2D Optical Imaging for Particle Detection
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Solution Overview
Problem
Current optical particle counters face challenges in accurately detecting and characterizing particles smaller than 0.1 microns due to false counts caused by detector noise and signals from non-particle sources, which impede sensitivity and accuracy.
Innovation Solution
A two-dimensional optical imaging-based system generates distinctive particle detection signatures through optical scattering or emission, distinguishing particle signals from background noise and non-particle sources by using threshold-dependent detection, allowing for real-time analysis and filtering of output data from a two-dimensional detector.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional point-based optical particle counters are used to detect particles smaller than 0.1 microns, then detection capability is improved, but false counts from detector noise and non-particle signals increase
Solution Approach 1:
The patent transitions from conventional point-based detection to two-dimensional imaging detection. By using a 2D detector array to capture spatial distribution of scattered light, the system can distinguish particle signals from background noise and non-particle sources based on their spatial characteristics, thereby reducing false counts while maintaining sensitivity for small particles
Solution Approach 2:
The detection system is segmented into multiple detector elements arranged in a two-dimensional array. Each detector element captures light scattering information from specific spatial regions, allowing the system to analyze the spatial pattern of signals and differentiate between true particle detections and false counts from noise or non-particle sources
2Measurement precision
If detection sensitivity is increased to detect smaller particles, then particle sizing capability is improved, but false counts from detector noise increase
Solution Approach 1:
By adding the spatial dimension through 2D imaging, the system can reject false counts from detector noise by analyzing the spatial distribution pattern of signals. True particle detections exhibit characteristic spatial patterns that differ from random noise, allowing the system to maintain high sensitivity for small particles while filtering out noise-related false counts
Solution Approach 2:
The two-dimensional spatial distribution pattern acts as an intermediary characteristic that mediates between the raw detector signals and the final particle detection decision. This spatial pattern analysis serves as an additional criterion that must be satisfied for a detection to be confirmed, thereby reducing false counts from noise while preserving true particle detections
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces false counts, enhances detection sensitivity, and enables accurate characterization of particles with smaller physical dimensions, improving the accuracy and reliability of particle counting and sizing measurements.
Implementation Method 1
detecting at least a portion of the scattered or emitted electromagnetic radiation directed onto the plurality of detector elements, wherein at least a portion of the detector elements of the array generate output signals corresponding to intensities of the scattered or emitted electromagnetic radiation
Data Source
AI summary
The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.