3D Memory Device Vertical Channel Pillar Separation

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Solution Overview

Problem

The challenge lies in creating a three-dimensional memory device with higher storage capacity while maintaining operation performance, as critical dimensions in integrated circuits shrink, and existing techniques struggle to achieve this without compromising performance.

Innovation Solution

A method involving a precursor structure with a substrate, multi-layered stack, vertical channel pillars, and a barrier structure, where slits are formed to separate the pillars, and insulating layers are replaced with conductive layers, allowing for the formation of slit structures that enhance storage capacity and operation efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If critical dimensions of devices are shrunk to increase storage capacity, then storage density is improved, but operation performance deteriorates

Engineering Contradiction:
Improvestorage capacityVSAvoidoperation performance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent transitions from two-dimensional planar memory cells to three-dimensional vertically-stacked memory structures. Multiple memory cell layers are stacked vertically above each substrate area, enabling increased storage capacity without further shrinking critical dimensions. The vertical channel pillars extend through multiple insulating layers stacked in the third dimension, allowing high-density storage while maintaining adequate cell dimensions for reliable operation.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The memory device is divided into multiple independent memory cell layers stacked vertically, with each layer containing complete memory cell structures including channel pillars, insulating layers, and conductive elements. This segmentation into discrete stacked layers increases storage capacity while each layer maintains sufficient dimensional characteristics for reliable operation.

Inventive Principle:
Principle #1Segmentation

2Quantity of substance

If three-dimensional stacked memory structures are implemented to increase storage density, then storage capacity is improved, but device complexity increases

Engineering Contradiction:
Improvestorage densityVSAvoidstructural complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The vertically-stacked channel pillars serve multiple functions simultaneously: they act as conductive pathways for multiple memory cell layers, provide structural support for the stacked insulating layers, and enable electrical connection between different memory cell levels. This multi-functionality reduces the need for separate components, thereby increasing storage density without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

Multiple insulating layers are nested vertically around the channel pillars, with each layer containing complete memory cell structures within the same vertical space. This nesting arrangement achieves high storage density by utilizing the third dimension while maintaining a compact overall structure that does not linearly increase complexity with each added layer.

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS11690222B2Three-dimensional memory device
Publication Date: 2023.06.27 MACRONIX INTERNATIONAL CO LTD
  • US11690222B2 patent drawing
  • US11690222B2 patent drawing
  • US11690222B2 patent drawing

AI summary

A three-dimensional memory device and a method of manufacturing a three-dimensional memory device are provided. The method includes providing a precursor structure including a substrate, a multi-layered stack, a plurality of vertical channel pillars and a barrier structure. A first slit and a second slit are then formed in the multi-layered stack and the substrate along a first direction, in which the first slit and the second slit have a pitch between thereof, and the second slit cuts the barrier structure. A portion of the second insulating layers is then replaced with a plurality of conductive layers. A first slit structure and a second slit structure are then formed in the first slit and the second slit, in which the first slit structure and the second slit structure separate the vertical channel pillars in a second direction that is different from the first direction.