Scanning Probe Microscopy TRIZ Cases
- Rotary Probe Switching Device for Environment-Controlled AFM
Piezoelectric rotary stage switches probes inside sealed atomic force microscope chambers, preventing sample contamination from environmental exposure.
- Collocated Piezoelectric Actuator-Sensor Pair for AFM Cantilevers
Segmenting the transducer into separate actuator and sensor layers eliminates electrical feedthrough, enabling accurate dynamic response measurement.
- Integrated Dual-Probe Atomic Force Microscope for Rapid In-Situ Switching
Piezoelectric-driven cantilevers switch probes within 10 seconds, reducing replacement time while maintaining micron-level positioning accuracy.
- Separable AFM Probe Tips via Conformable Pad
Van der Waals adhesion allows rapid probe tip replacement without recalibration offsets.