Electrical Testing TRIZ Cases
- Cryogenic Device Impedance Measurement With Path Calibration
Transmission-path characterization and resistor-based voltage sensing compensate for mismatches when measuring cryogenic DUT impedance.
- Battery Monitoring Circuit Compensation for Shared-Wire Resistance
Two voltage measurements with a switchable load reveal shared-path resistance, enabling accurate cell-voltage calculations with fewer wires.
- Safety Protection Circuit Self-Diagnosis With Error Injection
Error injection and stored-data checks let a diagnosis module identify safety-circuit faults with simple hardware and support normal chip operation.
- Integrated Circuit Tap Cell Placement for Latch-Up Prevention
See how EDA floorplan analysis places tap cells at potential latch-up locations to protect integrated circuits without wasting area or degrading timing.
- Scan-Enable Data Gating in Flip-Flops to Reduce Latch Toggling
Clock gating can leave primary latches toggling; scan-controlled data gating holds flip-flop inputs constant to cut dynamic power.
- Fuel Cell Aging Prediction Using Voltage, Active Area, Hydrogen Permeation
Single aging measures miss internal material loss; combining stack voltage, active area, and hydrogen permeation current improves fuel cell aging prediction.
- Electrochemical Measurement Circuitry for Single-Supply Biasing
Varying working and counter electrode bias voltages within one supply range avoids voltage doublers, lowering power and circuit complexity.
- Load-Sense Transistor Arrangement for Current Ratio Accuracy
Parasitic effects can distort the load-to-sense current ratio as the sense transistor shrinks; differentiated source resistance preserves accuracy.