Electronic circuit fault rapid troubleshooting probe device

Abstract

This utility model relates to the field of electronic manufacturing technology, specifically a rapid troubleshooting probe device for electronic circuit faults. It includes a device body with supports connected to both sides of the body via threaded knobs. A limiting ring is fixedly fitted in the middle of the device body. Sliding grooves are formed on the left and right sides of the upper end of the device body, and protective covers are connected to the inside of the grooves via sliders. A test plug is fixedly connected to a test connector via wires, and a probe is movably inserted into the lower end of the test connector. This utility model, through the combined use of a suction cup, threaded knobs, and supports, can achieve the purpose of limiting and fixing the device body, reducing the possibility of accidental contact by the operator during operation, thus reducing the risk of positional displacement or tipping. It also reduces the need for manual adjustment of the device's position, ensures the operator's observation of the device panel values, reduces operator distraction, and improves testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of electronic manufacturing technology, specifically to a rapid troubleshooting probe device for electronic circuit faults. Background Technology

[0002] With the rapid development of electronic technology, from early simple DC and AC circuits to later analog and digital circuits, and now to highly integrated chip circuits and embedded systems, the structure and function of circuits have become increasingly complex. Whether it's household appliances, industrial equipment, communication systems, or electronic instruments, once a fault occurs, it's crucial to quickly locate the root cause. Electronic circuit fault rapid troubleshooting probe devices integrate multiple detection functions such as voltage, current, and resistance, enabling them to adapt to different types of circuit testing scenarios.

[0003] During the inspection and troubleshooting process, the operator needs to place the device in an easily observable location and use positive and negative probes to check the contact of the circuit. The operator can judge and handle the fault condition of the circuit through the values ​​fed back by the device panel.

[0004] However, the applicant believes that the existing rapid troubleshooting probe device for electronic circuit faults has the following shortcomings: During operation, the device may be accidentally touched by the operator, causing it to shift or tip over, thus affecting the operator's observation of the values ​​on the device panel. The operator needs to manually adjust the device's position, which requires pausing the current test, impacting overall work efficiency. When the device is not in use, the value panel is exposed and easily damaged by accidental collisions and friction from surrounding objects, leading to scratches, cracks, or even panel breakage, increasing maintenance costs and reducing lifespan. Furthermore, since the probe and device are integrated, long-term use will result in wear and tear due to contact, friction, and collisions (such as blunting of the tip or surface oxidation). If the probe cannot be replaced, the worn probe will continuously affect the detection accuracy.

[0005] To address these issues, we propose a rapid fault diagnosis probe device for electronic circuits. Utility Model Content

[0006] The purpose of this invention is to provide a rapid troubleshooting probe device for electronic circuit faults, so as to solve the problems mentioned in the background art.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a rapid troubleshooting probe device for electronic circuit faults, comprising a device body, with brackets connected to both sides of the device body via threaded knobs; a limiting ring is fixedly sleeved in the middle of the device body; sliding grooves are respectively opened on the left and right sides of the upper end of the device body, and protective covers are connected to the inside of the sliding grooves via sliders; an insertion hole is opened on the front of the device body, a test plug is movably inserted into the insertion hole, a test connector is fixedly connected to the test plug via a wire, and a probe is movably inserted into the lower end of the test connector.

[0008] Preferably, a suction cup is fixedly installed at the bottom of the device body. Two sets of suction cups are provided, and the two sets of suction cups are symmetrically distributed at the bottom of the device body, which can fix it more stably. The symmetrical distribution can reduce the possibility of tilting or falling off due to uneven force.

[0009] Preferably, the bracket is configured as a U-shaped structure, and there are two sets of brackets. The upper end of both sets of brackets is rotatably connected to a threaded knob, and the threaded knob is threaded into the device body. The relative position or angle between the bracket and the device body can be easily adjusted by rotating the threaded knob.

[0010] Preferably, the protective cover is configured as a U-shaped transparent structure, and sliders are fixed on the inner walls of the left and right sides of the protective cover. The outer dimensions of the sliders are adapted to the inner dimensions of the grooves. The protective cover is connected to the device body through the sliders to form a sliding engagement connection. With the sliding engagement structure, the protective cover is accurately aligned when sliding on the device body, reducing offset or shaking.

[0011] Preferably, both the socket and the test plug are provided in two sets. The two sets of sockets are respectively set as positive sockets and negative sockets. The two sets of test plugs are respectively set as red and black. The red test plug is movably inserted into the positive socket, and the black test plug is movably inserted into the negative socket. This conforms to the general standard of "red positive and black negative" in circuit connection, which can intuitively guide the correct connection and reduce the risk of short circuits, equipment damage, or even safety accidents caused by incorrect positive and negative connections.

