Abnormality Detection Circuit with Mode Switching
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Solution Overview
Problem
Conventional abnormality detection circuits for switch devices require separate detection circuits for load open and output ground fault or sky fault, leading to increased circuit size and complexity.
Innovation Solution
An abnormality detection circuit that includes a first current source, a second current source, a comparator, and a controller, which switches between two modes to detect abnormalities by comparing application voltages with a threshold voltage, allowing for shared circuit elements and reduced complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate detection circuits are used for load open and output ground fault or sky fault, then detection reliability is improved, but device complexity increases
Solution Approach 1:
The patent implements a single detection circuit that can detect multiple types of abnormalities (load open, output ground fault, and output sky fault) by switching between different detection modes. The detection circuit uses a comparator that can compare detection voltages against different threshold voltages depending on the mode, allowing one circuit to perform multiple detection functions that would traditionally require separate circuits for each abnormality type.
Solution Approach 2:
The detection circuit employs dynamic switching between different detection modes (first abnormality detection mode and second abnormality detection mode) based on the type of abnormality being detected. This dynamic reconfiguration allows the same hardware circuit to adapt its detection behavior, effectively making it versatile while maintaining the reliability of dedicated detection circuits for each mode.
2Measurement precision
If multiple detection circuits are implemented, then detection accuracy is improved, but area occupied increases
Solution Approach 1:
The patent merges multiple detection functions into a single detection circuit by combining the load open detection and output fault detection capabilities in one circuit structure. The comparator and threshold voltage generation components are shared between different detection modes, significantly reducing the total area occupied compared to having separate detection circuits for each function.
Solution Approach 2:
The detection circuit is designed as a universal circuit that can perform multiple detection tasks. By using mode switching to select different detection functions, the same circuit area serves multiple purposes, achieving high detection accuracy without proportionally increasing the circuit area.
3Reliability
If dedicated detection circuits are used for each abnormality type, then detection reliability is improved, but manufacturing cost increases
Solution Approach 1:
The patent combines multiple detection functions into a single integrated circuit, reducing the total number of components that need to be manufactured and assembled. This merging approach decreases manufacturing complexity and cost while maintaining the reliability of dedicated detection through mode-specific detection mechanisms.
Solution Approach 2:
The universal detection circuit design allows a single circuit to replace multiple dedicated circuits, reducing the bill of materials and assembly requirements. This multi-functional approach lowers manufacturing costs while preserving detection reliability through carefully designed mode-specific detection pathways.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables miniaturization and cost reduction of abnormality detection circuits while effectively detecting load open and output ground fault or sky faults, ensuring the output switch element is only activated when no abnormalities are present.
Implementation Method 1
a comparator configured to generate an abnormality detection signal by comparing a detection voltage corresponding to an application voltage of the external terminal with a predetermined threshold voltage
Data Source
AI summary
An abnormality detection circuit includes: a first current source configured to generate a first current flowing from an external terminal toward a reference potential terminal; a second current source configured to generate a second current flowing from a power supply potential terminal toward the external terminal; a comparator configured to generate an abnormality detection signal by comparing a detection voltage corresponding to an application voltage of the external terminal with a predetermined threshold voltage; and a controller configured to switch between a first abnormality detection mode in which an operation of generating the first current is performed and a second abnormality detection mode in which an operation of generating the second current is performed.