Active Matrix Substrate Leakage Current Reduction
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Solution Overview
Problem
In photoelectric imaging panels, leakage currents from protection circuits connected to data lines can interfere with the imaging process, preventing proper image acquisition due to the flow of currents into the data lines.
Innovation Solution
An active matrix substrate is designed with a configuration that includes gate lines, data lines, a photoelectric conversion element, a bias line, and protection circuits connected to the data lines, gate lines, and bias lines, where the first protection circuit has nonlinear elements with higher resistance than those in the second and third protection circuits, reducing leakage currents into the data lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If protection circuits are connected to data lines to protect against static electricity, then electrostatic protection is improved, but leakage currents flow into the data lines causing imaging errors
Solution Approach 1:
The patent applies different resistance values to nonlinear elements in different protection circuits based on their connection targets. Specifically, the first protection circuit connected to the data line uses nonlinear elements with first resistance values, while the second protection circuit connected to the gate line uses nonlinear elements with second resistance values. This local differentiation allows the data line protection circuit to have higher resistance and thus lower leakage current, while the gate line protection circuit can have lower resistance for better static discharge capability.
Solution Approach 2:
The patent changes the resistance parameter of nonlinear elements in protection circuits based on the type of line being protected. By setting the resistance of nonlinear elements in the first protection circuit (connected to data line) to be higher than those in the second protection circuit (connected to gate line), the patent optimizes the balance between electrostatic protection and leakage current suppression for different circuit requirements.
2Reliability
If nonlinear elements in protection circuits are used to protect against static electricity, then protection capability is improved, but imaging precision deteriorates due to leakage currents
Solution Approach 1:
The patent implements local quality by assigning different resistance characteristics to nonlinear elements in protection circuits depending on their connection target. The first protection circuit connected to the data line uses nonlinear elements with higher resistance to minimize leakage currents that would affect charge readout and imaging precision, while the second protection circuit connected to the gate line uses nonlinear elements with lower resistance for effective static discharge.
Solution Approach 2:
The patent changes the resistance parameter of nonlinear elements based on the specific protection needs of different circuits. By increasing the resistance of nonlinear elements in the data line protection circuit, the patent reduces leakage currents to levels that do not interfere with the readout of minute charges from photoelectric conversion elements, thereby maintaining imaging precision while preserving protection capability.
3Reliability
If protection circuits are added to the active matrix substrate, then electrostatic protection is improved, but device complexity increases
Solution Approach 1:
The patent segments the protection function into multiple distinct protection circuits, each dedicated to protecting specific lines (data lines, gate lines, bias lines). The first protection circuit is connected to the data line, the second to the gate line, and the third to the bias line. This segmentation allows each protection circuit to be optimized independently with appropriate nonlinear element resistance values, providing comprehensive electrostatic protection while maintaining clear functional separation and manageable complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively minimizes leakage currents from the protection circuits, allowing for accurate and proper readout of charges accumulated by the photoelectric conversion elements, thereby enhancing the imaging results.
Implementation Method 1
imaging panels, which are configured to accumulate charges corresponding to the amounts of received X-rays in pixels
Implementation Method 2
a nonlinear element in the first protection circuit has a higher resistance than a nonlinear element in at least one of the second protection circuit and the third protection circuit
Data Source
AI summary
The active matrix substrate includes gate lines, data lines, photoelectric conversion elements provided in pixels bounded by the gate lines and the data lines and electrically connected to the data lines, and a bias line that is connected to the photoelectric conversion elements and supplies a bias voltage to the photoelectric conversion elements. The active matrix substrate also includes first protection circuits connected to the data lines, second protection circuits connected to the gate lines, and third protection circuits connected to the bias line. Each of the first protection circuits, second protection circuits, and third protection circuits includes at least one nonlinear element. A nonlinear element in each first protection circuit has a higher resistance than a nonlinear element in at least one of each second protection circuit and each third protection circuit.