An integrated NV color center probe rapid testing system and method

Abstract

The application provides an integrated NV color center probe rapid test system and method, and belongs to the technical field of NV color centers. The system comprises: a host computer for receiving user input test parameters and sending control instructions according to the test parameters; a timing control module for generating timing control signals according to the control instructions and outputting the timing control signals to a laser module and a microwave module; the laser module provides laser pumping to the probe according to the timing control signals; the microwave module generates a swept microwave signal according to the timing control signals; a phase-locked demodulation module receives fluorescence electrical signals of the probe; the host computer processes sampling data to generate an optical detection magnetic resonance (ODMR) spectrum line, calculates a to-be-measured external electric field or magnetic field strength according to a spectrum line center frequency change amount, and outputs a test result. The system can realize unified control of test parameters, timing synchronous driving, rapid signal acquisition, and automatic output of results, and improves test efficiency, stability, and automation level.

Description

Technical Field

[0001] This invention belongs to the field of NV color center technology, and in particular relates to an integrated NV color center probe rapid testing system and method. Background Technology

[0002] Diamond nitrogen-vacancy center (NV center) probes are a type of quantum sensor for measuring physical quantities such as electric and magnetic fields, and have application value in power detection, extreme environment monitoring, and high-insulation scenarios. Related testing systems are typically used to perform laser excitation, microwave driving, signal demodulation, data acquisition, and result analysis to evaluate the probe's sensitivity, stability, and repeatability. Optically detected magnetic resonance (ODMR) spectral lines are often used as an important basis for probe performance analysis.

[0003] In practical applications, such testing typically involves multiple stages, including optical path adjustment, microwave parameter setting, timing triggering, signal acquisition, and result interpretation. The testing process is lengthy and highly sensitive to timing accuracy, signal stability, and consistency in repeated testing. When the testing process relies heavily on manual intervention, issues such as inconsistent parameter adjustment rhythms, fluctuating test results, and insufficient consistency in repeated testing can easily arise, thus affecting the assessment of the probe's true performance.

[0004] Current testing methods are still primarily based on step-by-step operations and manual intervention, often requiring multiple manual interventions for parameter adjustments, status confirmation, and result judgment during the testing process. In continuous or multi-round testing scenarios, this can easily lead to insufficient continuity in the testing process, unstable repeatability, and significant dispersion in results. Furthermore, changes in status during the testing process typically lack continuous and intuitive tracking methods; related anomalies often only become apparent after the test is completed and data is reviewed. This not only increases testing time costs but also hinders timely assessment of probe performance changes during the testing process. Summary of the Invention

[0005] The purpose of this invention is to provide an integrated NV color center probe rapid testing system and method, which can realize unified control of test parameters, time-synchronized driving, rapid signal acquisition and automatic output of results, and improve test efficiency, stability and automation level.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: In a first aspect, the present invention provides an integrated NV color center probe rapid testing system, comprising: a laser module, a microwave module, a timing control module, a phase-locked demodulation module, a data acquisition card, and a host computer; The host computer is communicatively connected to the timing control module, the laser module, the microwave module, and the data acquisition card, and is used to receive test parameters input by the user and send control commands to the laser module, the microwave module, and the timing control module according to the test parameters. The timing control module is used to generate a TTL timing control signal with a preset delay and pulse width according to the control command, and output the TTL timing control signal to the laser module and the microwave module respectively, so as to control the laser module and the microwave module to work together according to the preset timing. The laser module is used to provide laser pumping to the NV color center probe according to the TTL timing control signal; The microwave module is used to generate a swept microwave signal according to the TTL timing control signal and apply it to the NV color center probe to manipulate the spin state of the NV color center. The phase-locked demodulation module is used to receive the fluorescence electrical signal generated by the NV color center probe under the action of the laser pump and microwave signal, and to perform phase-locked demodulation on the fluorescence electrical signal to obtain a demodulated signal; The data acquisition card is used to acquire the demodulated signal and generate sampling data, and send the sampling data to the host computer. The host computer receives the sampling data acquired by the data acquisition card and processes the sampling data to generate optically detected magnetic resonance (ODMR) spectral lines, and calculates the external electric or magnetic field strength to be measured based on the change in the center frequency of the spectral lines and outputs the test results.

[0007] Furthermore, the host computer includes: The interface configuration module is used to provide a test parameter input interface and display the connection status and parameter setting information of each device in the test system; The control command generation module is used to generate control commands based on the test parameters, and send the laser control command to the laser module, the microwave control command to the microwave module, and the timing control command to the timing manipulation module. The test control module is used to obtain test task information input by the user and execute the corresponding test task according to the test task information; The data processing module is used to synchronously record the fluorescence signal intensity corresponding to different microwave frequencies during the microwave frequency sweep process, and to generate optically detected magnetic resonance (ODMR) spectral lines based on the microwave frequency and fluorescence signal intensity data. The module also calculates the change in the center frequency of the ODMR spectral lines to obtain the intensity of the external electric or magnetic field to be measured. The results display module is used to display test results through an interactive interface; The data storage module is used to store the data collected during the test according to the timestamp, and supports data query, export and visualization.

[0008] Furthermore, the test control module includes: The main thread unit is used to obtain test task information input by the user and call the corresponding thread unit to execute the test task according to the test task information. The test task includes parameter optimization test task and state detection test task. The parameter optimization thread unit is used to execute the parameter optimization test task: receiving the parameters to be optimized, forming multiple sets of test parameter combinations based on the parameters to be optimized, and sending corresponding control commands to the laser module, microwave module, and timing control module according to each set of test parameter combinations; after receiving the sampled data, calculating the evaluation index corresponding to the current parameter combination based on the sampled data, and outputting the optimal parameter combination after comparing the evaluation indexes corresponding to multiple sets of parameter combinations, wherein the evaluation index includes at least one of sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters; The state detection thread unit is used to execute the state detection test task: receive the current working parameters, and control the laser module, microwave module and timing control module to perform tests according to the current working parameters, continuously receive sampling data at different time points; after receiving the sampling data at different time points, monitor the electrical parameter status of the NV color center probe, continuously test the probe sensitivity, and calculate long-term stability related parameters.

[0009] Furthermore, the laser module includes: a solid-state laser with an output wavelength of 532 nm and an optical attenuator, wherein the optical attenuator is used to adjust the laser power output by the solid-state laser to the NV color center probe; The microwave module includes a vector microwave signal source and a microwave power amplifier. The vector microwave signal source is used to generate microwave signals with a frequency range of 2.6 GHz to 3.1 GHz, and the microwave power amplifier is used to amplify the microwave signals and output them to the NV color center probe.

