Magnetic Leakage Flux Detection with Combined AC-DC Magnetization

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Solution Overview

Problem

Current magnetic flux leakage methods struggle to detect both open and hidden near-surface defects in ferromagnetic materials with high sensitivity, as they are either insensitive to deep defects due to shallow penetration or produce unsatisfactory results for narrow and diagonal defects.

Innovation Solution

A method combining constant and alternating magnetic fields for magnetization, where a direct magnetic field is superimposed on an alternating field to increase detection depth without compromising surface defect detection accuracy, using a magnetization device with separate coil arrangements for each field and optimizing field strengths and frequencies to enhance sensitivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If alternating field magnetization is used to detect surface defects with high resolution, then detection precision for open defects is improved, but penetration depth decreases making hidden defects undetectable

Engineering Contradiction:
Improvedetection precision for surface defectsVSAvoidpenetration depth
Core Design Contradiction:
Measurement precisionVSLength of stationary object

Solution Approach 1:

The patent combines direct field magnetization and alternating field magnetization into a single leakage flux testing system. The direct field component provides deep penetration to detect hidden defects, while the alternating field component maintains high surface sensitivity for open defects. This merging of two magnetization methods resolves the contradiction between penetration depth and surface detection precision.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent optimizes the parameters of the combined magnetization system by adjusting the frequency and strength of the alternating field component relative to the direct field. By carefully selecting the alternating field frequency (typically 50-1000 Hz) and amplitude, the system achieves both deep penetration and high surface sensitivity, transforming the detection capabilities across different defect depths.

Inventive Principle:
Principle #35Parameter changes

2Length of stationary object

If direct field magnetization is used to increase penetration depth for hidden defects, then detection depth is improved, but detection sensitivity for narrow and diagonal surface defects decreases

Engineering Contradiction:
Improvepenetration depthVSAvoiddetection sensitivity for narrow defects
Core Design Contradiction:
Length of stationary objectVSMeasurement precision

Solution Approach 1:

The patent merges direct field magnetization with alternating field magnetization to simultaneously achieve deep penetration and high sensitivity for narrow defects. The alternating field component, when superimposed on the direct field, creates a combined magnetization effect that enhances leakage flux at narrow defect locations while maintaining deep penetration capability.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent employs periodic alternating field action superimposed on the continuous direct field. This periodic modulation of the magnetic field enhances the detection of narrow and diagonal defects by creating time-varying leakage flux patterns that are more easily detected, while the underlying direct field maintains deep penetration.

Inventive Principle:
Principle #19Periodic action

3Measurement precision

If only alternating field magnetization is used, then surface defect detection resolution is high, but hidden defects beneath the surface cannot be detected

Engineering Contradiction:
Improvesurface defect detection resolutionVSAvoiddetection reliability for hidden defects
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent combines alternating field magnetization and direct field magnetization in a single testing system. The alternating field provides high-resolution surface defect detection, while the direct field extends penetration depth to detect hidden defects. This combination ensures both high surface resolution and reliable hidden defect detection.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent creates a multi-functional magnetization system that can simultaneously perform surface defect detection with high resolution and hidden defect detection with deep penetration. The combined magnetization device serves multiple detection purposes, making the system universally applicable to various defect types and depths.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly improves the detection sensitivity for both open and hidden near-surface defects, allowing for reliable detection of deep defects without reducing the resolution for surface errors, by concentrating the magnetic induction near the surface and adjusting field strengths to optimize penetration depth.

Implementation Method 1

a test volume of the test specimen is magnetized by means of a constant magnetic field and at the same time by means of an alternating magnetic field superimposed on the constant field

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 2

scanned by means of at least one magnetic field-sensitive test probe to detect stray magnetic fields caused by defects

Methodology Applied
Scientific EffectMagnetic field detection: Magnetic Field

Implementation Method 3

A method combining constant and alternating magnetic fields for magnetization, where a direct magnetic field is superimposed on an alternating field to increase detection depth

Methodology Applied
Scientific EffectAlternating magnetic field: Alternating Magnetic Field

Data Source

PatentEP2269049B2Method and device for detecting near-surface defects by means of magnetic leakage flux measurement
Publication Date: 2017.05.10 INSTITUT DR FOERSTER GMBH & CO KG
  • EP2269049B2 patent drawingFigure 1~2
  • EP2269049B2 patent drawingFigure 3~4
  • EP2269049B2 patent drawingFigure 5A~5D

AI summary

The invention relates to a method and a device for detecting near-surface defects (152) in a sample (150) made at least partially of ferromagnetic material, wherein a test volume of the sample is magnetized and scanned for magnetic flux leakages (155) caused by defects. The test volume is magnetized by means of a constant magnetic field (135), and simultaneously by means of an alternating magnetic field (145) superposed on the constant field.