A connector
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- APTIV ELECTRICAL CENTERS (SHANGHAI) CO LTD
- Filing Date
- 2025-04-29
- Publication Date
- 2026-06-19
AI Technical Summary
In existing technologies, Type-C connectors are prone to damage to the interface of the product under test due to collisions during automated testing, and common single-channel pins require two plug-in/plug-out tests in both directions, resulting in interface wear.
It adopts a buffer connector and switch design. The buffer connector is made of soft material and has two sets of channel pins. The switch controls its selective connection to avoid collision damage and simplify forward and reverse testing.
It effectively reduces damage to the interfaces of the tested products, reduces wear and tear, improves testing efficiency, and simplifies the testing process.
Smart Images

Figure CN224384704U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic device technology, and more specifically to a connector. Background Technology
[0002] In existing technologies, after a product is manufactured, it needs to be tested. This is usually done by connecting the connector of a testing instrument to the interface of the product under test, and then conducting the test. The testing process is generally automated, with the movement of the connector controlled by automated equipment such as cylinders. The connection speed is fast. In order to simulate normal use by users, the connector of the testing instrument is often a common Type-C connector. However, Type-C connectors are usually made of rigid metal, which is very easy to damage the interface or the edge of the interface of the product under test due to collisions, resulting in economic losses.
[0003] Furthermore, most common Type-C connectors on the market are only configured with a single-channel pin. In order to simulate whether the user can use the product under test normally under both forward and reverse mating conditions, it is necessary to perform secondary plugging and unplugging tests, including both forward and reverse, which can cause damage to the product under test due to frequent plugging and unplugging. Utility Model Content
[0004] The purpose of this application is to provide a connector that solves the technical problem in the prior art where the test product is easily damaged due to deviations, collisions with the product interface, and frequent plugging during automated product testing.
[0005] To address the aforementioned technical problems, embodiments of this application disclose the following technical solutions:
[0006] In a first aspect, embodiments of this application provide a connector, including:
[0007] A circuit board having interface circuitry;
[0008] A buffer connector is disposed on the circuit board and electrically connected to the interface circuit, and the buffer connector has a first channel pin and a second channel pin;
[0009] A switch, disposed on the circuit board and electrically connected to the first channel pin and the second channel pin, is configured to control the first channel pin and the second channel pin to selectively connect electrically to an external interface.
[0010] The beneficial effects of this application are: by providing a buffer connector, even if the connector is not aligned with the product interface during the test and a collision occurs, the deformation of the buffer connector can absorb energy and prevent damage to the product under test. In addition, the connector has two sets of channel pins, and the switch can select the channel pins to connect to achieve forward and reverse testing without repeated plugging and unplugging, thus reducing wear and tear on the product interface. Attached Figure Description
[0011] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0012] Figure 1 This is a schematic diagram of the connector structure in an embodiment of this application;
[0013] Figure 2 This is a partially enlarged schematic diagram of the connector's connection joint in an embodiment of this application;
[0014] Figure 3 This is a schematic diagram of the bottom structure of the connector in an embodiment of this application;
[0015] Figure 4 This is a schematic diagram of the interface pins of the product under test in an embodiment of this application;
[0016] Figure 5 This is a schematic diagram of the connector pins of the connector in an embodiment of this application;
[0017] Figure 6 This is a connection diagram of the switcher in an embodiment of this application;
[0018] Figure 7 This is a schematic diagram of the pin connection between the connector and the tested wafer in an embodiment of this application;
[0019] Figure 8 This is a schematic diagram of the pin connection between the connector and the test chip in an embodiment of this application.
[0020] Explanation of reference numerals in the attached drawings: 1. Circuit board; 2. Connector; 201. Connector pin; 202. Connector body; 203. Guide bevel; 204. First channel pin; 205. Second channel pin; 206. First channel configuration pin; 207. First channel data transmission pin; 208. Second channel configuration pin; 209. Second channel data transmission pin; 210. Connecting end; 211. Pin root; 3. Switcher; 4. Housing; 41. Upper housing; 411. First extension; 42. Lower housing; 421. Second extension; 5. Connecting socket; 6. Signal port; 61. First signal port; 62. Second signal port. Detailed Implementation
[0021] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. In addition, it should be understood that the specific embodiments described herein are only for illustration and explanation of this application and are not intended to limit this application. In this application, unless otherwise stated, directional terms such as "up," "down," "left," and "right" generally refer to up, down, left, and right in the actual use or working state of the device, specifically the drawing directions in the accompanying drawings.