[0010] Furthermore, the phase-locked demodulation module is further configured to receive the fluorescence electrical signal from the NV color center probe and the reference signal from the timing control module, respectively, perform phase-locked demodulation on the fluorescence electrical signal based on the reference signal, extract the fluorescence signal component amplitude at the modulation frequency corresponding to the reference signal, and output the fluorescence signal component amplitude as the demodulated signal. The timing control module is used to generate at least two TTL timing control signals with preset delay and pulse width according to the control instructions sent by the host computer. One TTL timing control signal is output to the laser module to control the laser pulse modulation, and the other TTL timing control signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal.

[0011] In a second aspect, the present invention provides a rapid testing method for an integrated NV color center probe. The method is applied to a rapid testing system for an integrated NV color center probe, the testing system comprising: a laser module, a microwave module, a timing control module, a phase-locked demodulation module, a data acquisition card, and a host computer. The method includes: The host computer receives the test parameters input by the user and sends control commands to the laser module, microwave module and timing control module according to the test parameters; The timing control module generates a TTL timing control signal with a preset delay and pulse width according to the control command, and outputs the TTL timing control signal to the laser module and the microwave module respectively, so as to control the laser module and the microwave module to work together in accordance with the preset timing. The laser module provides laser pumping to the NV color center probe according to the TTL timing control signal; The microwave module generates a swept microwave signal according to the TTL timing control signal and applies it to the NV color center probe to manipulate the spin state of the NV color center; The phase-locked demodulation module receives the fluorescence electrical signal generated by the NV color center probe under the action of the laser pump and microwave signal, and performs phase-locked demodulation on the fluorescence electrical signal to obtain a demodulated signal; The data acquisition card acquires the demodulated signal and generates sampling data, and sends the sampling data to the host computer; The host computer receives the sampling data collected by the data acquisition card and processes the sampling data to generate optically detected magnetic resonance (ODMR) spectral lines. It then calculates the intensity of the external electric or magnetic field to be measured based on the change in the center frequency of the spectral lines and outputs the test results.

[0012] Furthermore, the host computer includes: an interface configuration module, a control command generation module, a test control module, a data processing module, a result display module, and a data storage module; the method further includes: The interface configuration module provides a test parameter input interface and displays the connection status and parameter settings of each device in the test system; The control command generation module generates control commands based on the test parameters and sends the laser control command to the laser module, the microwave control command to the microwave module, and the timing control command to the timing manipulation module. The test control module obtains the test task information input by the user and executes the corresponding test task according to the test task information; During the microwave frequency sweep, the data processing module synchronously records the fluorescence signal intensity corresponding to different microwave frequencies, and generates optically detected magnetic resonance (ODMR) spectral lines based on the microwave frequency and fluorescence signal intensity data. The module also calculates the change in the center frequency of the ODMR spectral lines to obtain the intensity of the external electric or magnetic field to be measured. The results display module displays test results through an interactive interface; The data storage module stores the data collected during the test according to the timestamp, and supports data query, export and visualization.

[0013] Furthermore, the test control module includes: a main thread unit, a parameter optimization thread unit, and a state detection thread unit. The test control module acquires test task information input by the user and executes corresponding test tasks according to the test task information, including: The main thread unit obtains the test task information input by the user, and calls the corresponding thread unit to execute the test task according to the test task information. The test task includes parameter optimization test task and state detection test task. The parameter optimization thread unit executes the parameter optimization test task: it receives the parameters to be optimized, forms multiple sets of test parameter combinations based on the parameters to be optimized, and sends corresponding control commands to the laser module, microwave module and timing control module according to each set of test parameter combinations. After receiving the sampled data, the parameter optimization thread unit calculates the evaluation index corresponding to the current parameter combination based on the sampled data, and outputs the optimal parameter combination after comparing the evaluation indexes corresponding to multiple parameter combinations. The evaluation index includes at least one of sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters. The state detection thread unit executes the state detection test task: it receives the current working parameters and controls the laser module, microwave module and timing control module to perform the test according to the current working parameters, and continuously receives sampling data at different time points; After receiving the sampling data at different time points, the status detection thread unit monitors the electrical parameter status of the NV color center probe, continuously tests the probe sensitivity, and calculates long-term stability-related parameters.

[0014] Furthermore, the laser module includes a solid-state laser with an output wavelength of 532 nm and an optical attenuator; the microwave module includes a vector microwave signal source and a microwave power amplifier; and the method further includes: The laser module adjusts the laser power output from the solid-state laser to the NV color center probe via the optical attenuator; The microwave module generates microwave signals with a frequency range of 2.6 GHz to 3.1 GHz through the vector microwave signal source, and the microwave power amplifier amplifies the microwave signals and outputs them to the NV color center probe.

[0015] Furthermore, the integrated NV color center probe rapid testing method also includes: The phase-locked demodulation module receives the fluorescence electrical signal from the NV color center probe and the reference signal from the timing control module, respectively. Based on the reference signal, it performs phase-locked demodulation on the fluorescence electrical signal to extract the fluorescence signal component amplitude at the modulation frequency corresponding to the reference signal, and outputs the fluorescence signal component amplitude as the demodulated signal. The timing control module generates at least two TTL timing control signals with preset delays and pulse widths according to the control instructions sent by the host computer. One TTL timing control signal is output to the laser module to control laser pulse modulation, and the other TTL timing control signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal.

[0016] 1. This invention integrates a laser module, a microwave module, a timing control module, a phase-locked demodulation module, a data acquisition card, and a host computer. The host computer uniformly receives test parameters, issues control commands, processes sampled data, and generates ODMR spectra. This achieves unified coordination of laser pumping, microwave control, timing synchronization, signal demodulation, and result output, reducing manual intervention, improving test efficiency and repeatability, and enhancing the measurement accuracy of the external electric or magnetic field strength.

[0017] 2. This invention sets up an interface configuration module, a control command generation module, a test control module, a data processing module, a result display module, and a data storage module in the host computer. Furthermore, it realizes test task scheduling, parameter optimization testing, and status detection testing through a main thread unit, a parameter optimization thread unit, and a status detection thread unit. This enables integrated management of test parameter configuration, result display, and data storage while ensuring the continuity of the test process. It can also output the optimal parameter combination, continuously monitor the probe's electrical parameter status and sensitivity changes, and improve the system's automation level and long-term testing capability.

