Short-Circuit Testing TRIZ Cases
- Single-Pad Current Measurement Architecture for On- and Off-Current Testing
Parallel transistor branches let one pad measure on- and off-current, reducing pad count and silicon area in fabrication testing.
- Compact Polyphase Current Sensor with Mechanically Uncoupled Sensing
A magnetic core guides fields from multiple conductors to an uncoupled sensor, improving compact polyphase fault detection.
- Uncoupled Magnetic Core Current Sensing for Polyphase Fault Detection
A magnetic core guides combined fields from multiple conductors to an uncoupled sensor for stable polyphase fault detection.