Device parameter fitting method and system, electronic device, storage medium and program product

Abstract

The application provides a device parameter fitting method, comprising: obtaining actual measurement data of each end of a target device in a power grid at a section moment; assigning an initial parameter value to the target device, establishing a simulation device according to the target device assigned with the initial parameter value, running the simulation device in a preset power flow calculation model, and obtaining model measurement data of each end of the simulation device; adjusting the initial parameter value according to the model measurement data and the actual measurement data, so that an analysis error of the model measurement data and the actual measurement data is less than a preset range, to obtain a fitting parameter value at the section moment. The application can fit reliable device parameters in the case of missing or inaccurate device parameters.

Description

Technical Field

[0001] This invention relates to the field of large model technology, and specifically to a method for fitting device parameters. Background Technology

[0002] In power system analysis, it is often necessary to simulate and analyze the transient or future states of the power system. Due to reasons such as archival maintenance or data acquisition accuracy issues, some equipment parameters may be missing or inaccurate. When constructing power flow analysis models, this may lead to non-convergence of power flow or inaccurate power flow calculation results, failing to provide effective support for the operation of the power grid. Currently, there are no good methods to improve the accuracy of equipment parameters, and even for known equipment parameters, effective verification is not possible. Maintenance personnel cannot verify the accuracy of parameters, and there is a lack of intelligent parameter management methods. The industry needs a new, automated equipment parameter fitting method to solve these technical problems. Summary of the Invention

[0003] The purpose of this invention is to provide a method for fitting equipment parameters, so as to fit reliable equipment parameters when equipment parameters are missing or inaccurate.

[0004] To achieve the above objectives, the present invention provides a method for fitting equipment parameters, comprising the following steps: at a cross-sectional moment, acquiring actual measurement data of each end of a target device in the power grid; assigning initial parameter values ​​to the target device; establishing a simulation device based on the target device with assigned initial parameter values; running the simulation device in a preset power flow calculation model; and acquiring model measurement data of each end of the simulation device; adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data, so that the analysis error between the model measurement data and the actual measurement data is less than a preset range, thereby obtaining the fitting parameter values ​​at that cross-sectional moment.

[0005] Optionally, it further includes: dividing a preset time period into multiple segments to obtain several cross-sectional moments; obtaining the fitting parameter value for each cross-sectional moment; substituting each fitting parameter value into all cross-sectional moments to obtain the analysis error corresponding to each cross-sectional moment; and determining the optimal fitting parameter value among all the fitting parameter values ​​for all cross-sectional moments based on the analysis error corresponding to each cross-sectional moment.

[0006] Optionally, it further includes: dividing each end of the target device into a balancing end and a load end based on the actual measurement data; dividing each end of the simulation device into a balancing end and a load end corresponding to each end of the target device; adjusting the initial parameter value based on the model measurement data and the actual measurement data specifically includes: adjusting the actual measurement data of the load end of the target device and the simulated measurement data of the load end of the simulation device to equal values, obtaining the actual measurement data of the balancing end of the target device and the simulated measurement data of the balancing end of the simulation device under this condition; adjusting the initial parameter value based on the actual measurement data of the balancing end of the target device and the simulated measurement data of the balancing end of the simulation device.

[0007] Optionally, dividing each end of the target device into an end to be balanced and a load end based on the actual measurement data specifically includes: setting the end with a value greater than zero in the actual measurement data as the end to be balanced.

[0008] Optionally, setting the end with a value greater than zero in the actual measurement data as the end to be balanced specifically includes: if there are multiple ends with a value greater than zero in the actual measurement data, then the end with the largest value is set as the end to be balanced.

[0009] Optionally, adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data to make the analysis error between the model measurement data and the actual measurement data less than a preset range, in order to obtain the fitting parameter values ​​at the cross-section moment, specifically includes: establishing an objective function based on the actual active power and actual reactive power of the target device, and the simulated active power and simulated reactive power of the simulation device, in order to obtain the fitting parameter values ​​at the cross-section moment.

[0010] To achieve the above objectives, the present invention also provides a device parameter fitting system for executing any of the device parameter fitting methods described above, comprising: an acquisition module for acquiring actual measurement data of each end of a target device in a power grid; a power flow calculation model for providing an operating environment for the simulation device; and a processing module for adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data, so that the analysis error between the model measurement data and the actual measurement data is less than a preset range, thereby obtaining the fitting parameter values ​​at the cross-section at that time.