[0018] 3. This invention configures the laser module to include a solid-state laser with an output wavelength of 532 nm and an optical attenuator, and the microwave module to include a vector microwave signal source and a microwave power amplifier. The invention also uses a phase-locked demodulation module to receive fluorescence electrical signals and reference signals for phase-locked demodulation. Simultaneously, a timing control module generates at least two TTL timing control signals to control the laser pulse modulation and microwave pulse switching and frequency switching, thereby achieving precise coordination of laser power, microwave signals and timing control. This improves the quality of fluorescence signal extraction and ODMR spectral acquisition, and enhances the stability and reliability of the system for rapid testing of NV color center probes. Attached Figure Description

[0019] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings: Figure 1 This is a schematic diagram of the integrated NV color center probe rapid testing system according to an embodiment of the present invention; Figure 2 This is a schematic diagram illustrating the implementation of the integrated NV color center probe rapid testing system according to an embodiment of the present invention; Figure 3 This is a schematic diagram of the laser module according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the timing control module according to an embodiment of the present invention; Figure 5 This is a schematic diagram of phase-locked demodulation according to an embodiment of the present invention; Figure 6 This is a flowchart of the integrated NV color center probe rapid testing system according to an embodiment of the present invention; Figure 7 This is a flowchart illustrating the implementation of the integrated NV color center probe rapid testing system according to an embodiment of the present invention. Detailed Implementation

[0020] The present invention will now be described in detail with reference to the accompanying drawings and embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other.

[0021] The following detailed description is exemplary and intended to provide further detailed explanation of the invention. Unless otherwise specified, all technical terms used in this invention have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains. The terminology used in this invention is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention.

[0022] Example 1 like Figures 1 to 2As shown, this embodiment provides an integrated NV color center probe rapid testing system. The system includes a laser module, a microwave module, a timing control module, a phase-locked loop demodulation module, a data acquisition card, and a host computer. The host computer is communicatively connected to the timing control module, laser module, microwave module, and data acquisition card, respectively, and is used to receive test parameters input by the user and send control commands to the laser module, microwave module, and timing control module according to the test parameters. The timing control module generates TTL timing control signals with preset delays and pulse widths according to the control commands, and outputs the TTL timing control signals to the laser module and microwave module respectively, so as to control the laser module and microwave module to work together according to the preset timing sequence.

[0023] The laser module provides laser pumping to the NV center probe according to the TTL timing control signal. The microwave module generates a swept microwave signal according to the TTL timing control signal and applies it to the NV center probe to manipulate the NV center spin state. The phase-locked demodulation module receives the fluorescence signal generated by the NV center probe under the action of laser pumping and microwave signals, and performs phase-locked demodulation on the fluorescence signal to obtain the demodulated signal. The data acquisition card acquires the demodulated signal and generates sampling data, and sends the sampling data to the host computer. The host computer receives the sampling data acquired by the data acquisition card, processes the sampling data to generate optically detected magnetic resonance (ODMR) spectral lines, calculates the external electric or magnetic field strength to be measured based on the change in the center frequency of the spectral lines, and outputs the test results.

[0024] In this embodiment, the NV center probe is the core sensing unit of the system, integrating an NV center sensing element, a micro-optical system, and an integrated photodetector. The NV center sensing element can be a diamond single crystal rich in NV centers or a high-quality thin film, used to sensitively respond to external electric or magnetic field information. The micro-optical system includes a microlens group for collimating the excitation laser and collecting fluorescence. The integrated photodetector can be a silicon photodiode positioned close to the optical path, used to convert fluorescence into an electrical signal output in real time. The probe receives laser pump from the laser module and swept microwave signals from the microwave module through the optical path. Under the combined action of laser pumping and microwave manipulation, it outputs a fluorescence electrical signal to the phase-locked demodulation module, thus forming a complete test link. With the above structural setup, integrated testing from optical pumping, microwave excitation, timing-coordinated control, phase-locked demodulation, data acquisition to result output can be achieved.

[0025] In this embodiment, the host computer includes an interface configuration module, a control command generation module, a test control module, a data processing module, a result display module, and a data storage module. The interface configuration module provides a test parameter input interface and displays the connection status and parameter settings of each device in the test system. Users can input test parameters in the interface configuration module and view and modify parameter settings during system operation. The control command generation module generates control commands based on the test parameters and sends control commands related to laser control to the laser module, control commands related to microwave control to the microwave module, and control commands related to timing control to the timing control module. The data processing module synchronously records the fluorescence signal intensity corresponding to different microwave frequencies during microwave frequency sweeping, and generates optically detected magnetic resonance (ODMR) spectra based on the microwave frequency and fluorescence signal intensity data. It then calculates the change in the center frequency of the ODMR spectra to obtain the intensity of the external electric or magnetic field to be measured. The result display module displays the test results through an interactive interface. The data storage module stores the data collected during the test according to timestamps and supports data querying, exporting, and visualization. Therefore, the host computer not only undertakes the functions of parameter input, control command generation, and data processing, but also the functions of result display and data storage, thus forming a complete software control and data management platform. During the test operation, the data storage module can dynamically record the data collected at different time points and classify and store it according to timestamps to support subsequent real-time querying, exporting, and visualization of the test data.

[0026] In this embodiment, the host computer uses a unified control platform to coordinate the control of the laser module, microwave module, timing control module, phase-locked demodulation module, and data acquisition card, thereby achieving full automation from test initiation to result output. Specifically, the host computer completes test parameter configuration, control command generation, test task scheduling, sampled data processing, and result display and data storage according to preset test requirements. This enables the laser parameters, microwave parameters, and timing parameters to be coordinated and adjusted under a unified software platform, reducing errors caused by human intervention and improving test efficiency.

[0027] In this embodiment, the host computer can typically be implemented by an industrial computer with dedicated control software installed. This software is responsible for sending control parameters, such as sequence waveforms and microwave frequencies, to the timing control module and microwave module, and for reading data from the phase-locked demodulation module from a high-speed data acquisition card. The software integrates data processing algorithms that can automatically fit ODMR spectra by scanning microwave frequencies and simultaneously recording fluorescence intensity, and calculate the shift in the spectral center frequency caused by external electric or magnetic fields. Ultimately, it directly displays and records the intensity and direction of the measured physical field. The software employs a multi-layered UI structure and uses multi-threading for thread control to prevent UI crashes during software operation. It can simultaneously control laser power, microwave parameters, and timing, as well as store test data.

