3D Semiconductor Memory Vertical Channel Integration

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Solution Overview

Problem

Traditional two-dimensional semiconductor memory devices face limitations in increasing integration degree due to high equipment costs for forming fine patterns, which restricts cost-effective manufacturing and performance enhancement.

Innovation Solution

A three-dimensional semiconductor memory device is developed with alternately stacked word lines and gate interlayer insulation layers, featuring a vertical channel layer and channel pad on a semiconductor substrate, along with bit lines and insulation pillars, to enhance integration density and reduce manufacturing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If two-dimensional planar memory devices use fine pattern formation techniques to increase integration degree, then integration density improves, but equipment cost increases significantly

Engineering Contradiction:
Improveintegration degreeVSAvoidequipment cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent transitions from two-dimensional planar memory cells to three-dimensional vertical memory structures. Word lines are formed vertically extending from the substrate, and memory cells are stacked in multiple layers, utilizing the third dimension (height) to increase integration density without requiring finer lateral patterning, thereby avoiding the need for expensive hyper-fine pattern equipment

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If three-dimensional memory structures are formed to increase integration density, then substrate area utilization improves, but device complexity increases

Engineering Contradiction:
Improveintegration densityVSAvoidstructural complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The three-dimensional memory structure is divided into multiple stacked layers, with each layer containing word lines, gate interlayer insulation layers, and memory cells. This segmentation allows the complex 3D structure to be manufactured through repeated application of standard 2D fabrication processes, reducing overall complexity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The word lines serve multiple functions: they act as gate electrodes for controlling current flow in vertical channels, provide electrical connections between stacked memory cell layers, and enable selective addressing of different memory regions. This multi-functionality reduces the need for additional dedicated structures

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS8933505B2Three-dimensional semiconductor memory device
Publication Date: 2015.01.13 SAMSUNG ELECTRONICS CO LTD
  • US8933505B2 patent drawing
  • US8933505B2 patent drawing
  • US8933505B2 patent drawing

AI summary

A three-dimensional semiconductor memory device includes word lines and gate interlayer insulation layers that are alternatively stacked on a semiconductor substrate while extending in a horizontal direction, a vertical channel layer that faces the word lines and extends upwardly from the semiconductor substrate, and a channel pad that extends from the vertical channel layer and is disposed on an uppermost gate interlayer insulation layer of the gate interlayer insulation layers.