Adaptive Optics Model for Reflection Microscopy Aberration Correction
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Solution Overview
Problem
In adaptive reflection microscopy, existing methods struggle to effectively separate and correct for the distinct aberrations present in the excitation and detection paths, leading to distorted images due to light scattering and limited optical resolution.
Innovation Solution
A method involving the training of a mathematical model using a dataset generated by modulating light distributions in both excitation and detection paths, allowing for the separation and correction of aberrations through spatial light modulators, thereby improving image resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If light is used to image through scattering materials in reflection microscopy, then optical accessibility is improved, but image distortion increases due to separate aberrations in excitation and detection paths
Solution Approach 1:
The patent applies segmentation by separating the correction of excitation path aberrations and detection path aberrations into distinct computational steps. The mathematical model independently processes the excitation wavefront modulation and detection wavefront modulation, allowing each path's aberrations to be corrected separately rather than as a combined problem.
Solution Approach 2:
The patent introduces a mathematical model as an intermediary that processes the relationship between excitation light modulation, detection light modulation, and reflected light distribution. This mathematical model acts as a mediator that translates measured reflected light patterns into corrective wavefront modulations for both excitation and detection paths.
2Productivity
If deep neural networks are used for wavefront recognition based on single passage correction, then computational speed is improved, but applicability to reflection microscopy is reduced
Solution Approach 1:
The patent creates a universal mathematical model that can handle both excitation path and detection path aberrations simultaneously. This model is not limited to single-passage transmission microscopy but is adaptable to reflection microscopy and potentially other imaging configurations, making it multi-functional and broadly applicable.
Solution Approach 2:
The patent extends the correction approach from a single dimension (transmission path only) to multiple dimensions by independently addressing excitation path aberrations and detection path aberrations. This dimensional expansion allows the system to handle the more complex reflection microscopy scenario where light traverses the sample twice with potentially different aberrations each time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method enables the effective correction of distortions in reflection microscopy, resulting in higher-resolution images by separately untangling and correcting the aberrations in the excitation and detection paths.
Implementation Method 1
modulating the light distribution I0 to form a light distribution IA in the excitation path via an optical modulator, wherein the optical modulator provides a light modulation MA
Implementation Method 2
reflecting the light distribution IA at a location of a sample in a detection path of the microscope
Implementation Method 3
modulating the light distribution IA to form a light distribution ID in the detection path via a further optical modulator, wherein the further optical modulator provides a light modulation MD
Implementation Method 4
The irradiation light can in particular be provided by a laser which scans over the sample. The image thus generated is generally formed in that excitation light which penetrates from a microscope objective into the sample is partially there reflected back into the objective and is focused in a 'sample image', which is distorted due to the scattering.
Data Source
AI summary
A method for training a mathematical model which describes a light propagation in a reflection microscopy includes radiating a light distribution I0 into an excitation path of a microscope, modulating the light distribution I0 to form a light distribution IA in the excitation path via an optical modulator, reflecting the light distribution IA at a location of a sample in a detection path of the microscope, modulating the light distribution IA to form a light distribution ID in the detection path via a further optical modulator, recording a reflected light distribution ID, repeating the above steps n-fold to generate an n-fold 3-tuple (MA, MD; ID), transferring the n-fold 3-tuple (MA, MD; ID) to a computer to implement a mathematical model F for a light propagation in reflection microscopy, and ascertaining the mathematical model F which describes the light propagation in reflection microscopy based on the n-fold 3-tuple (MA, MD; ID).