[0028] Dedicated control software can implement collaborative control logic between modules based on advanced data structures and object-oriented software organization methods to support rapid iteration and functional expansion of the testing process. In actual operation, the software organizes test parameter configuration, control command issuance, sampling data reading, spectral line fitting, result display, and data storage under a unified software architecture, thereby improving the system's software adaptability and scalability.

[0029] Furthermore, the test control module includes a main thread unit, a parameter optimization thread unit, and a status detection thread unit. The main thread unit acquires user-inputted test task information and calls the corresponding thread unit to execute the test task based on this information. The test tasks include parameter optimization test tasks and status detection test tasks. The parameter optimization thread unit executes the parameter optimization test task: it receives the parameters to be optimized, forms multiple sets of test parameter combinations based on these parameters, and sends corresponding control commands to the laser module, microwave module, and timing control module according to each set of test parameter combinations. After receiving sampled data, it calculates the evaluation index corresponding to the current parameter combination based on the sampled data, and outputs the optimal parameter combination after comparing the evaluation indices corresponding to multiple sets of parameter combinations. The evaluation indices include at least one of sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters. The status detection thread unit is used to execute status detection test tasks: it receives current operating parameters and controls the laser module, microwave module, and timing control module to perform tests based on these parameters, continuously receiving sampling data at different time points; after receiving the sampling data at different time points, it monitors the electrical parameter status of the NV color center probe, continuously tests the probe sensitivity, and calculates long-term stability-related parameters. Through the above test control module settings, the main thread unit is responsible for test task scheduling, the parameter optimization thread unit is responsible for parameter optimization, and the status detection thread unit is responsible for status detection, thereby ensuring that different test tasks are executed in an orderly manner under a unified software architecture.

[0030] The parameter optimization thread unit can adaptively match and adjust optical power, microwave parameters, and timing parameters. Under the condition of meeting the preset test requirements, the parameter optimization thread unit forms multiple sets of test parameters by changing optical power, microwave parameters, timing, etc., and compares different parameter combinations according to the evaluation index corresponding to the sampled data to output the optimal parameter combination, thereby realizing the coordinated optimization of laser parameters and microwave parameters.

[0031] like Figure 3 As shown, the laser module includes a solid-state laser with an output wavelength of 532 nm and an optical attenuator. The optical attenuator is used to adjust the laser power output from the solid-state laser to the NV color center probe. In this embodiment, the laser module may further include a temperature control device, an optical pump source, an optical isolator, and an optical fiber interface. The temperature control device is used to ensure the temperature stability of the laser during operation, thereby improving the long-term stability of the output wavelength and output power. In specific implementations, the solid-state laser can be installed in a metal housing with a temperature control device to ensure the long-term stability of the output optical power and wavelength. The optical isolator is used to suppress the influence of back-reflected light on the laser; the adjustable optical attenuator is used to finely adjust the output laser power; the optical fiber interface is used to couple the processed laser signal to the NV color center probe. The module is connected to subsequent modules through optical fiber jumpers, thereby providing a clean and stable continuous light or externally modulated pulsed light output. After receiving the TTL timing control signal from the timing control module, the laser module can output continuous laser or pulsed laser according to a predetermined pulse width and delay, thereby providing a stable and adjustable laser pump to the NV color center probe.

[0032] like Figure 4 As shown, in this embodiment, the timing control module can be implemented using a pulse sequence generator. The timing control module generates at least two TTL timing control signals with preset delays and pulse widths based on control commands sent from the host computer. One TTL timing control signal is output to the laser module to control laser pulse modulation, and the other TTL timing control signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal. Through the coordinated output of the above at least two TTL timing control signals, the laser module and microwave module can operate according to a preset timing sequence, and can support the execution of test sequences such as composite quantum manipulation sequences, optical detection magnetic resonance, Rabi oscillation, and Hahn echo. After the host computer sends control requests to the pulse sequence generator, one channel controls the laser module to drive the acousto-optic modulator to achieve a laser pulse response, and the other channel controls the pulse switching of the microwave module to generate controlled microwave signals, thereby completing the timing control of the entire system. Through programming, the timing control module can flexibly implement complex quantum manipulation sequences, optical detection magnetic resonance, Rabi oscillation, and Hahn echo test sequences.

[0033] In this embodiment, the microwave module includes a vector microwave signal source and a microwave power amplifier. The vector microwave signal source generates microwave signals with a frequency range of 2.6 GHz to 3.1 GHz, and the microwave power amplifier amplifies the microwave signals before outputting them to the NV color center probe. Specifically, the module output is connected to the microwave power amplifier to amplify the microwave signal power to a level sufficient to drive the antenna. The amplified microwave signal can be transmitted via an SMA coaxial cable to a miniature coplanar waveguide antenna or loop antenna located adjacent to the NV color center probe to generate a high-efficiency microwave field at the probe. Specifically, the vector microwave signal source generates a swept-frequency microwave signal based on test parameters issued by the host computer, and performs pulse switching and frequency switching under the control of the TTL timing control signal output by the timing control module. The microwave signal amplified by the microwave power amplifier is output to a microwave excitation structure located near the NV color center probe to form a microwave field at the probe for manipulating the spin state of the NV color center. Through the above settings, the microwave module can achieve timing synchronization with the laser module and cooperate with the data processing module to complete ODMR spectral line measurements during the frequency sweep process.

[0034] In this embodiment, as Figure 5 As shown, the phase-locked demodulation module further receives the fluorescence electrical signal from the NV color center probe and the reference signal from the timing control module, respectively. Based on the reference signal, it performs phase-locked demodulation on the fluorescence electrical signal to extract the amplitude of the fluorescence signal component at the modulation frequency corresponding to the reference signal, and outputs the amplitude of the fluorescence signal component as the demodulated signal. Specifically, after the NV color center probe outputs a fluorescence electrical signal under the action of laser pumping and microwave signals, the phase-locked demodulation module simultaneously introduces the reference signal output by the timing control module. Through phase-locked demodulation, it extracts the amplitude of the effective fluorescence signal component at the corresponding modulation frequency, thereby improving the signal-to-noise ratio of weak fluorescence signal detection. In a specific implementation, the phase-locked demodulation module can use a lock-in amplifier or a custom demodulation board based on digital signal processing. The reference signal can be used as a reference frequency source input to the phase-locked demodulation module. Through relevant detection techniques, in addition to obtaining sharp ODMR resonance lines, the amplitudes of pulse sequences such as spin echoes can also be demodulated. The demodulated signal is acquired by the data acquisition card and sent to the host computer for the data processing module to perform ODMR spectral line fitting and calculate the change in the center frequency of the spectral line.

