3D NAND Staircase Stack Structure to Reduce Tier Deformation

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Solution Overview

Problem

Conventional methods of forming 3D NAND memory devices result in deformations such as tier shrinking, tier dishing, and tier bending, leading to undesirable defects, reduced performance, and decreased reliability and durability.

Innovation Solution

A method for forming microelectronic devices with staircase structures that includes forming a stack structure with alternating conductive and insulative materials, using a sequence of conductive material and insulative material tiers, and employing contact structures to facilitate electrical access, while minimizing deformations through controlled processing stages.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If conventional replacement gate or gate last processing methods are used to form the tiered stack, then the manufacturing process can be completed, but deformations such as tier shrinking, tier dishing, and tier bending occur in staircase regions

Engineering Contradiction:
Improvemanufacturing process completionVSAvoidtier dimensional accuracy
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent applies preliminary action by forming the conductive structures (control gates) before completing the stack formation process. Specifically, sacrificial structures are formed first, then conductive materials are deposited to replace them, establishing the control gate structures in advance. This preliminary formation of conductive structures prevents subsequent deformations in staircase regions during later processing steps, as the rigid conductive framework provides structural support that maintains tier dimensional accuracy throughout the remaining manufacturing process.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If feature packing density is increased to maximize devices in a given structural area, then productivity improves, but margins for formation errors decrease leading to deformations

Engineering Contradiction:
Improvedevice packing densityVSAvoidformation error margin
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies parameter changes by modifying the sequence and timing of material deposition and structure formation parameters. Instead of conventional gate-last processing, the invention uses gate-forming processing where conductive structures are established at specific intermediate stages. This parameter change in the manufacturing sequence creates structural rigidity at critical points, preventing deformations that would otherwise occur when attempting high-density packing with conventional methods. The altered processing parameters enable tighter feature spacing while maintaining formation precision.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250384929A1Microelectronic devices and related memory devices
Publication Date: 2025.12.18 MICRON TECHNOLOGY INC
  • US20250384929A1 patent drawing
  • US20250384929A1 patent drawing
  • US20250384929A1 patent drawing

AI summary

A microelectronic device includes a stack structure, slot structures, and dielectric material. The stack structure includes blocks each including a vertically alternating sequence of conductive material and insulative material arranged in tiers. At least one of the blocks includes an array region including strings of memory cells, and a staircase region including a crest sub-region interposed between a staircase structure and the array region. An uppermost boundary of the tiers within the crest sub-region underlies an uppermost boundary of the tiers within the array region. The slot structures are interposed between the blocks of the stack structure. The dielectric material extends over and between the blocks of the stack structure. A thickness of a portion of the dielectric material overlying the crest sub-region is greater than a thickness of an additional portion of the dielectric material overlying the array region. Related memory devices, electronic systems, and methods are also described.