ADC Comparator Offset Calibration Using Reference Shuffling

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing delta-sigma (ΔΣ) analog-to-digital converters (ADCs) face significant challenges due to quantization noise from flash comparators, which can be near the same level as thermal noise, leading to failure in meeting noise specifications without proper calibration, especially due to manufacturing imperfections like comparator offsets.

Innovation Solution

A calibration system that includes a noise source, an internal ADC, a reference shuffling circuit, a calibration circuit, and calibration logic to adjust comparator offsets, using schemes like data weighted average, leap-frogging, and swapping to ensure comparators experience transitions, and employing algorithms such as random walk, simulated annealing, or genetic algorithms to optimize calibration codes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If quantization noise from flash comparators is reduced through calibration, then noise specifications are met, but device complexity increases due to additional calibration circuits and algorithms

Engineering Contradiction:
Improvenoise specification complianceVSAvoidcalibration system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The calibration system uses the ADC's own output to measure quantization noise and automatically adjusts comparator offsets through embedded calibration logic, eliminating the need for external calibration equipment and reducing overall system complexity

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The calibration circuit measures the ADC output, calculates quantization noise power, and uses this feedback to iteratively adjust comparator offsets until noise specifications are met, creating a closed-loop calibration process that optimizes performance automatically

Inventive Principle:
Principle #23Feedback

2Measurement precision

If comparator offsets are calibrated to reduce quantization noise, then measurement precision improves, but calibration time increases due to iterative optimization algorithms

Engineering Contradiction:
Improvequantization noise reductionVSAvoidcalibration time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The calibration system performs offset calibration during the manufacturing process or initial setup phase, so that by the time the ADC is deployed for actual measurements, the comparator offsets are already optimized and no additional calibration time is required during operation

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The calibration process systematically varies comparator offset parameters using optimization algorithms (such as gradient descent or genetic algorithms) to find the optimal set of offsets that minimize quantization noise, balancing calibration time with measurement precision

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If reference shuffling is implemented to ensure comparator transitions during calibration, then calibration accuracy improves, but device complexity increases due to additional shuffling circuitry

Engineering Contradiction:
Improvecalibration accuracyVSAvoidreference shuffling circuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The reference shuffling circuit dynamically permutes the reference voltage assignments to different comparators during calibration, ensuring that each comparator experiences a full range of input conditions and transitions, which improves calibration accuracy without requiring permanent structural changes

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The reference shuffling operates in periodic cycles during calibration, systematically rotating through different reference assignments to ensure all comparators are adequately stimulated, then settles into a stable configuration for normal operation

Inventive Principle:
Principle #19Periodic action

Data Source

PatentEP2779466B1System, method and recording medium for analog to digital converter calibration
Publication Date: 2019.08.21 ANALOG DEVICES GLOBAL UNLTD
  • EP2779466B1 patent drawingFigure 1
  • EP2779466B1 patent drawingFigure 2
  • EP2779466B1 patent drawingFigure 3~4

AI summary

A calibration system for an analog-to-digital converter (ADC) comprising an internal ADC that receives an analog input and converts the analog input to digital multi-bit data. The calibration system also includes a reference shuffling circuit that shuffles reference values of comparators of the internal ADC. Further, the calibration system includes a calibration circuit that calibrates the comparators of the internal ADC. The calibration system includes a digital block that measures an amplitude based on the digital multi-bit data. Additionally, the calibration system includes calibration logic that controls the calibration circuit based on an output of the digital block.