Full image simulation estimates EELS aberration parameters in milliseconds, automating spectrometer tuning and reducing setup effort.
Simulated spectrum fitting lets an EELS spectrometer estimate aberrations and retune optical elements in milliseconds without expert setup.
Segmented quadrupole control in an EELS/EFTEM module cuts aberrations, enabling wider energy-range spectra with less specimen damage.
Block segmentation and representative part comparison in mass spectrometers cuts auto-tuning duration while maintaining measurement precision.