Electrical Testing TRIZ Cases

Hierarchical verification breaks complex data transformations into parent and leaf components, making formal hardware verification more tractable.

Independent power rails let an interleaved scan architecture test multiple IC blocks concurrently, reducing test time without costly timing buffers.

Physics-generated synthetic data trains machine learning to estimate battery health and degradation without frequent capacity measurements.

See how composite probability modeling and Kalman filtering estimate battery-module SOC from selected cell voltages, reducing sensor and compute demands.

High-frequency current reveals conductor surface roughness beyond insulation testing, enabling in-situ wear assessment and proactive cable replacement.

Temperature, current, and discharge duration shape a dynamic resistance model for more accurate battery state-of-charge estimates.

Dividing arc signals across low-, band-, and high-pass filters helps reject switching noise and reduce reliance on costly high-speed ADCs.

A control circuit uses same-duty-cycle clock signals and endpoint scan enables to handle timing exceptions without excessive test power.

Unsynchronized AFE and host clocks complicate charge-transfer measurement, so averaged current and host timing improve calculation accuracy.

Multiple Scan functions share existing internal pins, preserving test coverage while limiting circuit complexity and footprint.

Track each cell against composite voltage over short and long periods to flag abnormal decreases linked to battery fire risk.

Constant-current voltage readings reveal differential-capacity peaks tied to tab-weld quality, electrolyte wetting, diffusion, and active-material variation.

Model internal cell temperature from external or ambient readings and power dissipation to improve battery impedance accuracy.

OCV deviations, variances, and moving averages help diagnose battery abnormalities with less processing cost and memory use, supporting faster detection.

Parallel FPGA modules reduce calculation time for precise single-particle battery aging analysis.

Partial-cycle voltage data is converted into ICA features for data-driven BESS SOH diagnosis without disassembly or full cycling.

Calibration drift can distort battery SOC during operation; this case separates coulomb-counted stored charge from temperature-limited available charge.

Separate scan-enable paths let triple-voting flops detect slow-to-rise and slow-to-fall faults at speed without added area overhead.

Coarse battery readings from Bluetooth-free pen input devices are converted into usage-pattern-based remaining-time estimates for clearer alerts.

Unaccounted auxiliary power can cause battery depletion; a Kalman filter estimates loads from vehicle signals to support failure alerts.

An opposition battery buffers current demands so rechargeable batteries can undergo extreme test cycles through a lower-rated grid connection.

Replacing LFSR patterns with PRF-based generation helps secure SoC BIST against side-channel attacks without full AES overhead.

Polarity reversal separates systematic instrument errors from self-discharge effects, improving battery-cell property testing accuracy.

A temperature sensor adjusts cycler charging current in real time, reducing temperature-driven errors when determining battery cell properties.

Automated TDR testing uses movable high-frequency contacts and multiple channels to inspect short and multi-core cables.

Regression analysis of battery-cell voltage during idle periods classifies abnormal slope patterns beyond over- and under-voltage checks.

Preset decay curves are segmented by life-decay type and spliced end-to-end to simplify battery-life prediction and reduce error.

Splicing segments from preset battery decay curves simplifies calculation and reduces error when predicting battery life across decay types.

Internal scan-enable decoding and output masking reduce pin use and scan test volume while supporting scan error detection.

Parallel batteries are modeled separately with SOC and SOH data, then combined for aging-aware pack estimation with lower power use.

Fixed sensor patterns measure electrical parameters across large objects without mechanical scanning, improving inspection efficiency and accuracy.

A test connection bar transfers battery contacts to charge/discharge equipment, removing manual wiring during testing.

A pressure film sensor measures force across multiple needles so a movable support can correct probe card unbalance before wafer testing.

Variable slot quantities and positions limit board reuse; riser-card chains let one TAP-controlled machine run boundary-scan pin tests across boards.