[0011] To achieve the above objectives, the present invention also provides an electronic device, including a processor and a memory, wherein the memory stores a computer program, and when the computer program is executed by the processor, it implements the device parameter fitting method described above.

[0012] To achieve the above objectives, the present invention also provides a readable storage medium storing a computer program, which, when executed by a processor, implements the device parameter fitting method described above.

[0013] To achieve the above objectives, the present invention also provides a computer program product, including a computer program, which, when executed by a processor, implements the device parameter fitting method described above.

[0014] The device parameter fitting method, system, electronic device, storage medium, and computer program product provided by this invention have the following beneficial effects:

[0015] This invention also provides a method for fitting equipment parameters, comprising the following steps: at a given cross-sectional moment, acquiring actual measurement data of each end of a target device in the power grid; assigning initial parameter values ​​to the target device; establishing a simulation device based on the target device with assigned initial parameter values; running the simulation device in a preset power flow calculation model; and acquiring model measurement data of each end of the simulation device; adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data to ensure that the analysis error between the model measurement data and the actual measurement data is less than a preset range, thereby obtaining the fitted parameter values ​​at that cross-sectional moment. With this setup, this invention utilizes a power flow calculation model with circuit principle constraints to reverse-calculate and adjust the fitted parameter values ​​of the device, effectively solving the problem of convergence failure or large deviations caused by inaccurate parameters. It achieves a shift from "manual item-by-item verification" to "automated batch verification," eliminating the need for maintenance personnel to verify equipment parameters individually; the system can automatically identify abnormal parameters and provide correction suggestions. This provides better support for the safe operation and adjustment of the power grid's operating mode. Attached Figure Description

[0016] Figure 1 This is a flowchart illustrating a device parameter fitting method provided in an embodiment of the present invention;

[0017] Figure 2 This is a block diagram of an electronic device provided according to an embodiment of the present invention;

[0018] The accompanying figure is labeled as follows:

[0019] Processor-101; Communication interface-102; Memory-103; Communication bus-104. Detailed Implementation

[0020] To make the objectives, advantages, and features of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the drawings are all in a very simplified form and are not drawn to scale, and are only used to facilitate and clarify the explanation of the embodiments of this invention. Furthermore, the structures shown in the drawings are often part of the actual structures. In particular, different figures may emphasize different aspects and may sometimes use different scales.

[0021] It should be understood that when an element or layer is referred to as "on" or "connected to" other elements or layers, it may be directly on or connected to other elements or layers, or there may be intervening elements or layers. Conversely, when an element is referred to as "directly on" or "directly connected to" other elements or layers, there are no intervening elements or layers. Although the terms first, second, third, etc., may be used to describe various elements, components, areas, layers, and / or portions, these elements, components, areas, layers, and / or portions should not be limited by these terms. These terms are only used to distinguish one element, component, area, layer, or portion from another element, component, area, layer, or portion. Therefore, without departing from the teachings of this invention, the first element, component, area, layer, or portion discussed below may be referred to as a second element, component, area, layer, or portion. Spatial relation terms such as "below," "under," "below," "above," "on top," "above," etc., may be used herein for convenience of description to describe the relationship between one element or feature shown in the figures and other elements or features. It should be understood that, in addition to the orientations shown in the figures, spatial relational terms are intended to also include different orientations of the devices in use and operation. For example, if the devices in the figures are flipped, then elements or features described as “below,” “under,” or “below” will be oriented “on” other elements or features. Devices may be oriented additionally (rotated 90 degrees or otherwise) and the spatial descriptive terms used herein will be interpreted accordingly. The terminology used herein is intended only to describe particular embodiments and is not intended to limit the invention. When used herein, the singular forms “a,” “an,” and “the” are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “comprising” is used to identify the presence of features, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, steps, operations, elements, components, and / or groups. When used herein, the terms “and / or” include any and all combinations of the associated listed items.

[0022] The purpose of this invention is to provide a method for fitting equipment parameters, so as to fit reliable equipment parameters when equipment parameters are missing or inaccurate.

[0023] To achieve the above objectives, the present invention provides a method for fitting equipment parameters, comprising the following steps: at a cross-sectional moment, acquiring actual measurement data of each end of a target device in the power grid; assigning initial parameter values ​​to the target device; establishing a simulation device based on the target device with assigned initial parameter values; running the simulation device in a preset power flow calculation model; and acquiring model measurement data of each end of the simulation device; adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data, so that the analysis error between the model measurement data and the actual measurement data is less than a preset range, thereby obtaining the fitting parameter values ​​at that cross-sectional moment.

