Resistance/Reactance/Impedence TRIZ Cases
- Semiconductor Faulty Point Detection via Thermal Resistance Measurement
A charged particle beam locally heats a semiconductor circuit while a probe measures the resulting resistance change to identify faulty points.
- VNA Spur Elimination via Dynamic Null Selection
Dynamic null positioning targets spurs during frequency sweeps, improving measurement precision without increasing test time.
- Shaft Axial Movement Detection Using Conductive Sliding Contact
A sliding contact arrangement detects shaft axial displacement via electrical circuit closure between conductive surfaces.
- Conductive Fabric Seal for Tamper Detection
A conductive fabric seal monitors electrical resistance changes to detect physical tampering on encapsulated articles.
- Capacitive Humidity Sensor Temperature Dependency Reduction
Segmenting the detecting and reference portions reduces temperature dependency while maintaining response performance.
- Battery Internal Resistance Measurement via Voltage Slope Detection
A battery internal resistance measuring device calculates voltage slopes to identify discharge boundaries for accurate open-circuit and short-circuit voltage extraction.
- Base Station Standing Wave Detection Using Digital Domain Power Values
Calculate standing wave ratio using existing variable gain circuit and reverse coupler data, eliminating dedicated detection hardware costs.
- Passive Resonator Reflections for Transmission Line Delay Measurement
Passive resonators create impedance mismatch reflections to measure propagation delay, correcting time signals in power systems without active equipment.