PRF-Based Secure BIST for SoC Side-Channel Protection

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Solution Overview

Problem

Traditional BIST methods in Systems-on-Chip (SoC) are vulnerable to side-channel attacks and incur high area and latency overheads due to the use of simple pseudorandom generators and cryptographic algorithms like AES, making them inefficient for secure test pattern generation and hashing.

Innovation Solution

Implement lightweight cryptography-based BIST using Pseudo-Random Functions (PRF) for secure test pattern generation and hashing, achieving low latency and high security with 128-bit strength by performing multiple round computations in a single cycle and precomputing round constants in parallel.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional BIST uses simple pseudorandom generators like LFSR, then the implementation is simple and area is small, but the system becomes vulnerable to side-channel attacks and lacks security

Engineering Contradiction:
Improvesecurity against side-channel attacksVSAvoidcomplexity of test pattern generator
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent changes the fundamental parameters of the test pattern generator by replacing simple LFSR with PRF-based generation. The PRF takes a seed key and counter as inputs and produces secure test patterns through cryptographic functions, fundamentally altering how test patterns are generated to achieve security while maintaining reasonable complexity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces a PRF-based test pattern generator as an intermediary component between the seed key and the test patterns. This intermediary uses cryptographic primitives to transform simple inputs into secure test patterns, providing security without requiring complex direct implementations

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If cryptographic algorithms like AES are used for secure test pattern generation, then security is improved, but latency and area overhead increase significantly

Engineering Contradiction:
Improvesecurity strengthVSAvoidlatency of test pattern generation
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the cryptographic operation into smaller components: a PRF that processes data in rounds, where each round operates on smaller data blocks. This segmentation allows the system to achieve cryptographic security through multiple simple operations rather than a single complex AES operation, reducing latency

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses a PRF that performs fewer cryptographic rounds than full AES but achieves sufficient security strength. By using partial action (fewer rounds) with a different cryptographic approach (PRF instead of block cipher), the system achieves adequate security with reduced latency

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If cryptographic algorithms like AES are used for secure test pattern generation, then security is improved, but area overhead increases making BIST infeasible

Engineering Contradiction:
Improvesecurity strengthVSAvoidarea of test pattern generator
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent uses a PRF that can be implemented with relatively simple hardware logic compared to full AES. The PRF uses basic logic gates and registers to perform cryptographic functions, creating a 'cheap' implementation that provides sufficient security without the expensive area overhead of full AES hardware

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

4Productivity

If traditional BIST is used, then implementation is simple and fast, but functional correctness cannot be securely demonstrated at power-on

Engineering Contradiction:
Improvespeed of BISTVSAvoidfunctional correctness verification
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where the test pattern generator uses the output of the circuit under test to update the internal state. This feedback allows the system to verify functional correctness by checking whether the circuit produces expected responses to the secure test patterns, maintaining speed while enabling secure verification

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS20250306101A1Secure built-in self-test (BIST)
Publication Date: 2025.10.02 INTEL CORP
  • US20250306101A1 patent drawing
  • US20250306101A1 patent drawing
  • US20250306101A1 patent drawing

AI summary

Techniques for secure built in self test are described. Some examples include a secure test pattern generator to generate a secure test pattern using a pseudo-random function (PRF) circuitry; a scan out hash engine to hash a scan out of a circuit to be tested; and a comparison circuit to compare the hashed scan out to a known value to verify the hash.