[0022] In this application, unless otherwise expressly specified and limited, the terms "connected," "linked," "stacked," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two elements or the interaction between two elements. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0023] Those skilled in the art who applied for this application noted that the product testing process is controlled by automated equipment such as cylinders, resulting in rapid connection speeds. Type-C connectors are typically made of rigid metal and lack a buffer protection structure. During automated, rapid connection, any misalignment can cause the rigid connector to directly impact the interface or edge of the product under test. This can easily lead to deformation or scratches of the interface, and even bending or breaking of the internal pins. For example, automotive products often have light guides around the interface to indicate its location for nighttime use; impacts caused by misalignment can easily damage these light guides and the interface, severely affecting normal product use and causing economic losses.
[0024] Common Type-C connectors are only configured with a single-channel pin, which cannot complete the functional testing of the product under test in both forward and reverse mating conditions in one go. In order to simulate the normal usage scenario of users, it is necessary to perform two plug-in tests in both forward and reverse directions. Frequent plug-in operations will cause additional wear and tear on the interface of the product under test.
[0025] This application provides a deformable buffer connector on the outer surface of the connector, which can absorb impact energy through deformation when impacted, effectively preventing damage such as deformation, scratches, and broken pins to the product interface due to collision.
[0026] Furthermore, the buffer connector of this application can be controlled by a switch to select different channel pins for electrical connection with the product interface, eliminating the need for repeated plugging and unplugging of the connector and reducing the number of frictions between the buffer connector and the product interface.
[0027] The specific implementation methods of this application are illustrated below through examples:
[0028] like Figures 1 to 3 As shown, this application embodiment provides a connector, including:
[0029] Circuit board 1, circuit board 1 has interface circuitry;
[0030] A buffer connector 2 is disposed on the circuit board 1 and electrically connected to the interface circuit. The buffer connector 2 has a first channel pin 204 and a second channel pin 205.
[0031] Switch 3 is disposed on circuit board 1 and electrically connected to first channel pin 204 and second channel pin 205. The switch is configured to control the first channel pin 204 and second channel pin 205 to selectively connect electrically to an external interface.
[0032] Specifically, the buffer connector 2 is made of a soft material. The soft material has a certain degree of hardness and elasticity. In this embodiment, it is preferably made of plastic. While ensuring the structural strength of the buffer connector 2, it can effectively buffer the impact force when the insertion is deviated, reduce the damage to the light guide column of the product interface when the product is automatically inserted, and reduce the scrap rate.
[0033] Specifically, switcher 3 is used to perform channel switching. When simulating different insertion / removal directions (forward and reverse) for user testing, switcher 3 switches between the first channel pin 204 and the second channel pin 205. In this embodiment, when simulating a forward insertion / removal test scenario, switcher 3 connects the first channel pin 204 to the external interface, allowing the test signal to be transmitted to the product under test through the first channel pin 204; when simulating a reverse insertion / removal test scenario, switcher 3 connects the second channel pin 205 to the external interface to achieve reverse testing, avoiding the need for physically repeated insertion / removal operations in existing methods.
[0034] In a specific embodiment of this application, the buffer connector 2 includes an interface body 202 and a guide slope 203. The first end of the guide slope 203 is connected to the side of the interface body 202 away from the circuit board 1, and the second end of the guide slope 203 extends in the direction away from the circuit board 1. The inner side of the guide slope 203 is flush with the inner side of the interface body 202, and the thickness of the guide slope 203 gradually decreases from the first end to the second end.
[0035] Specifically, the buffer connector 2 is tapered near the interface to form a guide slope 203, which serves as a guide when the buffer connector is inserted into the interface of the product under test.
[0036] Specifically, in the embodiments of this application, the outer surface of the guide slope 203 is a plane or a convex curved surface.
[0037] Specifically, the outer surface of the guide slope 203 is a plane. When the outer surface of the plane comes into contact with the interface of the product being tested, it can provide a relatively stable guiding force, so that the buffer connector 2 can be inserted in a relatively fixed direction. It is also simple to process and easy to perform surface treatment.
