Pre-computed row compensation factors adjust individual beam doses to resolve substrate dose inhomogeneities caused by aperture variations.
Remote plasma forms an oxide layer on low-k spacers, enabling selective fluorine etching that preserves the channel structure.
A single rotary valve unit replaces multiple components to reduce apparatus complexity while enhancing durability and operating speed.
Lateral sputter gun offset prevents substrate contamination while maintaining high deposition rates for magnetic tunnel junctions.
Non-line-of-sight deposition applies erbium ceramic coatings to chamber components, resolving uniformity issues on high aspect ratio surfaces.