Adaptive Smart-Verify Voltage Offset for Non-Volatile Memory
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Solution Overview
Problem
As memory cells decrease in size and memory arrays increase in density, maintaining the integrity of data stored in non-volatile memory systems becomes increasingly challenging, particularly at lower temperatures where programming times are longer.
Innovation Solution
An adaptive smart-verify programming voltage offset that varies as a function of temperature is introduced, increasing with decreasing temperature to compensate for longer programming times, thereby initializing a smart verify programming voltage to larger values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If memory cells are scaled down to increase density, then storage capacity is improved, but data integrity deteriorates
Solution Approach 1:
The patent applies parameter changes by dynamically adjusting the verify voltage offset based on temperature conditions. The verify voltage offset is increased at lower temperatures to compensate for the longer programming times and ensure data integrity, while maintaining standard offsets at higher temperatures. This adaptive parameter adjustment resolves the contradiction by optimizing programming conditions for scaled memory cells under varying thermal environments.
2Productivity
If programming voltage is increased to improve programming speed, then productivity is improved, but manufacturing precision deteriorates
Solution Approach 1:
The patent implements dynamics by making the verify voltage offset adaptive rather than fixed. The offset dynamically adjusts based on temperature conditions, being higher at low temperatures to ensure precision and returning to standard levels at high temperatures to maintain speed. This dynamic adjustment resolves the contradiction between programming speed and precision by optimizing the verify voltage for each operating condition.
3Reliability
If operate at lower temperatures to reduce thermal stress, then reliability is improved, but programming time increases
Solution Approach 1:
The patent applies parameter changes by adjusting the verify voltage offset based on temperature. At lower temperatures where programming time naturally increases, the verify offset is increased to accelerate the programming process and reduce the time penalty. This compensatory parameter adjustment resolves the contradiction by maintaining faster programming speeds even when thermal stress requires lower operating temperatures.
Data Source
AI summary
An apparatus is provided that includes a control circuit coupled to a plurality of non-volatile memory cells. The control circuit is configured to perform a program-verify iteration on a first set of the non-volatile memory cells in a plurality of program loops, determine that the first set of the non-volatile memory cells passes verification to a particular programmed state in a first number of program loops, determine a first voltage based on the first number of program loops, add an adaptive voltage offset to the first voltage to obtain a second voltage, and program a second set of the non-volatile memory cells in a plurality of program loops using the second voltage. The adaptive voltage offset varies as a function of temperature.