Active Load-Pull Testing Without Extra Impedance Hardware
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Solution Overview
Problem
Existing measurement systems for electronic devices require extra hardware to adjust impedance, making them cumbersome and inefficient for active load pull testing.
Innovation Solution
A measurement system utilizing a signal analysis circuit, signal generator circuit, and control circuit to generate an RF test signal based on known error parameters of an error model, allowing for active load pull testing with reduced hardware by determining the desired reflection coefficient at the reference plane without direct measurement of the RF test signal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If mechanical tuner or passive load pull technique is used to adjust impedance, then impedance adjustment is achieved, but extra hardware is required and device complexity increases
Solution Approach 1:
The patent replaces mechanical tuners and passive load pull techniques with an active electronic system that uses a signal generator and error model to electronically adjust impedance. This substitution eliminates the need for mechanical components and reduces overall hardware complexity while maintaining impedance adjustment capability.
Solution Approach 2:
The patent introduces an error model as an intermediary mathematical representation that describes the measurement system's characteristics. This error model allows the system to compensate for hardware limitations and achieve accurate impedance adjustment without requiring additional physical hardware components.
2Adaptability or versatility
If two measurement receivers are used to measure transmitted and received signals for impedance adjustment, then desired impedance can be presented to device under test, but hardware requirements and system complexity increase
Solution Approach 1:
The patent enables the measurement system to self-characterize by using the device under test itself as the calibration standard. The system measures the device under test at a known impedance, uses the error model to determine system characteristics, and then applies these characteristics to present desired impedances without requiring separate calibration hardware or additional measurement receivers.
3Measurement precision
If RF test signal is directly measured to determine properties at reference plane, then measurement accuracy is achieved, but hardware complexity and measurement time increase
Solution Approach 1:
The patent performs preliminary characterization of the measurement system by measuring the device under test at a known impedance and storing the results in the error model. This preliminary action allows the system to later determine signal properties at the reference plane without requiring direct measurement of the RF test signal, thereby reducing hardware complexity and measurement time while maintaining accuracy.
Data Source
AI summary
A measurement system includes a signal analysis circuit, a signal generator circuit, a control circuit, and a DUT connector. The DUT connector is connectable to a device under test for receiving a measurement signal outputted by the DUT. The signal analysis circuit is connected to the DUT connector for receiving the measurement signal. The signal generator circuit is configured to generate a radio frequency (RF) test signal that is transmitted to the DUT. The signal analysis circuit is configured to digitize the measurement signal, thereby obtaining a digitized measurement signal. The control circuit is configured to control the signal generator circuit to generate the RF test signal based on the digitized measurement signal, based on known error parameters of an error model of the measurement system, and based on a desired reflection coefficient at a reference plane associated with the DUT.