Semiconductor Device
By adopting a three-layer structure semiconductor device and connecting technology through silicon cores, the problem of excessive electrical connection in stacked semiconductor devices is solved, and more efficient signal transmission and equipment performance is achieved.
Patent Information
- Application Number
- JP2022014950
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2022-02-02
- Publication Date
- 2025-04-07
- Estimated Expiration
- 2035-12-11
AI Technical Summary
In a stacked semiconductor device, the electrical connection between the two semiconductor substrates becomes too long, affecting the performance and efficiency of the device.
The semiconductor device adopting a three-layer structure realizes electrical connection between the three-layer semiconductor substrates through a silicon core (TSV). The specific steps include: first combining the first and second semiconductor substrates together by bonding or other methods, and thinning the second semiconductor substrate; then combining the third semiconductor substrate with the second semiconductor substrate, and thinning the third semiconductor substrate; finally forming an electrical signal through the silicon core through the silicon core and connecting the three-layer semiconductor substrate through a photolithography and plasma etching technology.
Through the three-layer structure and the design through the silicon core, the length of electrical connections in semiconductor devices is significantly shortened, and the efficiency of signal transmission and the overall performance of the device are improved.