Investigating Crystals TRIZ Cases

Two metal layers with different melting or heat properties turn a tiny laser spot's energy distribution into visible marks for process matching.

Directional dark-field imaging plus photoluminescence separates crystalline defects from particles and scratches in off-axis monocrystalline substrates.

Microscope-based crystal recognition pinpoints the evaporation endpoint in ammonia-nitrogen wastewater, improving salt separation purity and energy use.

Directional reflectance microscopy extracts local 3D grain orientation from surface reflection patterns without EBSD vacuum complexity.

Directional reflectance microscopy extracts 3D grain orientation from reflected light patterns without X-ray or vacuum-based equipment.

Low BPVE photocurrent in tin selenide is addressed with diamond-anvil pressure, an insulated gasket, and platinum electrodes.

Dual spatial filters capture distinct optical images to isolate defect signals, preventing signal loss when blocking diffracted light from circuit patterns.

Dual optical stages separate potential pits from other defects using brightness analysis, resolving the trade-off between detection accuracy and throughput.

Segmenting pump and probe stages narrows the point spread function, overcoming the diffraction barrier in silicon metrology.

A motorized imaging system captures high-resolution gemstone images from multiple angles and depths.