Infrared camera array measures paper quality parameters using LED light sources for whole-width detection.
A medium passage detection device uses an S-wave-extracting unit to separate polarized light components from an obliquely emitted beam.
An optical collar detects rod position via light absorption, eliminating magnetic switch limitations and relay circuits.
Dual integrating spheres transmit light through a sheet target to detect intensity without reflected light interference.
A unique contour curve configuration divides the passing region into quadrilateral minute regions with varying widths to generate precise frequency signals.
A handheld optical scanner captures 3D spatial data to calculate precise cubic volumes of complex objects.
A removable blocking device partially obstructs radiation at the detection module aperture to identify positional deviations between sensor components.
Segmented outline targets project discrete images for precise surface reflection detection and optical power computation.
Binning matrix camera pixels reduces bit flow while strobe lighting synchronizes with imaging periods to lower noise and improve detection precision.
Optical measurement system verifies wafer cassette dimensions using infrared light, eliminating manual alignment errors and preventing wafer damage.
A millimeter wave sensor uses heterodyne mixing to detect physical dimensions of dielectric materials.