Adjustable Probe Head Protrusion for Wear-Compensated Testing
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Solution Overview
Problem
The lifespan of probe heads is shortened due to probe tip wear during testing, leading to increased maintenance time and costs, as well as reduced test accuracy and precision.
Innovation Solution
A probe head design that adjusts the support distance based on the variation of a support axis through a plate and a spacer, allowing for adjustable protrusion length of the probe, using movable blocks or stepped surfaces to maintain optimal contact pressure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the probe is used repeatedly for testing semiconductor elements, then the test coverage increases, but the probe tip wears out and the probe head lifespan is shortened
Solution Approach 1:
The probe head incorporates an adjustable support distance mechanism that allows dynamic reconfiguration of the probe protrusion length. As the probe tip wears during repeated testing, the support distance can be adjusted to compensate for the wear, extending the usable life of the probe head while maintaining consistent contact pressure and test quality.
2Device complexity
If the probe tip wear is not adjusted, then the structure remains simple, but the contact pressure becomes inappropriate and test accuracy decreases
Solution Approach 1:
The adjustable support distance mechanism allows the probe head to adapt to probe tip wear by changing the protrusion length of the probe. This dynamic adjustment capability ensures that appropriate contact pressure is maintained between the probe tip and the semiconductor element contact terminal, thereby preserving test accuracy without requiring complete replacement of the probe head.
3Reliability
If the probe head is replaced frequently due to wear, then the contact pressure can be maintained, but the maintenance time and production cost increase
Solution Approach 1:
Instead of replacing the entire probe head when probe tip wear occurs, the invention allows for adjustment of the support distance to compensate for the wear. This extends the service life of the probe head and reduces the frequency of maintenance operations, thereby reducing both maintenance time and production costs while maintaining consistent contact pressure.
Solution Approach 2:
The invention recovers the functionality of the worn probe by adjusting the support distance rather than discarding the entire probe head. This partial recovery approach allows the probe head to continue serving its purpose after probe tip wear, reducing waste and maintenance requirements.
4Ease of manufacture
If the probe protrusion length is fixed, then the manufacturing is simpler, but the adaptability to probe wear and different testing conditions is reduced
Solution Approach 1:
The probe head design incorporates an adjustable support distance mechanism that enables the probe protrusion length to be modified according to probe tip wear and different testing requirements. This dynamic adjustability enhances the versatility and adaptability of the probe head without significantly complicating the manufacturing process.
Data Source
AI summary
Disclosed is a probe head configured such that a support distance is changed based on variation of a support axis extending through a plate and a spacer, whereby the protrusion length of a probe is adjusted. Since the protrusion length of the probe under a lower plate is adjusted, the number of tests is increased, and therefore the lifespan of the probe head is extended. In addition, work time for replacement and reinstallation of the probe head is shortened, whereby delay of a test process is prevented and process cost is reduced.