability of collisions within the micropores. This allows the electron energy to dissipate through multiple collisions, thereby reducing the probability of secondary electrons escaping from the surface. The regularity of the array distribution ensures that the micro-trap structure 201 has a consistent suppression effect throughout the entire sensitive gap 3 region.

[0042] In a preferred embodiment of this invention, the microtrap structure 201 is fabricated on the surface of the polymer dielectric sheet 2 using femtosecond laser processing technology. Femtosecond lasers have extremely short pulse widths and extremely high peak power, resulting in a very short interaction time with the material and a very small heat-affected zone, falling under the category of "cold processing."

[0043] In one specific example, a femtosecond laser is used to etch a circular hole with a radius of 80 μm, centered at the unit, within each 200 μm × 200 μm etching unit, forming a periodic array of circular holes. These processing parameters enable the microholes to form a uniform coverage on the surface of the polymer dielectric sheet 2, and the spacing between adjacent microholes matches the microhole size, creating an effective electron trapping region.

[0044] In this embodiment, the micro-trap structure 201 is disposed on the surface of the polymer dielectric sheet 2 facing the sensitive gap 3, allowing the micro-trap structure 201 to directly act on the micro-discharge generation region. A uniform electron-trapping network is formed on the dielectric surface by distributing multiple discrete micropores in an array. A regular microporous structure is obtained on the thermosensitive organic polymer material using femtosecond laser processing technology. The synergistic effect of these features enables the micro-trap structure 201 to effectively trap secondary electrons, increase the electron collision probability, and reduce the secondary electron emission coefficient, thereby providing a reliable technical means to suppress the micro-discharge effect of organic dielectrics in waveguide devices.

[0045] Example 4 This embodiment, based on Embodiment 1, further defines the width of the sensitive gap, the method for determining the thickness of the polymer dielectric sheet, and the material selection.

[0046] like Figure 1 As shown, the width of the sensitive gap 3 is less than 1 mm. As a region where the microwave electric field is concentrated, the width of the sensitive gap 3 directly affects the magnitude of the electric field strength and the triggering conditions for the micro-discharge effect. A narrow gap allows for a higher electric field strength when the same microwave power is input, making micro-discharge easier to occur. This enables effective verification of the micro-discharge characteristics of the polymer dielectric sheet 2 under lower power conditions. The limitation of the sensitive gap 3 to a width of less than 1 mm covers the sub-millimeter gap range, providing adaptability for simulating actual gap sizes in microwave devices at different frequency bands.

[0047] In a preferred embodiment of this invention, the width of the sensitive gap 3 is 0.2 mm. Through electromagnetic simulation software modeling and analysis, it was found that at an input power of 1 W, the peak electric field strength within the 0.2 mm sensitive gap can reach 15532 V / m. Figure 5 As shown, the electric field strength is much higher than in other areas within the device, ensuring that sensitive gap 3 becomes a sensitive region where micro-discharge preferentially occurs, facilitating experimental observation and threshold measurement.

[0048] The thickness of the polymer dielectric sheet 2 is determined through simulation based on the width of the sensitive gap 3. A matching relationship exists between the thickness of the polymer dielectric sheet 2 and the width of the sensitive gap 3, which together determine the impedance characteristics and electric field distribution of the device within a predetermined operating frequency band. Full-wave electromagnetic simulation of the device is performed using electromagnetic simulation software (such as the CST Studio Suite), with the width of the sensitive gap 3 as the input parameter. The thickness of the polymer dielectric sheet 2 is optimized to achieve optimal electrical performance (such as minimum insertion loss and optimal return loss), determining a thickness value that matches the specific sensitive gap width. This simulation-based determination method ensures an optimized match between the thickness of the polymer dielectric sheet 2 and the width of the sensitive gap 3, guaranteeing that while the device exhibits good microwave transmission performance, a sufficiently strong electric field can be generated in the sensitive gap 3 region to induce micro-discharges.

