Calibration target for optical sensor
The calibration target with high diffuse reflectivity and emissivity patterns addresses the challenge of achieving precise and noise-reduced images for infrared cameras, enhancing industrial non-destructive testing accuracy.
Patent Information
- Application Number
- FR2024003959
- Authority / Receiving Office
- FR · FR
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-04-16
- Publication Date
- 2025-10-17
- Estimated Expiration
- 2044-04-16
AI Technical Summary
Existing calibration targets for infrared cameras, particularly for industrial applications, face challenges in achieving high-contrast images with minimal noise, especially on small-sized targets, leading to imprecise positioning and increased operational costs due to complex assembly and digital processing requirements.
A calibration target with a first zone having a reflectivity factor of at least 94% diffuse reflection and a second zone with an emissivity factor of at least 50% in the medium to long infrared spectrum, featuring a pattern of unitary patterns, such as circular shapes, to enhance precision and reduce noise in images.
The solution provides high-contrast images with reduced noise, enabling precise camera positioning and efficient image assembly, thereby improving the accuracy of non-destructive testing operations.