Adjustable Delay Circuit for IC Speed Variation Measurement
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Solution Overview
Problem
Existing methods for measuring the operating speed of integrated circuits (ICs) are inefficient due to slow response times, high circuit area consumption, and complexity in monitoring critical paths, which makes it difficult to quantify and adjust IC performance effectively under varying environmental and usage conditions.
Innovation Solution
A measuring circuit comprising a signal generator, an adjustable delay circuit, and a signal detector, which generates and detects delay signals to determine the operating speed of an IC, allowing for calibration to set delay units within a threshold, enabling efficient monitoring and adjustment of IC performance across different conditions without directly measuring critical paths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If critical path monitoring is used to measure operating speed, then measurement capability is provided, but device complexity increases due to uncertain critical paths and multiple environmental conditions
Solution Approach 1:
The patent introduces an adjustable delay circuit as an intermediary component between the signal source and the measurement system. This delay circuit acts as a mediator that can be tuned to match the critical path delay under various conditions, thereby simplifying the measurement process without requiring direct identification of critical paths. The delay circuit absorbs the complexity of varying environmental conditions by providing an adjustable parameter that compensates for these variations.
2Measurement precision
If additional delay circuits are added to detect critical path delays, then operating speed detection is enabled, but circuit area consumption increases
Solution Approach 1:
The adjustable delay circuit is designed to serve multiple functions: it can be tuned to represent different critical path delays under various environmental conditions, it provides a standardized interface for measurement, and it can be reused across different measurement scenarios. This multi-functionality reduces the need for separate dedicated circuits for each critical path or condition, thereby reducing overall circuit area consumption.
3Measurement precision
If ring oscillator is used to estimate operating speed, then speed estimation is provided, but response time becomes slow and voltage variation cannot be measured within short period
Solution Approach 1:
The patent employs an adjustable delay circuit that can dynamically adapt its delay characteristic based on the operating conditions. Unlike a fixed ring oscillator, this delay circuit can be tuned in real-time to match the current critical path delay, enabling rapid response to voltage and temperature variations. The dynamic adjustability allows the system to track operating speed changes without the slow response inherent in ring oscillators.
4Measurement precision
If voltage meter/temperature meter are used to estimate operating speed, then environmental parameter measurement is provided, but circuit area consumption increases and response remains slow
Solution Approach 1:
Instead of directly measuring voltage and temperature and then converting these readings to operating speed estimates, the patent creates a functional copy of the critical path delay characteristic through the adjustable delay circuit. By tuning the delay circuit to match the actual critical path delay under measured environmental conditions, the system directly obtains operating speed information without requiring large measurement circuits or complex conversion processes.
Data Source
AI summary
Disclosed is a measuring circuit for quantizing variations in the operating speed of a target circuit. The measuring circuit includes: a signal generator configured to generate a predetermined signal; an adjustable delay circuit configured to generate a first and second delay signals according to the predetermined signal respectively; a signal detector configured to detect the first and second delay signals respectively and thereby generate a first and second detection results respectively; and a calibrating circuit configured to enable a first and second numbers of delay units of the adjustable delay circuit according to the first and second detection results respectively so as to make each of the delays respectively caused by the first and second numbers of delay units be less than a delay threshold, in which the first and second numbers relate to the operating speed of the target circuit operating in the first and second conditions respectively.