3D NAND Memory Pillar Stack for Lower Connection Complexity
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Solution Overview
Problem
Existing three-dimensional NAND flash memory devices face challenges in efficiently integrating and connecting multiple layers and components, leading to structural complexity and potential reliability issues.
Innovation Solution
A semiconductor memory device with a layer stack design that alternates interconnect and insulating layers, featuring memory pillars and members that extend through these layers, facilitating efficient integration and connection of memory cell transistors in a three-dimensional stack.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multiple interconnect layers and insulating layers are stacked to form a three-dimensional structure, then storage capacity is improved, but structural complexity increases
Solution Approach 1:
The patent divides the three-dimensional stack into modular units consisting of alternating interconnect layers and insulating layers. Each layer is segmented and assigned a specific function: interconnect layers for electrical connections and insulating layers for isolation. This segmentation allows complex three-dimensional structures to be built from simpler, standardized modules, reducing overall structural complexity while maintaining high storage capacity.
Solution Approach 2:
The patent implements a nested structure where memory pillars are formed within the stacked layers, with each pillar containing multiple memory cell transistors arranged in series. The members extend through multiple interconnect layers, creating a nested configuration where smaller functional units are integrated within larger structures. This nesting approach enables high storage capacity within a compact three-dimensional footprint while organizing complexity hierarchically.
2Reliability
If members extend through multiple interconnect layers to connect memory cell transistors, then connectivity is improved, but manufacturing complexity increases
Solution Approach 1:
The patent forms members that extend through multiple interconnect layers using preliminary actions performed during the layer-by-layer construction process. The members are formed to protrude from upper surfaces of insulating layers before subsequent interconnect layers are deposited. This preliminary formation allows the members to be positioned and sized correctly in advance, simplifying later steps for connecting memory cell transistors across multiple layers and reducing manufacturing complexity.
Solution Approach 2:
The insulating layers serve as intermediaries between interconnect layers, providing a stable platform for forming members. The members extend through the insulating layers, which act as mediators that isolate electrical signals while allowing mechanical connection. This intermediary structure enables reliable connectivity across layers without requiring direct contact between conductive elements, simplifying the manufacturing process while maintaining electrical isolation.
3Quantity of substance
If a three-dimensional stack configuration is used to integrate memory cell transistors, then storage density is improved, but reliability may deteriorate due to potential connection issues
Solution Approach 1:
The patent applies local quality by providing different structural characteristics to different regions of the three-dimensional stack. Memory pillars are formed with specific dimensions and spacing optimized for local electrical connections, while insulating layers provide localized isolation. The members are positioned at specific locations to connect memory cell transistors in critical areas. This localized optimization ensures high storage density while maintaining connection reliability in key regions without requiring the entire structure to meet the same stringent requirements.
Data Source
AI summary
According to one embodiment, a semiconductor memory device includes a layer stack in which a plurality of interconnect layers and a plurality of insulating layers are alternately stacked one by one, a memory pillar passing through the layer stack, and a first member dividing the layer stack. The plurality of insulating layers include a first insulating layer. The plurality of interconnect layers include a first interconnect layer and a second interconnect layer provided on the first insulating layer. The memory pillar includes a first sub-pillar passing through the first interconnect layer and a second sub-pillar provided on the first sub-pillar and passing through the second interconnect layer. The first member includes a first portion passing through the first interconnect layer and the second interconnect layer and including an upper end located above the second interconnect layer, and a second portion provided on the first portion.