[0049] In a specific example, when the width of the sensitive gap 3 is 0.2 mm, the optimal thickness of the polytetrafluoroethylene (PTFE) polymer dielectric sheet 2 was determined to be 1.5 mm through simulation optimization. The simulated S-parameter results of the device at the 11.85 GHz operating frequency are as follows: Figure 4 As shown, S21 is -0.002dB and S11 is less than -20dB, indicating that the signal loss from the input port to the output port is minimal, the input port reflection is very small, and the device has good electrical performance. For the polyimide (PI) polymer dielectric sheet 2, with the same sensitive gap width (0.2mm), the optimal thickness value obtained through simulation optimization is also 1.5mm. At this time, S21 is -0.06dB and S11 is less than -20dB.

[0050] The polymer dielectric sheet 2 is made of polytetrafluoroethylene (PTFE) or polyimide. PTFE and polyimide are commonly used organic polymer materials in aerospace microwave devices, possessing advantages such as stable dielectric constant, small loss tangent, light weight, and radiation resistance, making them suitable as dielectric filling materials. The single-ridge waveguide housing 1 is made of metal. Metal materials have good conductivity, enabling the formation of the boundary conditions required for microwave transmission. Preferably, the single-ridge waveguide housing 1 can be made of aluminum through precision machining to ensure dimensional accuracy and surface finish. To further reduce conductor loss and ensure good electrical contact, the inner wall surface of the single-ridge waveguide housing 1 can be silver-plated.

[0051] This embodiment constructs a sub-millimeter-level micro-discharge sensitive region by limiting the width of the sensitive gap 3 to less than 1 mm. The thickness of the polymer dielectric sheet 2 is determined through simulation based on the width of the sensitive gap 3, achieving an optimized match between the dielectric sheet thickness and the gap width. This ensures the electrical performance of the device while concentrating the electric field in the sensitive gap region. By selecting polytetrafluoroethylene or polyimide as the material for the polymer dielectric sheet 2 and metal as the material for the single-ridge waveguide housing 1, the device is suitable for practical applications in aerospace microwave devices. The synergistic effect of these features enables this embodiment to provide a waveguide platform with controllable electric field strength, excellent electrical performance, and strong material applicability for organic dielectric micro-discharge verification.

[0052] Example 5 This embodiment uses secondary electron emission coefficient testing and micro-discharge simulation verification of a polymer dielectric sheet employing the structure of the present invention to demonstrate the suppression effect of the micro-trap structure on secondary electron emission and its role in raising the micro-discharge threshold.

[0053] Secondary electron emission coefficient test: Secondary electron emission coefficients were measured on untreated polytetrafluoroethylene (PTFE) polymer dielectric sheets and on PTFE polymer dielectric sheets with microporous arrays processed by femtosecond laser. The test results are as follows: Figure 7 As shown, the peak value δm of the secondary electron emission coefficient of the untreated polytetrafluoroethylene (PTFE) polymer dielectric sheet is 2.05. After microporous treatment, the peak value δm of the secondary electron emission coefficient of the PTFE polymer dielectric sheet decreases to 1.40, a reduction of 31.7%, and the first critical energy E P1 Increased from 41 eV to 96 eV.

[0054] Secondary electron emission coefficients were measured on untreated polyimide (PI) polymer dielectric sheets and polyimide (PI) polymer dielectric sheets with micropore arrays processed by femtosecond laser. The test results are as follows: Figure 7 As shown, the peak value δm of the secondary electron emission coefficient of the untreated polyimide (PI) polymer dielectric sheet is 1.37. After microporous treatment, the peak value δm of the secondary electron emission coefficient of the polyimide (PI) polymer dielectric sheet decreases to 1.07, a reduction of 21.9%, and the first critical energy E P1 Increased from 66 eV to 202 eV.

[0055] The test results above show that the micropore array processed by femtosecond laser can significantly reduce the secondary electron emission coefficient of polytetrafluoroethylene (PTFE) and polyimide (PI) materials. The micropore structure increases the surface roughness and effective surface area, making it easier for incident electrons to be captured and increasing the collision probability of secondary electrons during the escape process, thereby suppressing the secondary electron yield at the material level.