[0024] This design allows the invention to utilize a power flow calculation model constrained by circuit principles to reverse-engineer and adjust the fitted device parameter values, effectively solving the problem of convergence failure or large deviations caused by inaccurate parameters. It achieves a shift from "manual item-by-item verification" to "automated batch verification," eliminating the need for maintenance personnel to verify device parameters individually; the system can automatically identify abnormal parameters and provide correction suggestions. This provides better support for the safe operation and adjustment of power grid operating modes.

[0025] Specifically, it also includes: dividing each end of the target device into a balancing end and a load end based on the actual measurement data; dividing each end of the simulation device into a balancing end and a load end corresponding to each end of the target device; adjusting the initial parameter value based on the model measurement data and the actual measurement data specifically includes: adjusting the actual measurement data of the load end of the target device and the simulated measurement data of the load end of the simulation device to equal values, obtaining the actual measurement data of the balancing end of the target device and the simulated measurement data of the balancing end of the simulation device under this condition; adjusting the initial parameter value based on the actual measurement data of the balancing end of the target device and the simulated measurement data of the balancing end of the simulation device. This setup allows for reverse calculation of the balancing end based on the load end, thus providing a basis for adjusting the initial parameter value of the device. Using a unified value for the load end as an anchor is because the measurement data of the load end is generally relatively stable and easily accessible.

[0026] In an exemplary embodiment, dividing the ends of the target device into balancing ends and load ends based on the actual measurement data specifically includes: setting the ends with values ​​greater than zero in the actual measurement data as balancing ends. It should be noted that if there are multiple ends with values ​​greater than zero in the actual measurement data, the end with the largest value is set as the balancing end, so that the numerical display when comparing the actual measurement data of the balancing end of the target device with the simulated measurement data of the balancing end of the simulated device, and the numerical changes after adjusting the initial parameter values, are more obvious. For example, taking a three-winding transformer as an example, the measurement data (high-medium-low) of the three winding ends are Ph, Pm, and Pl, respectively. If the measurement data is greater than zero, this end is equivalent to the balancing end generator gen; otherwise, it is equivalent to the load end load. If there is only one gen, it is set as the balancing end; if there are multiple gens, the one with the higher voltage level is set as the balancing end.

[0027] Furthermore, adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data to make the analysis error between the model measurement data and the actual measurement data less than a preset range, in order to obtain the fitting parameter values ​​at the cross-section moment, specifically includes: establishing an objective function based on the actual active power and actual reactive power of the target device, and the simulated active power and simulated reactive power of the simulation device, in order to obtain the fitting parameter values ​​at the cross-section moment.

[0028] For example, power flow calculations are performed on a single transformer power flow model (taking a three-winding transformer as an example, typically consisting of one generator and two loads), and the weighted deviation from the actual measured data is calculated.

[0029] Specifically, it can be calculated using the following formula:

[0030]

[0031] in:

[0032] Active power P weight (taken as 0.7);

[0033] Actual active power;

[0034] Power flow calculation: active power;

[0035] Reactive Q weight (taken as 0.3);

[0036] Actual reactive power;

[0037] : Power flow calculation of reactive power;

[0038] E: Weighted bias result.

[0039] After fitting the parameters at a single cross-section, further multi-cross-section parameter verification should be performed. Based on this, the invention further includes: dividing a preset time period into multiple segments to obtain several cross-section times; for each cross-section time, obtaining the fitting parameter value for that time; substituting each fitting parameter value into all cross-section times to obtain the analysis error for each corresponding cross-section time; and determining the optimal fitting parameter value among all the fitting parameter values ​​at all cross-section times based on the analysis error for each corresponding cross-section time. In an exemplary embodiment, the preset time period is 24 hours a day. This setting allows for cross-verification of multiple fitting parameter values ​​using operating conditions at different times of the day, thereby selecting the best-fitting fitting parameter value.

[0040] The specific steps are as follows:

[0041] 1. Calculate the optimal parameters for all cross-sections

[0042] For each cross-section, the data is solved using the method described in the first step to obtain the optimal set of parameters suitable for each cross-section.

[0043] n represents the number of cross sections

[0044] II. Apply each set of parameters to solve all cross-sections.

[0045] Each set of parameters is applied to each cross section, and a single transformer power flow calculation model is constructed in the manner of the first step for calculation. Each set of parameters yields a set of weighted errors.

