Driving Circuit Board Inspection Using Blockwise Defect Localization
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Solution Overview
Problem
Existing display technologies face challenges in identifying whether issues in micro LED displays are due to the backplane or the light-emitting device substrate, as current inspection methods are inefficient and cannot distinguish between the two components.
Innovation Solution
A driving circuit board with an inspection function that includes a driving circuit array and processors to control inspections, allowing for the division of circuits into blocks, first and second inspections, and selection of additional inspection circuits based on initial results to identify operational issues.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If inspection is performed on all driving circuits simultaneously, then inspection completeness is improved, but inspection time increases significantly
Solution Approach 1:
The driving circuit array is divided into multiple blocks, and inspection is performed on each block separately rather than all circuits simultaneously. This segmentation allows the inspection process to be completed more efficiently while maintaining completeness, as each block can be inspected independently and systematically.
Solution Approach 2:
The inspection process is performed in periodic stages: first inspection of all blocks to identify defective regions, followed by second inspection of specific circuits within those regions. This periodic approach ensures thorough coverage while minimizing total inspection time through structured phasing.
2Measurement precision
If detailed inspection is performed on all driving circuits, then defect detection accuracy is improved, but inspection complexity increases
Solution Approach 1:
Different inspection depths are applied to different regions: blocks identified as defective receive detailed second inspection, while normal blocks receive only brief first inspection. This local differentiation of inspection quality ensures high defect detection accuracy where needed while reducing overall complexity.
Solution Approach 2:
Instead of performing full detailed inspection on all circuits, the patent applies partial inspection (first inspection) to all blocks and excessive/detailed inspection (second inspection) only to defective regions. This selective approach maintains high detection accuracy for problematic areas while avoiding unnecessary complexity in normal areas.
3Loss of information
If inspection is performed on individual circuits separately, then problem localization is improved, but total inspection time increases
Solution Approach 1:
The inspection process segments circuits into blocks and further segments the inspection into two stages. This hierarchical segmentation enables efficient problem localization by first identifying defective blocks, then pinpointing specific circuits within those blocks, achieving precise localization without inspecting every circuit individually from the start.
Solution Approach 2:
The first inspection serves as a preliminary action that quickly identifies defective blocks before the more time-consuming second inspection is applied. This preliminary screening action enables efficient problem localization by narrowing down the search space to only those blocks that require detailed examination.
Data Source
AI summary
Provided are a driving circuit board having an inspection function, a display apparatus including a driving circuit board having an inspection function, and a method of controlling inspection of a driving circuit board having an inspection function. The driving circuit board includes a driving circuit array including a plurality of driving circuits and at least one processor configured to control inspection on the plurality of driving circuits in an inspection mode, in which the at least one processor is further configured to divide the driving circuit array into one or more blocks, control first inspection to inspect an operation of the plurality of driving circuits in units of the one or more blocks, select an additional inspection driving circuit, based on a result of the first inspection, and control second inspection to inspect an operation of the additional inspection driving circuit.