2D Material Semiconductor Devices Epitaxial Growth

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Solution Overview

Problem

Current methods for forming two-dimensional (2D) material layers in semiconductor devices are inefficient, particularly in forming high-quality 2D material layers for improved performance in transistors, such as photo-transistors, which lack the sensitivity and efficiency provided by 2D material layers like graphene and transition metal dichalcogenides.

Innovation Solution

The process involves a metal catalyst-free chemical vapor deposition (CVD) method to epitaxially grow one or more 2D material layers, including graphene and transition metal dichalcogenides, directly on a substrate, ensuring superior crystalline quality and uniformity, and forming hetero-structures by alternating these layers to enhance transistor performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional methods are used to form 2D material layers, then the manufacturing process is simpler, but the crystalline quality and uniformity of the 2D material layers are insufficient

Engineering Contradiction:
Improvecrystalline quality and uniformity of 2D material layersVSAvoidmanufacturing process complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

A metal catalyst layer is introduced as an intermediary substrate to facilitate the epitaxial growth of high-quality 2D material layers. The catalyst layer serves as a mediator that enables controlled deposition and crystalline growth, achieving superior manufacturing precision while maintaining process feasibility through a defined sequence of deposition and removal steps.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The metal catalyst layer is deposited in advance before the actual 2D material growth. This preliminary action prepares the substrate surface with appropriate crystallographic orientation and catalytic properties, ensuring that subsequent 2D material layers achieve high crystalline quality and uniformity during the epitaxial growth process.

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If metal catalysts are used to grow 2D material layers, then the growth rate and quality improve, but chemical contamination is introduced

Engineering Contradiction:
Improve2D material layer qualityVSAvoidchemical contamination
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The metal catalyst layer is removed after serving its purpose during epitaxial growth. This extraction eliminates the source of chemical contamination from the final device structure, while the beneficial effect of catalyzed growth remains embedded in the high-quality 2D material layers that were formed during the growth process.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The metal catalyst layer is discarded after completing its function as a growth catalyst. The process recovers the benefit of catalyzed epitaxial growth (high-quality 2D materials) while discarding the harmful element (metal contamination), achieving a clean final structure without compromising material quality.

Inventive Principle:
Principle #34Discarding and recovering

3Reliability

If 2D material layers are not used in transistors, then the device structure is simpler, but the sensitivity and performance (especially under light illumination) are reduced

Engineering Contradiction:
Improvetransistor sensitivity and performanceVSAvoiddevice structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The transistor structure is modified by incorporating 2D material layers with specific optical and electrical properties. This parameter change in material composition enhances light absorption, carrier mobility, and overall device sensitivity, while the layered structure maintains compatibility with conventional transistor architectures to limit complexity increases.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The transistor is constructed using composite material layers including 2D materials (such as graphene or transition metal dichalcogenides) combined with conventional semiconductor materials. This composite approach leverages the superior optical and electrical properties of 2D materials to enhance transistor performance and sensitivity while maintaining structural organization similar to conventional devices.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in semiconductor devices with improved sensitivity and performance, as demonstrated by high hole mobility values and significant current-voltage characteristics, particularly under illuminated conditions, while minimizing chemical contamination and physical damage during the growth process.

Implementation Method 1

metal catalyst-free chemical vapor deposition (CVD) method to epitaxially grow one or more 2D material layers

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Implementation Method 2

epitaxially grow one or more 2D material layers, including graphene and transition metal dichalcogenides

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Data Source

PatentUS10157737B2Semiconductor devices comprising 2D-materials and methods of manufacture thereof
Publication Date: 2018.12.18 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10157737B2 patent drawing
  • US10157737B2 patent drawing
  • US10157737B2 patent drawing

AI summary

Semiconductor devices comprising two-dimensional (2D) materials and methods of manufacture thereof are described. In an embodiment, a method for manufacturing a semiconductor device comprising 2D materials may include: epitaxially forming a first 2D material layer on a substrate; and epitaxially forming a second 2D material layer over the first 2D material layer, the first 2D material layer and the second 2D material layer differing in composition.