[0035] The system operation process in this embodiment is as follows: First, the interface configuration module provides a test parameter input interface and displays the connection status and parameter setting information of each device. After the user completes the input of test parameters and test task information, the control command generation module and the test control module respectively complete the generation of control commands and the scheduling of test tasks. Subsequently, the host computer sends control commands to the laser module, microwave module, and timing control module according to the test parameters. The timing control module generates a TTL timing control signal with a preset delay and pulse width, controlling the laser module to output laser pump and controlling the microwave module to output a swept-frequency microwave signal.

[0036] The NV color center probe outputs a fluorescent electrical signal under the combined action of light and microwave. The phase-locked demodulation module performs phase-locked demodulation based on the reference signal. The data acquisition card completes the acquisition of the demodulated signal and generates sampling data. After the sampling data is sent to the host computer, the data processing module synchronously records the fluorescence signal intensity corresponding to different microwave frequencies during the microwave frequency sweep process and fits and generates optically detected magnetic resonance (ODMR) spectral lines. Furthermore, the change in the center frequency of the ODMR spectral lines is calculated based on the ODMR spectral lines to obtain the intensity of the external electric or magnetic field to be measured. Finally, the result display module displays the test results, and the data storage module stores, queries, exports, and visualizes the data collected during the test according to the timestamp.

[0037] When a user selects a parameter optimization test task in the test control module, the main thread unit calls the parameter optimization thread unit to execute the corresponding test; when a user selects a status detection test task, the main thread unit calls the status detection thread unit to execute the corresponding test.

[0038] When performing parameter optimization testing, the parameter optimization thread unit generates multiple sets of test parameter combinations based on the parameters to be optimized. By comparing the sensitivity, demodulated signal amplitude, ODMR spectral line related parameters, and / or noise amplitude spectral density related parameters under different parameter combinations, it outputs the optimal parameter combination. Specifically, the parameter optimization thread unit can change optical power, microwave parameters, timing, etc., during execution to calculate the optimal sensitivity.

[0039] During the execution of the state detection test task, the state detection thread unit receives the current operating parameters and, based on continuously receiving sampled data at different time points, monitors the electrical parameter status refresh of the NV color center probe, continuously tests the probe sensitivity, and calculates long-term stability-related parameters. Through the above structure and working process, this embodiment realizes automated testing, parameter optimization, state detection, data processing, and result output of the integrated NV color center probe rapid testing system.

[0040] The integrated NV color center probe rapid testing system provided by this invention integrates a laser module, microwave module, timing control module, phase-locked demodulation module, data acquisition card, and host computer. The host computer uniformly completes test parameter configuration, control command issuance, test task scheduling, sampling data processing, result display, and data storage, forming a continuous closed loop of laser pumping, microwave driving, timing synchronization, phase-locked demodulation, and ODMR spectral line generation. This effectively reduces the reliance on manual adjustment, step-by-step operation, and offline analysis in traditional testing processes, improving the automation and repeatability of the testing process. Simultaneously, through the cooperation of the main thread unit, parameter optimization thread unit, and status detection thread unit, it can not only optimize optical power, microwave parameters, and timing and output the optimal parameter combination, but also continuously test and dynamically track the electrical parameter status, sensitivity changes, and long-term stability of the NV color center probe. This improves testing efficiency, shortens the single-probe testing cycle, reduces the impact of human error on test results, and enhances the ability to detect abnormal probe states and performance changes, providing accurate, efficient, and stable testing support for the reliability research of NV color center probes.

[0041] Example 2 like Figure 6 and Figure 7 As shown, based on the same inventive concept as the above embodiments, the present invention also provides a rapid testing method for an integrated NV color center probe. The method includes steps S1 to S7. The method is applied to the rapid testing system for the integrated NV color center probe provided in Embodiment 1. The testing system includes: a laser module, a microwave module, a timing control module, a phase-locked demodulation module, a data acquisition card, and a host computer. The host computer is communicatively connected to the timing control module, the laser module, the microwave module, and the data acquisition card.

[0042] In step S1, the host computer receives the test parameters input by the user and sends control commands to the laser module, microwave module, and timing control module according to the test parameters. In this embodiment, the host computer is the core of the system's control and data processing, typically implemented by an industrial computer with dedicated control software installed. The software considers using a multi-layered UI structure and multi-threading for thread control to prevent UI crashes during software operation. The software can simultaneously control laser power, microwave parameters, and timing, and store test data. The dedicated control software can adopt a hierarchical software organization to manage test parameters, generate control commands, process data, and output results, thereby supporting rapid iteration and expansion of the test program and improving the adaptability of different hardware modules working together. Further, the host computer includes: an interface configuration module, a control command generation module, a test control module, a data processing module, a result display module, and a data storage module. The interface configuration module provides a test parameter input interface and displays the connection status and parameter setting information of each device in the test system. The control command generation module generates control commands based on test parameters and sends laser control commands to the laser module, microwave control commands to the microwave module, and timing control commands to the timing manipulation module. The test control module obtains the test task information input by the user and executes the corresponding test task accordingly. The main thread primarily handles UI operations, specifically configuring laser power, microwave parameters, phase-locked filter parameters, and control timing. Before proceeding with subsequent tests, the main thread first checks the device connection status. If all devices are connected, the laser and microwave timing can be set and parameters written; otherwise, the program running window displays "Device connection failed." After parameter settings are complete, clicking "Start" initiates a sub-thread call to implement the test functionality.

[0043] The aforementioned unified control platform enables coordinated control of the laser module, microwave module, timing control module, phase-locked demodulation module, and data acquisition card, achieving full automation from test initiation to result output. During this process, laser parameters, microwave parameters, and timing parameters can be coordinated, configured, and controlled in tandem under a unified software platform, thereby improving the level of test automation and reducing human intervention errors.

[0044] In step S2, the timing control module generates TTL timing control signals with preset delays and pulse widths according to the control commands, and outputs the TTL timing control signals to the laser module and the microwave module respectively, so as to control the laser module and the microwave module to work together according to the preset timing sequence. Specifically, the timing control module can be implemented using a pulse sequence generator. After receiving the control parameters sent by the host computer, it generates two or more TTL digital signals with precise delay and pulse width control. One signal is output to the laser module to control its internal or external acousto-optic modulator to achieve laser pulse modulation, and the other signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal. Further, the timing control module generates at least two TTL timing control signals with preset delays and pulse widths according to the control commands sent by the host computer. One TTL timing control signal is output to the laser module to control laser pulse modulation, and the other TTL timing control signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal. Through programming, the timing manipulation module can flexibly realize complex quantum manipulation sequences such as optical detection magnetic resonance, Rabi oscillation, and Hahn echo, thereby providing a precise timing basis for subsequent testing.

