Test system, method, and apparatus

By configuring preset NV parameters for different hardware and selecting target NV parameters that meet preset conditions in production tests, the problem that NV parameters in traditional technology are difficult to cover different supplier devices, and the consistency of RF performance and production efficiency are improved.

WO2025066738A1 Publication Date: 2025-04-03K TRONICS (SUZHOU) TECH CO LTD +1
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Patent Information

Application Number
PCT/CN2024/114753
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-09-28
Filing Date
2024-08-27
Publication Date
2025-04-03

AI Technical Summary

Technical Problem

Traditional single NV parameters are difficult to cover the same RF device provided by different suppliers, resulting in discrete test data of individual indicators in RF comprehensive testing, high miscalculation rate, and seriously affecting production efficiency.

Method used

By setting corresponding NV parameters for different hardware configurations in advance, during the production test, the target NV parameters that meet the preset conditions are selected according to the first index test value of the device to be tested when applying different NV parameters, thereby determining the final selected NV parameters.

Benefits of technology

It solves the problems of large differences in RF performance and high miscalculation rates caused by RF devices provided by different suppliers, improves RF performance consistency, reduces the energy consumption of cycle tests caused by miscalculation of the production line, and improves production efficiency.

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Abstract

The present invention relates to the field of device inspection, and provides a test system, method, and apparatus. According to embodiments of the present invention, multiple sets of different NV parameters are stored in a memory of a device to be tested. The NV parameters are used for configuring radio frequency signals transmitted by a wireless communication chip of said device. The radio frequency signals are sent out by means of a plurality of radio frequency devices of the device to be tested. In a production test process, the device to be tested is controlled by means of a controller to apply different NV parameters, to acquire corresponding first indicator test values of the device when applying the different NV parameters, and to select a target NV parameter when a first indicator test value satisfies a preset condition, thereby solving the problem of large differences in the radio frequency performance of devices to be tested due to the use of radio frequency devices provided by multiple different suppliers, and improving the consistency of the radio frequency performance of the devices to be tested.
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