[0056] Micro-discharge threshold simulation: Micro-discharge threshold simulations of a single-ridge waveguide structure filled with a polytetrafluoroethylene (PTFE) polymer dielectric sheet were performed using electromagnetic simulation and particle simulation software. When the PTFE polymer dielectric sheet was not filled with micropores, the device's micro-discharge threshold was 7734 W. The evolution of the number of secondary electrons was as follows: Figure 8 As shown in (a), when the device is filled with a microporous polytetrafluoroethylene (PTFE) polymer dielectric sheet, the micro-discharge threshold increases to 12374W, an increase of 4640W (equivalent to 2.04dB). The evolution of the number of secondary electrons is as follows. Figure 9 As shown in (a).

[0057] Micro-discharge threshold simulations were performed on a single-ridge waveguide structure filled with a polyimide (PI) polymer dielectric sheet. When the polyimide (PI) polymer dielectric sheet without micropore treatment was filled, the device's micro-discharge threshold was 7265 W. The evolution of the number of secondary electrons is as follows: Figure 8 As shown in (b), when the device is filled with a microporous polyimide (PI) polymer dielectric sheet, the micro-discharge threshold increases to 12109 W, an increase of 4844 W (equivalent to 2.22 dB). The evolution of the number of secondary electrons is as follows. Figure 9 As shown in (b).

[0058] The simulation results show that the micro-discharge threshold of single-ridge waveguide devices filled with microporous polytetrafluoroethylene (PTFE) and polyimide (PI) is significantly improved. The micro-trap structure effectively suppresses the micro-discharge effect by reducing the secondary electron emission coefficient on the dielectric surface, thus significantly improving the power capacity of the device.

[0059] This embodiment verifies the suppression effect of the micro-trap structure in the present invention on micro-discharge in organic media through secondary electron emission coefficient testing and micro-discharge threshold simulation. The micro-trap structure formed by the micropore array reduces the secondary electron emission coefficient at the material level and increases the micro-discharge threshold at the device level. The two aspects corroborate each other, proving that the structure of the present invention can provide an effective verification platform for the study of micro-discharge suppression in organic media.

[0060] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. A polymer-filled single-ridge waveguide structure for dielectric microdischarge verification, characterized in that, include: A single-ridge waveguide housing (1) has a cavity inside, and a raised ridge structure is provided inside the cavity; A polymer dielectric sheet (2) is disposed in the cavity and a sensitive gap (3) is formed between it and the ridge structure; The surface of the polymer medium sheet (2) is provided with a microtrap structure (201), which includes a plurality of discrete micropores.

2. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 1, characterized in that, The ridge structure is located in the middle of the cavity along the extension direction of the cavity.

3. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 2, characterized in that, The ridge structure is a stepped structure with multiple steps of different heights along the extension direction of the cavity.

4. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 3, characterized in that, The multiple stepped surfaces of different heights gradually increase from both ends to the middle along the extension direction of the cavity; the polymer medium sheet (2) is disposed on the bottom wall of the cavity and is opposite to the stepped surface at the highest position.

5. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 4, characterized in that, The polymer medium sheet (2) has a sheet-like structure. The length of the polymer medium sheet (2) along the extension direction of the cavity matches the length of the step surface at the highest position, and the width matches the width of the bottom wall of the cavity.

6. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 1, characterized in that, The microtrap structure (201) is located on the surface of the polymer medium sheet (2) facing the sensitive gap (3).

7. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 6, characterized in that, The discrete micropores are arrayed on the surface of the polymer medium sheet (2).

8. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 1, characterized in that, The width of the sensitive gap (3) is less than 1 mm.

9. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 1, characterized in that, The thickness of the polymer dielectric sheet (2) is determined by simulation based on the width of the sensitive gap (3).

10. The polymer-filled single-ridge waveguide structure for dielectric microdischarge verification according to claim 1, characterized in that, The polymer dielectric sheet (2) is made of polytetrafluoroethylene or polyimide; the single-ridge waveguide housing (1) is made of metal.

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