[0045] In step S3, the laser module provides laser pumping to the NV color center probe according to the TTL timing control signal. The laser module includes a solid-state laser with an output wavelength of 532 nm and an optical attenuator. The laser module adjusts the laser power output from the solid-state laser to the NV color center probe through the optical attenuator. In specific implementation, the laser module serves as the optical pump source of the system, and its core is a solid-state laser with an output wavelength of 532 nm. The laser is installed in a metal housing with a temperature control device to ensure the long-term stability of the output optical power and wavelength. The module integrates an optical isolator to prevent back-reflected light from damaging the laser; it is also equipped with an adjustable optical attenuator to precisely control the laser power injected into the final fiber. The module is connected to subsequent modules through fiber optic patch cords to provide a clean, stable continuous light or externally modulated pulsed light output. The internal cavity of the NV color center probe integrates NV color center sensing elements, a micro-optical system, and an integrated photodetector. The micro-optical system includes a microlens group for collimating the excitation laser and collecting fluorescence, and the integrated photodetector can be a silicon photodiode placed close to the optical path. The probe is excited by light input through only a single-mode fiber. Therefore, in this step, the laser output from the laser module is input to the NV color center probe through a single-mode fiber to achieve stable laser pumping.

[0046] In step S4, the microwave module generates a swept-frequency microwave signal according to the TTL timing control signal and applies it to the NV color center probe to manipulate the NV color center spin state. The microwave module includes a vector microwave signal source and a microwave power amplifier. The microwave module generates a microwave signal with a frequency range of 2.6 GHz to 3.1 GHz through the vector microwave signal source, and the microwave power amplifier amplifies the microwave signal before outputting it to the NV color center probe. In specific implementation, the microwave module is responsible for generating a resonant microwave field for manipulating the NV color center spin state, using a vector microwave signal source as the core, with a frequency adjustment range covering 2.6 GHz to 3.1 GHz to cover the ground state energy level splitting of the NV color center. The module output is connected to a microwave power amplifier to amplify the signal power to a watt level sufficient to drive the antenna. The module transmits the microwave signal to a miniature coplanar waveguide antenna or loop antenna adjacent to the NV color center probe via an SMA coaxial cable to generate a high-efficiency microwave field at the probe. The probe outputs an electrical signal representing the sensing result through a coaxial shielded cable, thereby achieving a response to an external electric or magnetic field under the combined action of laser pumping and frequency sweeping microwave signals, while also ensuring electrical isolation between the high-voltage and low-voltage sides.

[0047] In step S5, the phase-locked demodulation module receives the fluorescence electrical signal generated by the NV color center probe under the action of laser pumping and microwave signals, and performs phase-locked demodulation on the fluorescence electrical signal to obtain a demodulated signal. The phase-locked demodulation module is responsible for extracting effective sensing information from the weak electrical signal from the probe, and can specifically use a lock-in amplifier or a custom demodulation board based on digital signal processing. The phase-locked demodulation module receives the fluorescence electrical signal from the NV color center probe and the reference signal from the timing control module, respectively. Based on the reference signal, it performs phase-locked demodulation on the fluorescence electrical signal to extract the amplitude of the fluorescence signal component at the modulation frequency corresponding to the reference signal, and outputs the amplitude of the fluorescence signal component as the demodulated signal. Through relevant detection techniques, this module can accurately measure the amplitude of the fluorescence component modulated at a specific frequency, such as the microwave modulation frequency, thereby obtaining a sharp ODMR resonance spectrum, or demodulating the amplitude of pulse sequences such as spin echoes. Thus, the phase-locked demodulation module outputs a high signal-to-noise ratio analog or digital demodulated signal, providing a basis for subsequent data acquisition and spectral fitting.

[0048] In step S6, the data acquisition card acquires the demodulated signal and generates sampled data, then sends the sampled data to the host computer. Specifically, the data acquisition card receives the demodulated signal from the phase-locked demodulation module, samples the demodulated signal to form corresponding sampled data, and then sends the sampled data to the host computer. Since the host computer's software integrates test data storage functionality, the sampled data output by the data acquisition card can be further categorized and stored by the host computer according to timestamps for subsequent querying, exporting, and visualization. This step plays a crucial role in converting analog or digital demodulation results into a data stream that can be processed by software. The host computer dynamically records and categorizes the sampled data by timestamps for subsequent data querying, exporting, visualization, and long-term test result comparison and analysis.

[0049] In step S7, the host computer receives the sampling data collected by the data acquisition card and processes the data to generate optically detected magnetic resonance (ODMR) spectral lines. It then calculates the intensity of the external electric or magnetic field to be measured based on the change in the center frequency of the spectral lines and outputs the test results. The data processing module synchronously records the fluorescence signal intensity corresponding to different microwave frequencies during the microwave frequency sweep, and generates ODMR spectral lines based on the microwave frequency and fluorescence signal intensity data. It also calculates the change in the center frequency of the ODMR spectral lines to obtain the intensity of the external electric or magnetic field to be measured. The result display module displays the test results through an interactive interface. The data storage module stores the data collected during the test according to the timestamp and supports data querying, exporting, and visualization. Specifically, the host computer automatically fits the ODMR spectral lines by scanning the microwave frequency and synchronously recording the fluorescence intensity, calculates the shift in the center frequency of the spectral lines caused by the external electric or magnetic field, and finally directly displays and records the intensity and direction of the physical field to be measured. After clicking "Stop" on the main thread UI, the software saves the optical power, microwave power, modulation parameters, and ODMR spectral lines recorded during program execution. It also plots the sweep-ODMR spectral lines, sweep-demodulation curves, sweep-differential curves, and noise amplitude spectral density (ASD), and calculates relevant parameters such as long-term stability.

[0050] During the execution of steps S1 to S7, the test control module includes a main thread unit, a parameter optimization thread unit, and a status detection thread unit. The test control module obtains test task information input by the user and executes the corresponding test tasks based on this information. This includes the following: The main thread unit obtains the test task information input by the user and calls the corresponding thread unit to execute the test task based on this information. The test tasks include parameter optimization test tasks and status detection test tasks. The main thread unit receives the test task information input by the user through the UI interface. After the parameters are set and the device connection check is completed, it determines whether to call the parameter optimization thread unit or the status detection thread unit to execute the corresponding test task based on the test task information.