[0046] LE = { (This set has n instances)

[0047] III. Calculating the optimal average error

[0048] For each set of parameters, the weighted error set is calculated, the average error is obtained, and the average error set { is obtained}. }

[0049]

[0050] IV. Calculate the minimum error to obtain the optimal parameters.

[0051] By calculating the minimum value of the average error set, the LE is found based on the minimum value of the average error, and the final L is located, which is the optimal parameter.

[0052] best_e = min( )

[0053] To achieve the above objectives, the present invention also provides a device parameter fitting system for executing any of the device parameter fitting methods described above, comprising: an acquisition module for acquiring actual measurement data at each end of a target device in a power grid; a power flow calculation model for providing an operating environment for the simulated device; and a processing module for adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data, so that the analysis error between the model measurement data and the actual measurement data is less than a preset range, thereby obtaining the fitting parameter values ​​at the cross-section at that time. Since the device parameter fitting system provided by the present invention belongs to the same inventive concept as the device parameter fitting methods described above, the device parameter fitting system provided by the present invention possesses all the advantages of the device parameter fitting methods described above. Therefore, the beneficial effects of the device parameter fitting system provided by the present invention will not be elaborated further here.

[0054] To achieve the above objectives, the present invention also provides an electronic device, please refer to... Figure 2 A block diagram illustrating an embodiment of the electronic device provided by the present invention is shown. Figure 2 As shown, the electronic device includes a processor 101 and a memory 103. The memory 103 stores a computer program, which, when executed by the processor 101, implements the device parameter fitting method described above. Since the electronic device provided by this invention and the device parameter fitting method described above belong to the same inventive concept, the electronic device provided by this invention possesses all the advantages of the device parameter fitting method described above. Therefore, the beneficial effects of the electronic device provided by this invention will not be elaborated further here.

[0055] like Figure 2 As shown, the electronic device also includes a communication interface 102 and a communication bus 104, wherein the processor 101, the communication interface 102, and the memory 103 communicate with each other via the communication bus 104. The communication bus 104 can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. This communication bus 104 can be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is used in the figure, but this does not indicate that there is only one bus or one type of bus. The communication interface 102 is used for communication between the aforementioned electronic device and other devices.

[0056] The processor 101 referred to in this invention can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor. The processor 101 is the control center of the electronic device, connecting various parts of the entire electronic device through various interfaces and lines.

[0057] The memory 103 can be used to store the computer program. The processor 101 implements various functions of the electronic device by running or executing the computer program stored in the memory 103 and calling the data stored in the memory 103.

[0058] The memory 103 may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0059] This invention also provides a readable storage medium storing a computer program that, when executed by a processor, can implement the device parameter fitting method described above. Since the readable storage medium provided by this invention and the device parameter fitting method described above belong to the same inventive concept, the readable storage medium provided by this invention possesses all the advantages of the device parameter fitting method described above. Therefore, the beneficial effects of the readable storage medium provided by this invention will not be elaborated further here.

[0060] The readable storage medium of embodiments of the present invention can be any combination of one or more computer-readable media. The readable medium can be a computer-readable signal medium or a computer-readable storage medium. Computer-readable storage media can be, for example, but not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any combination thereof. More specific examples of computer-readable storage media (a non-exhaustive list) include: electrical connections having one or more wires, portable computer hard disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, apparatus, or device.

[0061] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of transmitting, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium may be transmitted using any suitable medium, including but not limited to wireless, wireline, optical fiber, RF, etc., or any suitable combination thereof.

[0062] To achieve the above objectives, the present invention also provides a computer program product, comprising a computer program that, when executed by a processor, implements the device parameter fitting method described above. Since the computer program product provided by the present invention and the device parameter fitting method described above belong to the same inventive concept, the computer program product provided by the present invention possesses all the advantages of the device parameter fitting method described above. Therefore, the beneficial effects of the computer program product provided by the present invention will not be elaborated further here.

[0063] It should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the systems disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple, and relevant parts can be referred to the method section.

[0064] It should also be noted that although the present invention has been disclosed above with reference to preferred embodiments, these embodiments are not intended to limit the present invention. For any person skilled in the art, many possible variations and modifications can be made to the technical solutions of the present invention based on the disclosed technical content, or equivalent embodiments can be modified accordingly, without departing from the scope of the present invention. Therefore, any simple modifications, equivalent changes, and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the present invention shall still fall within the scope of protection of the present invention.