[0038] Specifically, the outer surface of the guide slope 203 is a convex curved surface, which can better adapt to the interface of the product being tested and can automatically adjust the insertion angle of the buffer connector 2 to a certain extent, thereby enhancing the guiding effect.
[0039] In a specific embodiment of this application, the connection between the first end of the guide slope 203 and the interface body 202 is a smooth chamfer.
[0040] When the buffer connector is inserted into the interface of the product under test, if the connection point has sharp edges and corners, it may scratch the inner wall of the interface of the product under test or other components. The rounded chamfer structure of this embodiment allows the buffer connector to enter the product interface more smoothly during the insertion process, avoiding additional damage to the product under test.
[0041] Furthermore, in the injection molding process of buffer joints, the design of rounded chamfers is easier to achieve in the mold than sharp edges, and the mold manufacturing process is simpler.
[0042] In a specific embodiment of this application, the longitudinal section of the buffer connector 2 is a centrally symmetrical shape, and the first channel pin 204 and the second channel pin 205 are centrally symmetrically arranged with respect to the geometric center of the longitudinal section of the buffer connector 2.
[0043] Specifically, taking an automotive product as an example, the function of an automotive product includes providing mobile phone charging. Typically, the product interface is set to a universal Type-C interface. In this embodiment, the buffer connector 2 is also a Type-C connector. The longitudinal section of the buffer connector 2 is oval-shaped. To simulate both forward and reverse connection scenarios during user use, the first channel pin 204 and the second channel pin 205 are symmetrically arranged, working in conjunction with the switcher 3 to simulate both connection scenarios. During forward testing, the switcher 3 selects the first channel pin 204 to connect to the product interface; during reverse testing, it switches to the second channel pin 205. This eliminates the need for physically flipping the connector, simplifying the testing process, improving testing efficiency, and avoiding product damage caused by repeated plugging and unplugging.
[0044] In specific embodiments of this application, such as Figure 4 and Figure 5 As shown, the first channel pin 204 includes a first channel configuration pin 206 and a first channel data transmission pin 207 distributed on the top of the inner side of the buffer connector 2; the second channel pin 205 includes a second channel configuration pin 208 and a second channel data transmission pin 209 distributed on the bottom of the inner side of the buffer connector 2.
[0045] Specifically, Figure 4 The image shows the Type-C interface of the product under test. According to the Type-C protocol, the Type-C interface has a total of 24 interface pins, namely J1A1~J1A12 and J1B1~J1B12. The functions of the interface pins are shown in Table 1 below.
[0046]
[0047]
[0048] Table 1
[0049] As can be seen, the functions and positions of the two sets of pins J1A1~J1A12 and J1B1~J1B1 of the Type-C interface of the product under test are centrally symmetrical. In this application, the connector pins 201 of the buffer connector 2 have 24 interface pins, namely J2A1~J2A12 and J2B1~J2B12. The functions of connector pins 2 are as follows:
[0050] As shown in Table 2,
[0051]
[0052] Table 2
[0053] Among them, pin J2A5 is the first channel configuration pin 206, pins J2A6 and J2A7 are the first channel data transmission pins 207; pin J2B5 is the second channel configuration pin 208, pins J2B6 and J2B7 are the second channel data transmission pins 209.
[0054] The Type-C communication protocol specifies that the Type-C connector only needs to have a single-channel pin to achieve communication in both forward and reverse Type-C interface scenarios. Therefore, the commonly used Type-C connectors on the market only have a single-channel pin. When users use such Type-C connectors to plug into the Type-C interface, a stable connection with the single-channel pin can be achieved regardless of whether the interface pins are plugged in forward or reverse. However, in order to verify whether the user's forward and reverse plugging can be used normally in the test product, forward and reverse plugging tests must be performed. Therefore, if the commonly used Type-C connector is used in the test process, it is necessary to perform forward and reverse plugging and unplugging twice, which will cause additional wear and tear on the interface of the product under test.