[0051] When performing parameter optimization testing, the parameter optimization thread unit executes the following: it receives the parameters to be optimized and forms multiple sets of test parameter combinations based on these parameters. It then sends corresponding control commands to the laser module, microwave module, and timing control module according to each set of test parameter combinations. After receiving sampled data, the parameter optimization thread unit calculates the evaluation index corresponding to the current parameter combination based on the sampled data. After comparing the evaluation indices corresponding to multiple sets of parameter combinations, it outputs the optimal parameter combination. The evaluation indices include at least one of sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters. According to the software flow description in the disclosure document, the parameter optimization sub-thread is used to change optical power, microwave parameters, timing, etc., to calculate the optimal sensitivity. Therefore, in this embodiment, the parameter optimization thread unit can form multiple sets of test parameter combinations by changing optical power, microwave parameters, timing, etc., and compare the sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters under different parameter combinations to output the optimal parameter combination. Under the premise of meeting the preset test requirements, the parameter optimization thread unit tests and compares different parameter combinations by changing optical power, microwave parameters, timing, etc., so as to achieve adaptive matching and adjustment of laser parameters and microwave parameters and obtain a better test parameter combination.

[0052] When performing a status detection test task, the status detection thread unit executes the task: receiving current operating parameters and controlling the laser module, microwave module, and timing control module to perform tests based on these parameters, continuously receiving sampling data at different time points; after receiving the sampling data at different time points, the status detection thread unit monitors the electrical parameter status of the NV color center probe, continuously tests the probe sensitivity, and calculates long-term stability-related parameters. According to the software flow description in the disclosure document, the status detection sub-thread is called by the main thread and is mainly used to monitor the status refresh of the electrical parameters of the NV color center probe and continuously test the probe sensitivity, calculating the long-term stability of the probe. Therefore, in this embodiment, the status detection thread unit performs continuous testing around the current operating parameters and completes status refresh monitoring, continuous sensitivity testing, and long-term stability calculation based on sampling data at different time points, thereby achieving the tracking and evaluation of the probe's long-term operating status. During continuous testing, the system can also dynamically record and visualize the probe's relevant performance indicators to track and analyze status changes that occur during the testing process.

[0053] The integrated rapid testing method for NV color center probes provided by this invention integrates a laser module, microwave module, timing control module, phase-locked demodulation module, data acquisition card, and host computer. The host computer uniformly completes test parameter configuration, control command issuance, test task scheduling, sampling data processing, result display, and data storage. This creates a continuous closed loop between laser pumping, microwave driving, timing synchronization, phase-locked demodulation, and ODMR spectral line generation, effectively reducing reliance on manual adjustment, step-by-step operation, and offline analysis in traditional testing processes, and improving the automation and repeatability of the testing process. Furthermore, through the cooperation of the main thread unit, parameter optimization thread unit, and status detection thread unit, it can not only optimize optical power, microwave parameters, and timing and output the optimal parameter combination, but also continuously test and dynamically track the electrical parameter status, sensitivity changes, and long-term stability of the NV color center probe. This improves testing efficiency, shortens the single-probe testing cycle, reduces the impact of human error on test results, and enhances the ability to detect abnormal probe states and performance changes, providing accurate, efficient, and stable testing support for the reliability research of NV color center probes.

[0054] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0055] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A rapid testing system for an integrated NV color center probe, characterized in that, include: Laser module, microwave module, timing control module, phase-locked demodulation module, data acquisition card and host computer; The host computer is communicatively connected to the timing control module, the laser module, the microwave module, and the data acquisition card, and is used to receive test parameters input by the user and send control commands to the laser module, the microwave module, and the timing control module according to the test parameters. The timing control module is used to generate a TTL timing control signal with a preset delay and pulse width according to the control command, and output the TTL timing control signal to the laser module and the microwave module respectively, so as to control the laser module and the microwave module to work together according to the preset timing. The laser module is used to provide laser pumping to the NV color center probe according to the TTL timing control signal; The microwave module is used to generate a swept microwave signal according to the TTL timing control signal and apply it to the NV color center probe to manipulate the spin state of the NV color center. The phase-locked demodulation module is used to receive the fluorescence electrical signal generated by the NV color center probe under the action of the laser pump and microwave signal, and to perform phase-locked demodulation on the fluorescence electrical signal to obtain a demodulated signal; The data acquisition card is used to acquire the demodulated signal and generate sampling data, and send the sampling data to the host computer. The host computer receives the sampling data acquired by the data acquisition card and processes the sampling data to generate optically detected magnetic resonance (ODMR) spectral lines, and calculates the external electric or magnetic field strength to be measured based on the change in the center frequency of the spectral lines and outputs the test results.

2. The integrated NV color center probe rapid testing system according to claim 1, characterized in that, The host computer includes: The interface configuration module is used to provide a test parameter input interface and display the connection status and parameter setting information of each device in the test system; The control command generation module is used to generate control commands based on the test parameters, and send the laser control command to the laser module, the microwave control command to the microwave module, and the timing control command to the timing manipulation module. The test control module is used to obtain test task information input by the user and execute the corresponding test task according to the test task information; The data processing module is used to synchronously record the fluorescence signal intensity corresponding to different microwave frequencies during the microwave frequency sweep process, and to generate optically detected magnetic resonance (ODMR) spectral lines based on the microwave frequency and fluorescence signal intensity data. The module also calculates the change in the center frequency of the ODMR spectral lines to obtain the intensity of the external electric or magnetic field to be measured. The results display module is used to display test results through an interactive interface; The data storage module is used to store the data collected during the test according to the timestamp, and supports data query, export and visualization.

3. The integrated NV color center probe rapid testing system according to claim 2, characterized in that, The test control module includes: The main thread unit is used to obtain test task information input by the user and call the corresponding thread unit to execute the test task according to the test task information. The test task includes parameter optimization test task and state detection test task. The parameter optimization thread unit is used to execute the parameter optimization test task: receiving the parameters to be optimized, forming multiple sets of test parameter combinations based on the parameters to be optimized, and sending corresponding control commands to the laser module, microwave module, and timing control module according to each set of test parameter combinations; after receiving the sampled data, calculating the evaluation index corresponding to the current parameter combination based on the sampled data, and outputting the optimal parameter combination after comparing the evaluation indexes corresponding to multiple sets of parameter combinations, wherein the evaluation index includes at least one of sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters; The state detection thread unit is used to execute the state detection test task: receive the current working parameters, and control the laser module, microwave module and timing control module to perform tests according to the current working parameters, continuously receive sampling data at different time points; after receiving the sampling data at different time points, monitor the electrical parameter status of the NV color center probe, continuously test the probe sensitivity, and calculate long-term stability related parameters.

