Adaptive March Algorithm for MBIST Fault Coverage
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Solution Overview
Problem
Existing reconfigurable MBIST technologies are not adaptive to environmental parameter fluctuations, have limited fault coverage, and increase testing efficiency at the cost of higher time complexities and circuit areas.
Innovation Solution
A reconfigurable MBIST method based on an adaptive March algorithm, which includes the adaptive March Adapt-RAWC algorithm and a reconfigurable MBIST circuit, dynamically selects algorithm elements based on environmental parameters and user instructions to improve fault coverage and reduce testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple test sequences are combined into dynamic fault detection sequences to cover all fault models, then fault coverage is improved, but testing time increases exponentially
Solution Approach 1:
The patent implements a dynamic fault detection sequence that adapts to different fault models and environmental conditions. The testing algorithm dynamically selects and executes appropriate test sequences based on the detected fault type, rather than executing all possible test sequences. This dynamic adaptation allows the system to achieve high fault coverage while significantly reducing testing time by avoiding unnecessary test operations.
Solution Approach 2:
The patent changes the parameters of the testing algorithm by introducing environmental parameter detection (temperature, voltage, frequency) and using these parameters to select optimal test sequences. The testing time complexity is reduced by adjusting the test sequence based on environmental conditions, while fault coverage is maintained through comprehensive fault model coverage across different environmental scenarios.
2Device complexity
If fixed testing algorithms are implemented in silicon chips, then device complexity is reduced, but adaptability to environmental parameter fluctuations is lost
Solution Approach 1:
The patent introduces a dynamic testing algorithm that can adapt to different environmental conditions (temperature, voltage, frequency) and fault models. The testing sequence is not fixed but dynamically adjusted based on environmental parameter detection, allowing the same hardware circuit to perform optimized testing across varying conditions without requiring complex reconfiguration hardware.
Solution Approach 2:
The testing system performs self-diagnosis and self-adjustment by detecting environmental parameters and automatically selecting appropriate test sequences. The MBIST circuit monitors its own operating conditions and autonomously determines the optimal testing approach, eliminating the need for external intervention or complex reconfiguration mechanisms.
3Reliability
If reconfigurable algorithm circuits are added to improve fault coverage, then fault coverage is improved, but circuit area increases
Solution Approach 1:
The patent implements a universal testing algorithm framework that can detect multiple fault models (static faults, dynamic faults, coupling faults) using a single integrated MBIST circuit. The same hardware circuit performs multiple testing functions by dynamically adjusting the testing sequence based on environmental parameters and fault detection, eliminating the need for separate dedicated circuits for each fault type.
Solution Approach 2:
The patent uses environmental parameter detection to dynamically adjust the testing sequence and optimize fault detection coverage. By changing the testing parameters and sequence based on real-time environmental conditions, the system achieves high fault coverage without requiring additional hardware resources or increased circuit area.
Data Source
AI summary
A reconfigurable MBIST method based on an adaptive March algorithm is provided. The reconfigurable MBIST method automatically reconfigures different algorithm circuits according to external environment and user instructions to satisfy detection requirements for different faults. The provided adaptive March algorithm is capable of adaptively reorganizing algorithms with different complexities, such that dynamic adjustments can be executed between time complexities of the algorithm and fault coverage rates to achieve a good balance, and the static fault coverage rates are high, thereby effectively improving dynamic fault coverage rates.