Time-Interleaved ADC Timing Calibration Using Progressive Correlation

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Solution Overview

Problem

High-speed analog-to-digital converter (ADC) circuits using multiple ADCs in a time-interleaving manner suffer from data distortion due to time skew errors, degrading performance.

Innovation Solution

An ADC circuit with a control logic circuit that calculates correlation values between data output from multiple ADCs using varying numbers of bits and times to calibrate sampling timing, minimizing power consumption and time required for calibration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If multiple ADCs are used in a time-interleaving manner to enhance conversion speed, then the conversion speed is improved, but time skew errors between ADCs cause data distortion and performance degradation

Engineering Contradiction:
Improveconversion speedVSAvoiddata accuracy
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent changes the parameter of correlation calculation by using different numbers of bits (first number of bits vs. second number of bits) and different numbers of times (first number of times vs. second number of times) to calculate correlation values at different calibration stages. This progressive refinement approach adjusts the calculation parameters to balance speed and accuracy requirements.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If calibration methods are used to correct sampling timing, then time skew errors are reduced, but power consumption and calibration time increase

Engineering Contradiction:
Improvesampling timing accuracyVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent applies partial action by performing correlation calculations with different numbers of bits and different numbers of times at different calibration stages. Instead of always using maximum precision calculations, the system uses fewer bits and fewer iterations when appropriate, reducing power consumption while still achieving the required calibration accuracy.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The patent changes calculation parameters (number of bits, number of times) based on calibration stage requirements. During initial calibration, fewer bits and fewer iterations are used to reduce power consumption, while final precision calibration uses more bits and more iterations to ensure accuracy.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If high-precision correlation calculations are performed to ensure calibration accuracy, then sampling timing accuracy is improved, but the time required for calibration increases

Engineering Contradiction:
Improvecalibration accuracyVSAvoidcalibration time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent uses partial action by performing correlation calculations with different numbers of bits and different numbers of times at different calibration stages. Instead of always using maximum precision calculations, the system uses fewer bits and fewer iterations when appropriate, reducing calibration time while still achieving the required calibration accuracy.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS12574038B2Analog-to-digital converter circuit, an electronic device including the same and a method for controlling the same
Publication Date: 2026.03.10 SAMSUNG ELECTRONICS CO LTD
  • US12574038B2 patent drawing
  • US12574038B2 patent drawing
  • US12574038B2 patent drawing

AI summary

An ADC circuit including: ADCs to perform conversion operations in a time-interleaving manner; and a control logic circuit connected to the ADCs, wherein the control logic circuit is configured to: calculate a correlation value between data output from the ADCs a first number of times using a first number of bits among each bit of the data; calibrate a sampling timing of at least some of the ADCs, based on a first cumulative correlation value, which is obtained by accumulating correlation values calculated the first number of times; calculate the correlation value between the data a second number of times by using a second number of bits in each of the data; and calibrate the sampling timing of the at least some of the ADCs, based on a second cumulative correlation value, which is obtained by accumulating correlation values calculated the second number of times.