Diode Testing TRIZ Cases
- Display Module LED Repair Using Continuous Laser Transfer
Missing LEDs are detected and replaced by continuous laser transfer between moving substrates, restoring display quality without slowing production.
- Driving Circuit Board Inspection Using Blockwise Defect Localization
Blockwise first-pass inspection plus targeted circuit recheck helps isolate backplane faults from micro LED substrate issues faster.
- MicroLED Detection Line Layout for Batch Yield Testing
Intersecting shared signal lines enable batch testing of MicroLED light-emitting elements, improving yield assessment with lower line count and cost.
- Display Test Element Structure for Contact Resistance Detection
A layered test element measures contact resistance during display fabrication, helping detect micro-LED defects without complicating production.