[0065] It should also be understood that, unless otherwise specified or indicated, the terms “first,” “second,” “third,” etc., in the specification are used only to distinguish the various components, elements, and steps in the specification, and not to indicate the logical or sequential relationships between the various components, elements, and steps.

[0066] Furthermore, it should be recognized that the terminology described herein is used only to describe particular embodiments and not to limit the scope of the invention. It must be noted that the singular forms “a” and “an” used herein and in the appended claims include plural bases unless the context clearly indicates otherwise. For example, a reference to “a step” or “an apparatus” means a reference to one or more steps or apparatuses, and may include secondary steps and secondary apparatuses. All conjunctions used should be understood in the broadest sense. And the word “or” should be understood to have the definition of logical “or” rather than logical “exclusive OR”, unless the context clearly indicates otherwise. Furthermore, implementation of embodiments of the invention may include performing selected tasks manually, automatically, or in combination.

Claims

1. A method for fitting equipment parameters, characterized in that, Includes the following steps: At a given moment, acquire actual measurement data at each end of the target equipment in the power grid; The target device is assigned initial parameter values, a simulation device is established based on the target device with assigned initial parameter values, the simulation device is run in a preset power flow calculation model, and model measurement data at each end of the simulation device are obtained. Based on the model measurement data and the actual measurement data, the initial parameter values ​​are adjusted so that the analysis error between the model measurement data and the actual measurement data is less than a preset range, in order to obtain the fitting parameter values ​​at that cross-section time.

2. The device parameter fitting method of claim 1, wherein, Also includes: The preset time period is divided into multiple segments to obtain several cross-sectional moments. For each cross-sectional time, obtain the fitting parameter value for that cross-sectional time; Substitute each of the fitted parameter values ​​into all the cross-sectional times to obtain the analysis error corresponding to each cross-sectional time. Based on the analysis error corresponding to each cross-sectional time, the optimal fitting parameter value is determined among the fitting parameter values ​​for all cross-sectional time points.

3. The device parameter fitting method of claim 1, wherein, Also includes: Based on the actual measurement data, each end of the target device is divided into the end to be balanced and the load end; The ends of the simulation device are divided into the end to be balanced and the load end, corresponding to the ends of the target device. The step of adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data specifically includes: Adjust the actual measurement data of the load end of the target device and the simulated measurement data of the load end of the simulation device to equal values, and obtain the actual measurement data of the target device to be balanced end and the simulated measurement data of the simulation device to be balanced end under this condition. The initial parameter values ​​are adjusted based on the actual measurement data of the target device's end to be balanced and the simulated measurement data of the simulated device's end to be balanced.

4. The equipment parameter fitting method as described in claim 3, characterized in that, The step of dividing each end of the target device into the end to be balanced and the load end based on the actual measurement data specifically includes: The end with a value greater than zero in the actual measurement data is designated as the end to be balanced.

5. The method of fitting device parameters of claim 4, wherein, The step of setting the value greater than zero in the actual measurement data as the end to be balanced specifically includes: If there are multiple ends with values ​​greater than zero in the actual measurement data, then the end with the largest value is set as the end to be balanced.

6. The device parameter fitting method of claim 1, wherein, The step of adjusting the initial parameter values ​​based on the model measurement data and the actual measurement data to ensure that the analysis error between the model measurement data and the actual measurement data is less than a preset range, in order to obtain the fitting parameter values ​​for the cross-section at that time, specifically includes: Based on the actual active and reactive power of the target device, and the simulated active and reactive power of the simulation device, an objective function is established to obtain the fitting parameter values ​​at that cross-section time.

7. A device parameter fitting system configured to perform the device parameter fitting method according to any one of claims 1 to 6, characterized in that, include: The acquisition module is used to acquire actual measurement data at each end of the target equipment in the power grid. A power flow calculation model is used to provide an operating environment for the simulation equipment. The processing module is used to adjust the initial parameter values ​​based on the model measurement data and the actual measurement data, so that the analysis error between the model measurement data and the actual measurement data is less than a preset range, so as to obtain the fitting parameter values ​​at the cross-section time.

8. An electronic device, comprising: It includes a processor and a memory, wherein the memory stores a computer program, which, when executed by the processor, implements the device parameter fitting method according to any one of claims 1 to 6.

9. A readable storage medium, characterized by, The readable storage medium stores a computer program, which, when executed by a processor, implements the device parameter fitting method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed, it implements the device parameter fitting method as described in any one of claims 1 to 6.

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