3D DRAM Structure with Segmented Conductive Pillars

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The semiconductor industry faces challenges in reducing costs while maintaining the density and efficiency of three-dimensional (3D) DRAM structures, as conventional methods for stacking two-dimensional (2D) structures are costly and inefficient.

Innovation Solution

A semiconductor structure comprising a stack of alternately disposed conductive and dielectric layers with specific conductive pillars and layers formed along the edges and sidewalls, allowing for the creation of 3D DRAM devices with reduced costs through a bit cost scalable process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If conventional methods for stacking two-dimensional (2D) structures are used to create 3D DRAM structures, then the density and volume reduction goals are achieved, but the manufacturing cost increases

Engineering Contradiction:
ImprovevolumeVSAvoidmanufacturing cost
Core Design Contradiction:
Volume of moving objectVSEase of manufacture

Solution Approach 1:

The device defining region is divided into a first portion and a second portion separated from each other. The first conductive pillar is formed in the first portion, while the second and third conductive pillars are formed in the second portion. This segmentation allows different manufacturing approaches for different regions, enabling cost reduction while maintaining density.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The same manufacturing processes are used to form all DRAM cells in the structure, making the process universal and scalable. This bit cost scalable process eliminates the need for different manufacturing steps for different cell types, thereby reducing manufacturing cost while achieving high density 3D structure.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Area of moving object

If more electronic devices are stacked layer by layer to increase density, then the footprint is reduced, but the manufacturing complexity and cost increase

Engineering Contradiction:
ImprovefootprintVSAvoidmanufacturing complexity
Core Design Contradiction:
Area of moving objectVSDevice complexity

Solution Approach 1:

Multiple conductive layers (second conductive layer, third conductive layer) and conductive pillars are integrated within the same device defining region. The stack structure with alternating conductive and dielectric layers combines multiple functional elements vertically, reducing footprint while using unified manufacturing processes to avoid increased complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from two-dimensional planar structures to three-dimensional vertical stacking. The stack comprises multiple conductive and dielectric layers arranged vertically, with conductive pillars extending through the stack, achieving high density in the vertical dimension rather than expanding horizontally, thus reducing footprint without proportionally increasing manufacturing complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20240244819A1Semiconductor structure and method for manufacturing the same
Publication Date: 2024.07.18 MACRONIX INTERNATIONAL CO LTD
  • US20240244819A1 patent drawing
  • US20240244819A1 patent drawing
  • US20240244819A1 patent drawing

AI summary

A semiconductor structure is provided. The semiconductor structure has a device defining region. The device defining region includes a first portion and a second portion separated from each other. The semiconductor structure includes a stack. The stack includes first conductive layers and first dielectric layers disposed alternately. The stack has an opening through the stack in the device defining region. The semiconductor structure further includes a second conductive layer, a first conductive pillar, a third conductive layer, a second conductive pillar, and a third conductive pillar. The second conductive layer is disposed along a sidewall of the opening. The first conductive pillar is disposed in the opening in the first portion. The third conductive layer is disposed in the opening along an edge of the second portion. The second conductive pillar and the third conductive pillar are disposed in the second portion and separated from each other.