Microscopes TRIZ Cases

Replacing arc lamps, the assembly uses integrated filter cubes to select wavelengths automatically, reducing alignment time and human error.

Pupil engineering at the Fourier plane removes background photon noise, boosting signal-to-noise ratio for high-resolution nanoparticle detection.

Fluorescence scanning microscope evaluates photon arrival times to generate sample images for determining spatial offset between light distributions.

A correction lens system compensates for optical aberrations in light sheet microscopy assemblies.

Segmenting illumination into parallel light bundles enables simultaneous multi-plane imaging while preventing fluorophore saturation.

A varifocal lens system shapes annular parallel light to form a sub-diffraction fluorescent spot for super-resolution imaging.

Extra-low dispersion lenses reduce chromatic aberration in indirect ophthalmoscopy by minimizing angular color dispersion for sharper retinal images.

An automated optical microscope system captures images at varying distances to precisely measure bump heights on semiconductor wafers.

An adaptive scanning optical microscope uses a deformable mirror to correct residual aberrations across the expanded field of view.

Stationary mirror with transparent and reflective regions directs illuminating rays into selectable orthoscopic or conoscopic beam paths.

A microscope apparatus selects between scanning and phase modulation optical paths to deliver targeted stimulus light.

A confocal microscope optical system generates multiple line foci to enable parallel detection of illumination light within a sample.

Multi-focal structured illumination microscopy splits a single beam into multiple focal points for simultaneous wide-field scanning.

A detachable correction collar operating device uses a belt transmission to rotate microscope objective lenses for aberration adjustment.

Acousto-optical tunable filter diffracts light components into distinct paths for flexible multi-color illumination in microscopy systems.

Flat mirrors create a pivot axis within the objective lens aperture to enable rapid scanning while minimizing optical aberrations.

A microscope system processes color images dye by dye to generate depth-extended views of specimens.

Incoherent light sources illuminate the entire field of view for comprehensive specimen feature mapping.

A microscope illumination cover uses a wavelength-selective layer to block laser radiation while transmitting ambient light.

Multiple diaphragms at different pupil planes generate complex illumination settings, resolving the trade-off between versatility and device complexity.

A displaceable lens group in a microscope objective corrects spherical aberration through specific longitudinal aberration constraints.

A microscope stage controller adjusts drive speed based on the viewing range ratio relative to the maximum image-acquisition area.

A tilted micro mirror array orthogonally reflects image signals to spatially separate axial positions for parallel detection.

An oblique illumination system using angled light and aperture masks resolves poor contrast of translucent cells by creating asymmetric shadowing effects.

Training a mathematical model on n-fold 3-tuples enables independent correction of excitation and detection path aberrations in reflection microscopy.

A digital slide scanning apparatus uses two cameras to capture full-frame and target area images at different magnifications.

Dual illumination imaging detects object position shifts along the optical axis, replacing complex interferometry with accurate parallax measurement.

Two perpendicular swinging levers shift the imaging axis to inspect all endfaces in multi-row connectors, eliminating blind spots.

Segmented mirror components mounted on a universal holder resolve manufacturing complexity while maintaining precise light deflection angles.

A scanning probe inspector uses a depth-matched tip to move through wafer trenches and detect sidewall defects.

Automated detection of sample regions via saturation thresholds eliminates manual focus adjustment and visual verification in microscopy workflows.

Controllable optical elements in a laser scanning microscope enable switching between confocal, line, and wide-field modes without physical module replacements.

Segmented illumination sources and reflective dome interiors eliminate specular highlights that saturate pixels, enabling accurate autofluorescence detection.