[0055] In this application, as shown in Table 2 and Figure 5 As shown, this application adds an extra set of channel pins compared to the prior art. The switch 3 is used to perform the channel switching function. When simulating the user's forward and reverse plugging and unplugging test, the switch 3 switches between the first channel pin 204 and the second channel pin 205. When simulating the forward plugging and unplugging test scenario, the switch 3 connects the first channel pin 204 to the external interface; when simulating the reverse plugging and unplugging test scenario, the switch 3 connects the second channel pin 205 to the external interface to realize the reverse test and avoid the physical repeated plugging and unplugging operation required in the existing method.
[0056] In a specific embodiment of this application, an outer shell 4 is also included. The outer shell 4 includes an upper shell 41 disposed on the upper surface of the circuit board 1 and a lower shell 42 disposed on the lower surface of the circuit board 1. The upper shell 41 has a first extension 411 extending toward the lower shell 42 at one end near the buffer connector 2. The lower shell 42 has a second extension 421 extending toward the upper shell 41 at one end near the buffer connector 2. The end faces of the first extension 411 and the second extension 421 are in contact with each other and surround each other to form an interface hole for accommodating the buffer connector 2.
[0057] Specifically, the outer casing 4 is used to protect the circuit board 1. The outer casing 4 is formed by splicing an upper casing 41 and a lower casing 42. The first extension 411 of the upper casing 41 and the second extension 421 of the lower casing 42 enclose an interface hole to accommodate the buffer connector 2.
[0058] In a specific embodiment of this application, the side of the outer casing 4 is flush with the side of the circuit board 1.
[0059] Specifically, the four sides of the outer casing are flush with the side of the circuit board 1 to make the connector's shape regular, making it easy to clamp and place.
[0060] In a specific embodiment of this application, the circuit board 1 has a positioning hole on its side, and the outer casing 4 has a mounting hole corresponding to the positioning hole. The outer casing 4 is detachably connected to the circuit board 1 through a fixing component that passes through the positioning hole and the mounting hole.
[0061] Specifically, by disassembling the fixing components, such as screws, the housing 4 can be separated from the circuit board 1, making it easier to modify the circuit board components.
[0062] In a specific embodiment of this application, a connecting connector 5 is also included, which is located below the side of the circuit board 1 away from the buffer connector 2.
[0063] Specifically, the connector 5 is used to connect the test instrument, enabling the test instrument to connect with the test product to transmit test signals. If the buffer connector 2 collides and deforms with the product under test during the test, the low-cost connector can be directly replaced to protect the higher-cost product under test.
[0064] In a specific embodiment of this application, a signal interface 6 for receiving external control signals is also included, which is disposed on the circuit board 1 and connected to the switch 3.
[0065] In a specific embodiment of this application, the signal interface 6 includes a first signal interface 61 and a second signal interface 62 located on the side of the switch 3. The first signal interface 61 is connected to a first control signal for driving the first channel pin 204 to be electrically connected or disconnected from the interface circuit. The second signal interface 62 is connected to a second control signal for driving the second channel pin 205 to be electrically connected or disconnected from the interface circuit. The control signals include the first control signal and the second control signal.
[0066] Specifically, such as Figure 6 , Figure 7 and Figure 8 As shown, the interface pins (J1A1~J1A12, J1B1~J1B12) of the product under test are connected to the connector pins 201 (J2A1~J2A12, J2B1~J2B12) of the buffer connector 2. Among them, J1A5, J1A6, and J1A7 are the first channel pins 204, and J1B5, J1B6, and J1B7 are the second channel pins 205. They are controlled by the switch 3 and selectively electrically connected to the interface pins of the product under test. Through the first control signal transmitted through the first signal interface 61, the switch 3 selects the first channel pin 204 to connect or disconnect from the external interface, which is equivalent to plugging and unplugging the Type-C connector of the product under test in the forward direction to perform a forward test. Through the second control signal transmitted through the second signal interface 62, the switch 3 selects the second channel pin 205 to connect or disconnect from the external interface, which is equivalent to plugging and unplugging the Type-C connector of the product under test in the reverse direction to perform a reverse test.
[0067] In a specific embodiment of this application, the connector pin 201 of the buffer connector 2 includes a connection end 210 for docking with an external interface and a pin root 211 connected to the connection end 210. The connection end 210 has a flat rectangular surface with rounded chamfers at the edges. The end of the pin root 211 away from the connection end 210 is connected to the interface circuit.