[0012] Preferably, the test connector has a copper wire core inside, and a metal part is fixedly inserted at the lower end of the probe. When the test connector is sleeved on the upper end of the probe, the copper wire core inside the test connector is in contact with the metal part of the probe. The copper wire core is an excellent conductive material, and the metal part is usually made of a highly conductive metal. The direct contact between the two can form a low-resistance conductive path, reduce the loss in the current transmission process, and ensure the stability of the circuit connection.

[0013] This utility model provides a rapid fault diagnosis probe device for electronic circuits, which has the following beneficial effects:

[0014] By using suction cups, threaded knobs, and brackets in combination, the device body can be fixed in place, reducing the possibility of accidental contact by operators during operation, which could lead to positional shifts or tipping. This also reduces the need for operators to manually adjust the device's position, ensures operators can observe the values ​​on the device panel, minimizes operator distraction, and improves testing efficiency.

[0015] By using the sliding groove, slider and protective cover together, the device body panel can be protected. When the device is not in use, if the numerical panel is properly protected and not exposed, the risk of accidental collision and friction by surrounding objects can be effectively reduced, thereby reducing surface scratches, cracks or even breakage, reducing maintenance costs and extending service life.

[0016] By using the test plug, test connector and probe together, the purpose of replacing the probe can be achieved. The probe and device adopt a detachable design. Even if wear occurs due to contact friction and collision during long-term use (such as blunt tip or surface oxidation), the worn parts can be prevented from continuing to work by replacing the probe, thereby maintaining the detection accuracy always stable and reliable. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a three-dimensional front view of the structure of this utility model;

[0019] Figure 2 This is a three-dimensional front view of the structure of this utility model;

[0020] Figure 3 This is a schematic diagram of the protective cover of this utility model;

[0021] Figure 4 This utility model Figure 1 Explosion structure diagram;

[0022] Figure 5 This is a schematic diagram of the test plug and insulating sleeve of this utility model.

[0023] In the diagram: 1. Device body; 2. Suction cup; 3. Threaded knob; 4. Bracket; 5. Limiting ring; 6. Slide groove; 7. Slider; 8. Protective cover; 9. Test plug; 10. Test connector; 11. Probe. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Example 1

[0026] like Figures 1 to 3 As shown, this embodiment proposes a rapid troubleshooting probe device for electronic circuit faults, including a device body 1. Supports 4 are connected to both sides of the device body 1 via threaded knobs 3. A limiting ring 5 is fixedly fitted in the middle of the device body 1. Slide grooves 6 are respectively opened on the left and right sides of the upper end of the device body 1, and protective covers 8 are connected to the inside of the slide grooves 6 via sliders 7. An insertion hole is opened on the front of the device body 1, and a test plug 9 is movably inserted into the insertion hole. The test plug 9 is fixedly connected to a test connector 10 via wires, and a probe 11 is movably inserted into the lower end of the test connector 10. The bottom of the device body 1 is fixedly equipped with a suction cup 2. There are two sets of suction cups 2, which are symmetrically distributed at the bottom of the device body 1. The bracket 4 is set with a U-shaped structure. There are two sets of bracket 4, and the upper end of each set of bracket 4 is rotatably connected with a threaded knob 3. The threaded knob 3 is threaded into the device body 1. The protective cover 8 is set with a U-shaped transparent structure. The inner walls of the left and right sides of the protective cover 8 are fixed with sliders 7. The outer dimensions of the sliders 7 are adapted to the inner dimensions of the groove 6. The protective cover 8 is connected to the device body 1 by sliding and engaging through the sliders 7.

[0027] In the above embodiment, when using the device body 1, place it in a suitable position, loosen the threaded knob 3 to adjust the two sets of brackets 4 to a suitable angle, tighten the threaded knob 3 to fix them, hold the device body 1 and press down. Since the bottom of the device body 1 is equipped with a suction cup 2, the device body 1 will be attracted and fixed on the table. The double limiting fixation can improve the stability of the device body 1 when it is placed. For viewing the panel, the protective cover 8 can be moved to the top and rotated counterclockwise around the slider 7. The limiting ring 5 will restrict the position of the protective cover 8 to prevent the protective cover 8 from falling. At this time, the device body 1 can be used.

