Using Optical Means TRIZ Cases
- Pseudo-Inertial Light Reference for Vibration Isolation
A passive pseudo-inertial light reference decouples from platform vibrations via elastomeric supports to stabilize optical line-of-sight measurements.
- Integrated Illumination Apparatus for Depth Mapping
An integrated illumination apparatus uses a single micro lens array with distinct radiation-emitting element arrangements to generate both structured light patterns and flood illumination beams.
- Adaptive Filter for Lithography Metrology Noise Suppression
An adaptive filter calculates multiple correction values based on distinct coefficients to manage measurement noise in lithography metrology systems.
- Light Microscope Depth Resolution via Tapered Illumination
Tapered illumination replaces mechanical z-scanning with optical depth resolution, enabling wide-field imaging without complex moving parts.
- Continuous Scanning Height Map Generation Using Spatial Periodic Pattern
Synchronized pattern movement and scanning speed resolve the trade-off between measurement precision and productivity.