[0068] Existing Type-C connectors typically have pins with raised dots at both ends. The raised dots on the pins are inserted into corresponding recesses inside the interface of the product under test to increase the stability of the connection. However, during automated testing, due to the high connection speed, the raised dots on the pins can damage the product under test when they are quickly inserted / removed. Therefore, this application eliminates the traditional pin setting and sets the connection surface of the connection end 210 to a flat rectangular surface to ensure a smooth connection process and reduce damage to the product under test during rapid connection.
[0069] The connector provided in this application has been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.
Claims
1. A connector, characterized in that, include, Circuit board (1), said circuit board (1) having interface circuitry; A buffer connector (2) is disposed on the circuit board (1) and electrically connected to the interface circuit. The buffer connector (2) has a first channel pin (204) and a second channel pin (205). A switch (3) is disposed on the circuit board (1) and electrically connected to the first channel pin (204) and the second channel pin (205). The switch is configured to control the first channel pin (204) and the second channel pin (205) to selectively connect electrically to an external interface.
2. The connector according to claim 1, characterized in that, The buffer connector (2) includes an interface body (202) and a guide slope (203). The first end of the guide slope (203) is connected to the side of the interface body (202) away from the circuit board (1). The second end of the guide slope (203) extends in the direction away from the circuit board (1). The inner side of the guide slope (203) is flush with the inner side of the interface body (202). The thickness of the guide slope (203) gradually decreases from the first end to the second end.
3. The connector according to claim 2, characterized in that, The outer surface of the guide slope (203) is a plane or a convex curved surface.
4. The connector according to claim 2, characterized in that, The first end of the guide slope (203) is connected to the interface body (202) at a smooth chamfer.
5. The connector according to claim 1, characterized in that, The longitudinal section of the buffer connector (2) is a centrally symmetrical figure, and the first channel pin (204) and the second channel pin (205) are centrally symmetrically arranged with respect to the geometric center of the longitudinal section of the buffer connector (2).
6. The connector according to claim 1, characterized in that, The first channel pin (204) includes a first channel configuration pin (206) and a first channel data transmission pin (207) distributed on the top of the inner side of the buffer connector (2); the second channel pin (205) includes a second channel configuration pin (208) and a second channel data transmission pin (209) distributed on the bottom of the inner side of the buffer connector (2).
7. The connector according to claim 1, characterized in that, It also includes an outer shell (4), which includes an upper shell (41) disposed on the upper surface of the circuit board (1) and a lower shell (42) disposed on the lower surface of the circuit board (1). The upper shell (41) has a first extension (411) extending toward the lower shell (42) at one end near the buffer connector (2), and the lower shell (42) has a second extension (421) extending toward the upper shell (41) at one end near the buffer connector (2). The end faces of the first extension (411) and the second extension (421) are in contact and enclose each other to form an interface hole for accommodating the buffer connector (2).
8. The connector according to claim 7, characterized in that, The side of the outer casing (4) is flush with the side of the circuit board (1).
9. The connector according to claim 7, characterized in that, The circuit board (1) has a positioning hole on its side, and the outer shell (4) has a mounting hole corresponding to the positioning hole. The outer shell (4) is detachably connected to the circuit board (1) through a fixing component that passes through the positioning hole and the mounting hole.
10. The connector according to claim 1, characterized in that, It also includes a connecting connector (5), which is located below the circuit board (1) on the side away from the buffer connector (2).
11. The connector according to claim 1, characterized in that, It also includes a signal interface (6) for receiving external control signals, which is located on the circuit board (1) and connected to the switch (3).
12. The connector according to claim 11, characterized in that, The signal interface (6) includes a first signal interface (61) and a second signal interface (62) located on the side of the switch (3). The first signal interface (61) is connected to a first control signal for driving the first channel pin (204) to be electrically connected or disconnected from the interface circuit. The second signal interface (62) is connected to a second control signal for driving the second channel pin (205) to be electrically connected or disconnected from the interface circuit. The control signal includes the first control signal and the second control signal.
13. The connector according to claim 1, characterized in that, The connector pin (201) of the buffer connector (2) includes a connection end (210) for docking with an external interface and a pin root (211) connected to the connection end (210). The connection end (210) has a flat rectangular surface with rounded chamfers at the edges. The end of the pin root (211) away from the connection end (210) is connected to the interface circuit.