Calibration target for optical sensor

The calibration target with high diffuse reflectivity and emissivity patterns addresses the challenge of achieving precise and noise-reduced images for infrared cameras, enhancing industrial non-destructive testing accuracy.

FR3161290A1Active Publication Date: 2025-10-17SAFRAN SA
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Patent Information

Application Number
FR2024003959
Authority / Receiving Office
FR · FR
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-04-16
Publication Date
2025-10-17
Estimated Expiration
2044-04-16

AI Technical Summary

Technical Problem

Existing calibration targets for infrared cameras, particularly for industrial applications, face challenges in achieving high-contrast images with minimal noise, especially on small-sized targets, leading to imprecise positioning and increased operational costs due to complex assembly and digital processing requirements.

Method used

A calibration target with a first zone having a reflectivity factor of at least 94% diffuse reflection and a second zone with an emissivity factor of at least 50% in the medium to long infrared spectrum, featuring a pattern of unitary patterns, such as circular shapes, to enhance precision and reduce noise in images.

Benefits of technology

The solution provides high-contrast images with reduced noise, enabling precise camera positioning and efficient image assembly, thereby improving the accuracy of non-destructive testing operations.

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Abstract

TITLE: Calibration target for optical sensor The present disclosure relates to a calibration target (1) comprising a face (10) comprising a first zone (11) and a second zone (12), the first zone (11) being defined by a pattern configured to be detectable by a camera (2), the first zone comprising a reflectivity factor of at least 94% for which at least 90% of the reflection is diffuse, the second zone comprising an emissivity factor of at least 50% for an emission wavelength range of between 2 and 12 µm. Figure 1
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