Abnormality detection device, power supply system, and abnormality detection method

The abnormality detection device and method provide transparent and accurate detection of secondary battery abnormalities by processing voltage data to calculate anomaly degrees, addressing the limitations of existing methods and ensuring reliability in critical applications.

JP7647935B2Active Publication Date: 2025-03-18MURATA MFG CO LTD
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Patent Information

Application Number
JP2023570724
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Priority Date
2021-12-28
Filing Date
2022-11-16
Publication Date
2025-03-18
Estimated Expiration
2042-11-16

AI Technical Summary

Technical Problem

Existing abnormality detection methods for secondary batteries, such as those using neural networks, lack transparency and accuracy, making it difficult to trust detection results, especially in critical applications where safety and economic judgments are involved.

Method used

The proposed solution involves an abnormality detection device and method that includes a voltage measuring unit, a voltage holding unit, a feature amount calculation unit, a data set holding unit, and an abnormality calculation unit. This system measures and processes voltage data to calculate feature amounts sensitive to voltage spike waveforms, allowing for the calculation of an anomaly degree using data sets from normal secondary batteries, thereby detecting abnormalities without relying on black box techniques.

Benefits of technology

This approach enables transparent and accurate detection of abnormalities in secondary batteries due to small short circuits, allowing users to understand the basis for detection and making it suitable for applications requiring high reliability and safety.

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Abstract

An abnormality detection device according to one embodiment of the present technology is provided with a voltage retention unit, a feature quantity calculation unit, a dataset retention unit, and a degree-of-abnormality calculation unit. The voltage retention unit retains at least one voltage value from among a maximum value and a minimum value for each fixed time for measured voltage. The feature quantity calculation unit processes the voltage value retained by the voltage retention unit to calculate a feature quantity which is sensitive to a voltage spike waveform. The dataset retention unit retains a dataset obtained from a normal secondary cell. The degree-of-abnormality calculation unit uses the dataset read from the dataset retention unit to calculate the degree of abnormality of the feature quantity calculated by the feature quantity calculation unit.
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