[0028] Example 2

[0029] like Figure 4 and Figure 5As shown, based on the same concept as the above embodiment, this embodiment also proposes that: both the socket and the test plug 9 are provided with two sets, the two sets of sockets are respectively set as positive sockets and negative sockets, the external colors of the two sets of test plugs 9 are set as red and black respectively, the red test plug 9 is movably inserted into the positive socket, and the black test plug 9 is movably inserted into the negative socket; the test connector 10 is provided with a copper wire core inside, the lower end of the probe 11 is fixedly inserted with a metal part, when the test connector 10 is sleeved on the upper end of the probe 11, the copper wire core inside the test connector 10 is in contact with the metal part of the probe 11.

[0030] In the above embodiment, the red test plug 9 and the black test plug 9 are inserted into the positive and negative terminals respectively. Then, the two sets of test connectors 10 are fitted onto the upper ends of the two sets of probes 11, connecting the probes 11 to the device body 1. Holding the two sets of test connectors 10 with both hands, the tips of the probes 11 are used to contact the circuit for testing. The core of testing faulty circuits is to measure electrical quantities such as resistance, voltage, and current in the circuit and compare them with normal parameters to determine the fault. The resistance setting uses the internal power supply to measure resistance, determining whether the open circuit resistance is ∞, the short circuit resistance is ≈0, or whether a component is good or bad. The numerical data generated during testing is fed back to the operator through the panel of the device body 1. The voltage setting measures the potential difference in parallel to detect power supply faults and component continuity. The current setting measures the current in series to determine open circuits, overloads, or short circuits. The fault point can be located through abnormal electrical quantities.

[0031] Finally, the following points should be noted: First, in the description of this application, it should be noted that, unless otherwise specified and limited, the terms "installation", "connection", and "linkage" should be interpreted broadly, and can be mechanical or electrical connections, or internal connections between two components, or direct connections. "Up", "down", "left", "right", etc. are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may change.

[0032] Secondly: The accompanying drawings of the embodiments disclosed in this utility model only involve the structures involved in the embodiments disclosed in this utility model. Other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of this utility model can be combined with each other.

[0033] In conclusion, the above are merely preferred embodiments of this utility model and are not intended to limit this utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A rapid troubleshooting probe device for electronic circuit faults, comprising a device body (1), characterized in that: The two sides of the device body (1) are connected to brackets (4) by threaded knobs (3). A limiting ring (5) is fixedly sleeved in the middle position of the device body (1), and sliding grooves (6) are respectively opened on the left and right sides of the upper end of the device body (1), and a protective cover (8) is connected inside the sliding groove (6) through a slider (7). The device body (1) has an opening on the front, and a test plug (9) is movably inserted into the opening. The test plug (9) is fixedly connected to a test connector (10) by a wire, and a probe (11) is movably inserted into the lower end of the test connector (10).

2. The rapid fault diagnosis probe device for electronic circuits according to claim 1, characterized in that: The bottom end of the device body (1) is fixedly equipped with a suction cup (2). There are two sets of suction cups (2), and the two sets of suction cups (2) are symmetrically distributed at the bottom end of the device body (1).

3. The rapid fault diagnosis probe device for electronic circuits according to claim 1, characterized in that: The bracket (4) is configured as a U-shaped structure. There are two sets of brackets (4), and the upper ends of both sets of brackets (4) are rotatably connected to threaded knobs (3), and the threaded knobs (3) are threadedly inserted into the device body (1).

4. The rapid fault diagnosis probe device for electronic circuits according to claim 1, characterized in that: The protective cover (8) is configured as a U-shaped transparent structure. Slider (7) is fixed on the inner walls of the left and right sides of the protective cover (8). The outer dimensions of the slider (7) are adapted to the inner dimensions of the groove (6). The protective cover (8) is connected to the device body (1) by the slider (7).

5. The rapid fault diagnosis probe device for electronic circuits according to claim 1, characterized in that: The socket and test plug (9) are provided in two sets. The two sets of sockets are respectively set as positive sockets and negative sockets. The external colors of the two sets of test plugs (9) are respectively set as red and black. The red test plug (9) is movably inserted into the positive socket, and the black test plug (9) is movably inserted into the negative socket.

6. The rapid fault diagnosis probe device for electronic circuits according to claim 1, characterized in that: The test connector (10) has a copper wire core inside, and a metal part is fixedly inserted at the lower end of the probe (11). When the test connector (10) is sleeved on the upper end of the probe (11), the copper wire core inside the test connector (10) is in contact with the metal part of the probe (11).

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