mass spectrometry
CN122930241APending Publication Date: 2026-10-16THERMO FISHER SCI BREMEN
1 Cites 0 Cited by
Patent Information
- Application Number
- CN202610410505.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2025-04-04
- Filing Date
- 2026-03-31
- Publication Date
- 2026-10-16
AI Technical Summary
Technical Problem
然而,需要按不同分辨率多次测量是不利的,因为它导致数据采集时间总体增加,因而降低通量
✦ Generated by Eureka AI based on patent content.
Abstract
A method of generating a stitched mass spectrum in Fourier transform mass spectrometry is provided herein. The method includes obtaining a transient signal recorded from ions stored within a mass spectrometer; performing a first Fourier transform on at least a first portion of the transient signal at a first resolution to obtain a first mass spectrum; performing a second Fourier transform on at least a second portion of the transient signal at a second resolution to obtain a second mass spectrum, wherein the second resolution is lower than the first resolution; comparing a peak size of a candidate peak in the first mass spectrum to a threshold value; responsive to determining that the peak size of the candidate peak in the first mass spectrum is below the threshold value, replacing the candidate peak in the first mass spectrum with a corresponding peak in the second mass spectrum, thereby generating a stitched mass spectrum.
Need to check novelty before this filing date? Find Prior Art