4. The integrated NV color center probe rapid testing system according to claim 1, characterized in that, The laser module includes: a solid-state laser with an output wavelength of 532 nm and an optical attenuator, wherein the optical attenuator is used to adjust the laser power output by the solid-state laser to the NV color center probe; The microwave module includes a vector microwave signal source and a microwave power amplifier. The vector microwave signal source is used to generate microwave signals with a frequency range of 2.6 GHz to 3.1 GHz, and the microwave power amplifier is used to amplify the microwave signals and output them to the NV color center probe.

5. The integrated NV color center probe rapid testing system according to claim 1, characterized in that, The phase-locked demodulation module is further configured to receive the fluorescence electrical signal from the NV color center probe and the reference signal from the timing control module, respectively, perform phase-locked demodulation on the fluorescence electrical signal based on the reference signal, extract the fluorescence signal component amplitude at the modulation frequency corresponding to the reference signal, and output the fluorescence signal component amplitude as the demodulated signal. The timing control module is used to generate at least two TTL timing control signals with preset delay and pulse width according to the control instructions sent by the host computer. One TTL timing control signal is output to the laser module to control the laser pulse modulation, and the other TTL timing control signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal.

6. A rapid testing method for an integrated NV color center probe, characterized in that, The method is applied to an integrated NV color center probe rapid testing system, which includes: a laser module, a microwave module, a timing control module, a phase-locked demodulation module, a data acquisition card, and a host computer. The method includes: The host computer receives the test parameters input by the user and sends control commands to the laser module, microwave module and timing control module according to the test parameters; The timing control module generates a TTL timing control signal with a preset delay and pulse width according to the control command, and outputs the TTL timing control signal to the laser module and the microwave module respectively, so as to control the laser module and the microwave module to work together in accordance with the preset timing. The laser module provides laser pumping to the NV color center probe according to the TTL timing control signal; The microwave module generates a swept microwave signal according to the TTL timing control signal and applies it to the NV color center probe to manipulate the spin state of the NV color center; The phase-locked demodulation module receives the fluorescence electrical signal generated by the NV color center probe under the action of the laser pump and microwave signal, and performs phase-locked demodulation on the fluorescence electrical signal to obtain a demodulated signal; The data acquisition card acquires the demodulated signal and generates sampling data, and sends the sampling data to the host computer; The host computer receives the sampling data collected by the data acquisition card and processes the sampling data to generate optically detected magnetic resonance (ODMR) spectral lines. It then calculates the intensity of the external electric or magnetic field to be measured based on the change in the center frequency of the spectral lines and outputs the test results.

7. The rapid testing method for the integrated NV color center probe according to claim 6, characterized in that, The host computer includes: an interface configuration module, a control command generation module, a test control module, a data processing module, a result display module, and a data storage module. The method further includes: The interface configuration module provides a test parameter input interface and displays the connection status and parameter settings of each device in the test system; The control command generation module generates control commands based on the test parameters and sends the laser control command to the laser module, the microwave control command to the microwave module, and the timing control command to the timing manipulation module. The test control module obtains the test task information input by the user and executes the corresponding test task according to the test task information; During the microwave frequency sweep, the data processing module synchronously records the fluorescence signal intensity corresponding to different microwave frequencies, and generates optically detected magnetic resonance (ODMR) spectral lines based on the microwave frequency and fluorescence signal intensity data. The module also calculates the change in the center frequency of the ODMR spectral lines to obtain the intensity of the external electric or magnetic field to be measured. The results display module displays test results through an interactive interface; The data storage module stores the data collected during the test according to the timestamp, and supports data query, export and visualization.

8. The rapid testing method for the integrated NV color center probe according to claim 7, characterized in that, The test control module includes a main thread unit, a parameter optimization thread unit, and a status detection thread unit. The test control module acquires test task information input by the user and executes corresponding test tasks based on the test task information, including: The main thread unit obtains the test task information input by the user, and calls the corresponding thread unit to execute the test task according to the test task information. The test task includes parameter optimization test task and state detection test task. The parameter optimization thread unit executes the parameter optimization test task: it receives the parameters to be optimized, forms multiple sets of test parameter combinations based on the parameters to be optimized, and sends corresponding control commands to the laser module, microwave module and timing control module according to each set of test parameter combinations. After receiving the sampled data, the parameter optimization thread unit calculates the evaluation index corresponding to the current parameter combination based on the sampled data, and outputs the optimal parameter combination after comparing the evaluation indexes corresponding to multiple parameter combinations. The evaluation index includes at least one of sensitivity, demodulated signal amplitude, ODMR spectral line correlation parameters, and noise amplitude spectral density correlation parameters. The state detection thread unit executes the state detection test task: it receives the current working parameters and controls the laser module, microwave module and timing control module to perform the test according to the current working parameters, and continuously receives sampling data at different time points; After receiving the sampling data at different time points, the status detection thread unit monitors the electrical parameter status of the NV color center probe, continuously tests the probe sensitivity, and calculates long-term stability-related parameters.

9. The rapid testing method for the integrated NV color center probe according to claim 6, characterized in that, The laser module includes a solid-state laser with an output wavelength of 532 nm and an optical attenuator; the microwave module includes a vector microwave signal source and a microwave power amplifier; and the method further includes: The laser module adjusts the laser power output from the solid-state laser to the NV color center probe via the optical attenuator; The microwave module generates microwave signals with a frequency range of 2.6 GHz to 3.1 GHz through the vector microwave signal source, and the microwave power amplifier amplifies the microwave signals and outputs them to the NV color center probe.

10. The rapid testing method for the integrated NV color center probe according to claim 6, characterized in that, The method further includes: The phase-locked demodulation module receives the fluorescence electrical signal from the NV color center probe and the reference signal from the timing control module, respectively. Based on the reference signal, it performs phase-locked demodulation on the fluorescence electrical signal to extract the fluorescence signal component amplitude at the modulation frequency corresponding to the reference signal, and outputs the fluorescence signal component amplitude as the demodulated signal. The timing control module generates at least two TTL timing control signals with preset delays and pulse widths according to the control instructions sent by the host computer. One TTL timing control signal is output to the laser module to control laser pulse modulation, and the other TTL timing control signal is output to the microwave module to control the pulse switching and frequency switching of the microwave signal.

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